An information processing apparatus includes a detection unit and first and second classification units. The detection unit detects an event which causes a state of at least one bank constituting dynamic random access memory (DRAM) to transition. The first classification unit classifies the at least one bank state based on the detected event. The second classification unit classifies a DRAM state based on the at least one bank state. Statistical information that is based on the at least one bank or DRAM state is displayed with respect to a predetermined unit time. The at least one bank state and the DRAM state each includes at least one of the following: an operating state, in which data is being transferred, an inoperative state, in which data transfer is not possible due to a predetermined constraint, or a pause state, in which, although there is no constraint, data is not being transferred.

Embodiments of the disclosure, there is provided a method, a system for adjusting the memory, and a semiconductor device. The method for adjusting the memory includes: acquiring a mapping relationship between a temperature of a transistor, an equivalent width-length ratio of a sense amplifier transistor in a sense amplifier and an actual time at which the data is written into the memory; acquiring a current temperature of the transistor; and adjusting the equivalent width-length ratio, based on the current temperature and the mapping relationship, so that the actual time at which the data is written into the memory corresponding to the adjusted equivalent width-length ratio is within a preset writing time.

A method of operating a memory device includes receiving a duty training request, performing first training for a write path in a first period, storing a result value of the first training, performing second training for a write path in a second period, storing a result value of the second training, transmitting the result value of the first training to an external device, and receiving a duty cycle adjuster (DCA) code value corresponding to the first training result value from the external device.

A test circuit includes first integration circuit configured to receive first test signal and integrate first test signal to output first integrated signal; second integration circuit configured to receive second test signal and integrate second test signal to output second integrated signal, where first test signal and second test signal are signals inverted with respect to each other, value of first integrated signal is product of duty cycle of first test signal and a voltage amplitude of power supply, and value of second integrated signal is product of duty cycle of second test signal and voltage amplitude of power supply; and comparison circuit connected to first and second integration circuits. The comparison circuit is configured to output high-level signal in response to first integrated signal being greater than second integrated signal, and output low-level signal in response to second integrated signal being greater than first integrated signal.

System boot time is decreased by performing Memory Receive enable (MRE) training and MDQ-MDQS Read Delay (MRD) training on a buffered Dual In-Line Memory Module (DIMM). MRE training configures the time at which a data buffer on the buffered DIMM enables its receivers to capture data read from DRAM integrated circuits on a MDQ/MDQS bus between the DRAM and the data buffer on the DIMM. After the MRE training has completed, the data buffer is configured to enable the data buffer receivers to receive data on the MDQ bus on the buffered DIMM during the preamble of the incoming MDQS burst from a read transaction in the DRAM. MRD training tunes the relationship between the MDQ/MDQS bus to ensure sufficient setup and hold eye margins for MDQ so that the data buffer optimally samples the data driven by the DRAM during reads of the DRAM.

A signal detection system and a memory detection method are provided. The system includes a signal generator, generating a reference test signal based on an external parameter, the reference test signal being a clock signal satisfying a preset duty cycle, where a duty cycle test is performed on the reference test signal based on a test circuit, to determine whether a function of the test circuit is normal. If the function of the test circuit is normal, different portions under test are sequentially selected based on a test control signal, and the duty cycle test is performed, based on the test circuit, on a signal outputted by each of the selected portions under test. The portions under test include a signal converter and a write clock path.

Systems, apparatuses, and methods for performing asynchronous memory clock changes on multiple displays are disclosed. From time to time, a memory clock frequency change is desired for a memory subsystem storing frame buffer(s) used to drive pixels to multiple displays. For example, when the real-time memory bandwidth demand differs from the memory bandwidth available with the existing memory clock frequency, a control unit tracks the vertical blanking interval (VBI) timing of a first display. Also, the control unit causes a second display to enter into panel self-refresh (PSR) mode. Once the PSR mode of the second display overlaps with a VBI of the first display, a memory clock frequency change, including memory training, is initiated. After the memory clock frequency change, the displays are driven by the frame buffer(s) in the memory subsystem at an updated frequency.

A semiconductor memory device includes a quadrature error correction circuit, a clock generation circuit and a data input/output (I/O) buffer. The quadrature error correction circuit performs a locking operation to generate a first corrected clock signal and a second corrected clock signal by adjusting a skew and a duty error of a first through fourth clock signals generated based on a data clock signal and performs a relocking operation to lock the second corrected clock signal to the first corrected clock signal in response to a relock signal. The clock generation circuit generates an output clock signal and a strobe signal based on the first corrected clock signal and the second corrected clock signal. The data I/O buffer generates a data signal by sampling data from a memory cell array based on the output clock signal and transmits the data signal and the strobe signal to a memory controller.

A CAN bus transmitter has an input to receive a transmit data signal, and CANH and CANL outputs coupled to a CAN bus. The CAN bus transmitter comprises a plurality of CAN driver circuits having inputs coupled through delay circuits with their CANH and CANL outputs in common and connected to the CAN bus. Matching of Cgs capacitances between devices of the CANH and CANL legs provides substantially synchronized changes in the CANH and CANL output logic levels upon a change in the input logic level. Variable delaying of the input logic level changes to each of the plurality of CAN driver circuits reduces emission of unwanted signals from the CAN bus.

A CAN bus transmitter has an input to receive a transmit data signal, and CANH and CANL outputs coupled to a CAN bus. The CAN bus transmitter comprises a plurality of CAN driver circuits having inputs coupled through delay circuits with their CANH and CANL outputs in common and connected to the CAN bus. Matching of Cgs capacitances between devices of the CANH and CANL legs provides substantially synchronized changes in the CANH and CANL output logic levels upon a change in the input logic level. Variable delaying of the input logic level changes to each of the plurality of CAN driver circuits reduces emission of unwanted signals from the CAN bus.