G11C2029/0411

Semiconductor memory devices, memory systems including the same and methods of operating memory systems

A semiconductor memory device includes a memory cell array, an error correction circuit, an error log register and a control logic circuit. The memory cell array includes a plurality of memory bank arrays and each of the memory bank arrays includes a plurality of pages. The control logic circuit is configured to control the error correction circuit to perform an ECC decoding sequentially on some of the pages designated at least one access address for detecting at least one bit error, in response to a first command received from a memory controller. The control logic circuit performs an error logging operation to write page error information into the error log register and the page error information includes a number of error occurrence on each of the some pages determined from the detecting.

DELAY-COMPENSATED ERROR INDICATION SIGNAL
20180004592 · 2018-01-04 ·

A memory subsystem has multiple memory devices coupled to a command/address line and an error alert line, the error alert line delay-compensated to provide deterministic alert signal timing. The command/address line and the error alert line are connected between the memory devices and a memory controller that manages the memory devices. The command/address line is driven by the memory controller, and the error alert line is driven by the memory devices.

METHOD OF OPERATION FOR A NONVOLATILE MEMORY SYSTEM AND METHOD OF OPERATING A MEMORY CONTROLLER
20180004417 · 2018-01-04 ·

A method of operating a nonvolatile memory system including a memory device having a plurality of memory blocks includes selecting a source block among the plurality of memory blocks in the nonvolatile memory system, and performing a reclaim operation for the source block based on the number of program and erase cycles which have been performed on the source block.

CIRCUIT AND METHOD FOR IMPRINT REDUCTION IN FRAM MEMORIES
20180012642 · 2018-01-11 ·

Disclosed embodiments include a memory device having a memory array that includes a first memory cell coupled to a first bit line and a second memory cell coupled to a second bit line and a sense amplifier that includes first and second transistors arranged in a cross-coupled configuration with third and fourth transistors, the first and second transistors being of a first conductivity type and the third and fourth transistors being of a second conductivity type, a first inverter having an input coupled to a first common drain terminal of the first and third transistors and an output coupled to the first bit line, and a second inverter having an input coupled to a second common drain terminal of the second and fourth transistors and an output coupled to the second bit line.

Memory system

According to one embodiment, a memory system includes a non-volatile memory and a memory controller. The non-volatile memory includes a plurality of groups, each including a plurality of memory cells. The memory controller is configured to determine whether to execute a refresh process for a first group based on whether a first temperature in a write process for the first group and a second temperature after the write process for the first group satisfy a first condition.

APPARATUSES AND METHODS FOR LAYER-BY-LAYER ERROR CORRECTION

One example of layer-by-layer error correction can include iteratively error correcting the codeword on a layer-by-layer basis with the first error correction circuit in a first mode and determining on the layer-by-layer basis whether a number of parity errors in a particular layer is less than a threshold number of parity errors. The codeword can be transferred to a second error correction circuit when the number of parity errors is less than the threshold number of parity errors. The codeword can be iteratively error corrected with the first error correction circuit in a second mode when the number of parity errors is at least the threshold number of parity errors. The threshold number of parity errors can be at least partially based on an adjustable code rate of the first error correction circuit or the second error correction circuit.

SYSTEM AND METHOD FOR REDUCING ECC OVERHEAD AND MEMORY ACCESS BANDWIDTH
20180011758 · 2018-01-11 · ·

A system, and corresponding method, is described for updating or calculating ECC where the transaction volume is significantly reduced from a read-modify-write to a write, which is more efficient and reduces demand on the data access bandwidth. The invention can be implemented in any chip, system, method, or HDL code that perform protection schemes and require ECC calculation, of any kind. Embodiments of the invention enable IPs that use different protections schemes to reduce power consumption and reduce bandwidth access to more efficiently communicate or exchange information.

ADAPTIVE READ THRESHOLD VOLTAGE TRACKING WITH BIT ERROR RATE ESTIMATION BASED ON NON-LINEAR SYNDROME WEIGHT MAPPING

Adaptive read threshold voltage tracking techniques are provided that employ bit error rate estimation based on a non-linear syndrome weight mapping. An exemplary device comprises a controller configured to determine a bit error rate for at least one of a plurality of read threshold voltages in a memory using a non-linear mapping of a syndrome weight to the bit error rate for the at least one of the plurality of read threshold voltages.

Direct-input redundancy scheme with adaptive syndrome decoder
11709731 · 2023-07-25 · ·

Methods, systems, and devices for operating memory cell(s) using a direct-input column redundancy scheme are described. A device that has read data from data planes may replace data from one of the planes with redundancy data from a data plane storing redundancy data. The device may then provide the redundancy data to an error correction circuit coupled with the data plane that stored the redundancy data. An output of the error correction circuit may be used to generate syndrome bits, which may be decoded by a syndrome decoder. The syndrome decoder may indicate whether a bit of the data should be corrected by selectively reacting to inputs based on the type of data to be corrected. For example, the syndrome decoder may react to a first set of inputs if the data bit to be corrected is a regular data bit, and react to a second set of inputs if the data bit to be corrected is a redundant data bit.

METHODS AND APPARATUS TO FACILITATE READ-MODIFY-WRITE SUPPORT IN A COHERENT VICTIM CACHE WITH PARALLEL DATA PATHS

Methods, apparatus, systems and articles of manufacture are disclosed facilitate read-modify-write support in a coherent victim cache with parallel data paths. An example apparatus includes a random-access memory configured to be coupled to a central processing unit via a first interface and a second interface, the random-access memory configured to obtain a read request indicating a first address to read via a snoop interface, an address encoder coupled to the random-access memory, the address encoder to, when the random-access memory indicates a hit of the read request, generate a second address corresponding to a victim cache based on the first address, and a multiplexer coupled to the victim cache to transmit a response including data obtained from the second address of the victim cache.