Objects are to provide a semiconductor device with a novel structure, to provide a semiconductor device with low power consumption, and to provide a semiconductor device with a small chip area. A digital-analog converter and a frame memory are included. The frame memory includes a sample-and-hold circuit, a correction circuit, and a source follower circuit. The sample-and-hold circuit retains the analog voltage output from the digital-analog converter. The correction circuit corrects the analog voltage retained in the sample-and-hold circuit. The source-follower circuit outputs the corrected analog voltage. The sample-and-hold-circuit, the correction circuit, and the source follower circuit each comprise a first transistor. The first transistor comprises an oxide semiconductor layer in a semiconductor layer.

A computation circuit includes a computing cell array configured to provide a plurality of physical values respectively corresponding to a plurality of elements of a matrix; a vector input circuit configured to provide a plurality of input voltages corresponding to an input vector to the computing cell array; and a vector output circuit configured to output a plurality of output voltages each corresponding to a dot product between the input vector and a column vector of the matrix according to the plurality of input voltages and the plurality of effective capacitances.

A switch driver circuit includes a first transistor coupled between a voltage supply and a first output node. A second transistor is coupled between the first output node and a first discharge node. A first slope control circuit is coupled to the first discharge node to discharge the first discharge node at a first slope. A third transistor is coupled between the voltage supply and a second output node. A fourth transistor is coupled between the second output node and a second discharge node. A second slope control circuit coupled to the second discharge node to discharge the second discharge node at a second slope. The first and second slopes are mismatched.

Methods, systems, and apparatuses for self-referencing memory cells are described. A reference value for a cell may be created through multiple sense operations on the cell. The cell may be sensed several times and an average of at least two sensing operations may be used as a reference for another sense operation. For example, the cell may be sensed and the resulting charge stored at a capacitor. The cell may be biased to one state, sensed a second time, and the resulting charge stored at another capacitor. The cell may be biased to another state, sensed a third time, and the resulting charge stored to another capacitor. The values from the second and third sensing operations may be averaged and used as a reference value in a comparison with value of the first sensing operation to determine a logic state of the cell.

A semiconductor device with a novel structure is provided. The semiconductor device includes a sensor, an amplifier circuit to which a sensor signal of the sensor is input, a sample-and-hold circuit that retains a voltage corresponding to an output signal of an amplifier input to the sample-and-hold circuit, an analog-to-digital converter circuit to which an output signal of the sample-and-hold circuit corresponding to the voltage is input, and an interface circuit. The interface circuit has a function of switching and controlling a first control period in which the sensor signal is input to the amplifier circuit and an output signal of the amplifier circuit is retained in the sample-and-hold circuit and a second control period in which a digital signal obtained by output of the voltage retained in the sample-and-hold circuit to the analog-to-digital converter circuit is output to the interface circuit. In the first control period, the analog-to-digital converter circuit is switched to stop output of the digital signal. The first control period is longer than the second control period.

A semiconductor device with a small circuit area that consumes low power is provided. The semiconductor device includes a shift register, a sample-and-hold circuit, a first buffer circuit, and a second buffer circuit. The sample-and-hold circuit includes a first input terminal, a second input terminal, and an output terminal. An output terminal of the first buffer circuit is electrically connected to the first input terminal. The shift register is electrically connected to the second input terminal. An input terminal of the second buffer circuit is electrically connected to the output terminal of the sample-and-hold circuit. In the semiconductor device, the potential of an input analog signal is retained in the sample-and-hold circuit and the analog signal is output from an output terminal of the second buffer circuit.

The present disclosure describes analog memories for use in a computer, such as a computer using a combination of analog and digital components/elements used in a cohesive manner.

A bootstrapping circuit for a semiconductor switch is provided. The bootstrapping circuit includes a capacitor, a first node for coupling to an input node of the semiconductor switch, and a second node for coupling to a control node of the semiconductor switch. Further, the bootstrapping circuit includes a switch circuit configured to selectively couple the capacitor to a charge source while the semiconductor switch is open and to selectively close a conductive path between the first node and the second node for closing the semiconductor switch. The conductive path includes the capacitor. The bootstrapping circuit additionally includes charge injection circuitry configured to inject charge into the conductive path before, while or after the conductive path is closed by the switch circuit.

A device includes a memory array and a sense amplifier (SA) coupled with the memory array and with an input/output (I/O) data line. The SA is to receive bits of data over the I/O data line in association with a program operation. A digital-to-analog converter (DAC) is coupled with the SA, the DAC to convert the bits of data to an analog voltage value. An analog memory element is coupled with the DAC, the analog memory element to store the analog voltage value for a period of time until the bits of data are programmed to the memory array.

Methods, systems, and apparatuses for self-referencing memory cells are described. A reference value for a cell may be created through multiple sense operations on the cell. The cell may be sensed several times and an average of at least two sensing operations may be used as a reference for another sense operation. For example, the cell may be sensed and the resulting charge stored at a capacitor. The cell may be biased to one state, sensed a second time, and the resulting charge stored at another capacitor. The cell may be biased to another state, sensed a third time, and the resulting charge stored to another capacitor. The values from the second and third sensing operations may be averaged and used as a reference value in a comparison with value of the first sensing operation to determine a logic state of the cell.