The application relates to an architecture that allows for less precision of demarcation read voltages by combining two physical memory cells into a single logical bit. Reciprocal binary values may be written into the two memory cells that make up a memory pair. When activated using bias circuitry and address decoders the memory cell pair creates current paths having currents that may be compared to detect a differential signal. The application is also directed to writing and reading memory cell pairs.

A TCAM comprises a plurality of first search lines, a plurality of second search lines, a plurality of memory cell strings and one or more current sensing units. The memory cell strings comprise a plurality of memory cells. The current sensing units are coupled to the memory cell strings. In a search operation, a determination that whether any of the data stored in the memory cell strings matches a data string to be searched is made according to whether the one or more current sensing units detect current from the memory cell strings, or according to the magnitude of the current flowing out from the memory cell strings detected by the one or more current sensing units. Each memory cell includes a first transistor and a second transistor. Gates of the first and second transistors are coupled to a corresponding first search line and a corresponding second search line.

Two or more physical memory cells are grouped together to form a logical cell that stores one of N possible levels. Within each logical cell, the memory cells can be programmed using different mechanisms. For example, one or more of the memory cells in a logical cell can be programmed using a coarse programming mechanism, one or more of the memory cells can be programmed using a fine mechanism, and one or more of the memory cells can be programmed using a tuning mechanism. This achieves extreme programming accuracy and programming speed.

A charge pump circuit includes a first charge pump unit and a second charge pump unit. The first charge pump unit pumps an input voltage to output a first pumped voltage according to a first clock signal, a second clock signal and a third clock signal. The second charge pump unit pumps the first pumped voltage to output a second pumped voltage according to the first clock signal, a fourth clock signal and the third clock signal. The first clock signal and the third clock signal are non-overlapping clock signals. A falling edge of the second clock signal leads a rising edge of the first clock signal. A falling edge of the fourth clock signal leads a rising edge of the third clock signal.

The present disclosure includes apparatuses and methods for cache operations. An example apparatus includes a memory device including a plurality of subarrays of memory cells, where the plurality of subarrays includes a first subset of the respective plurality of subarrays and a second subset of the respective plurality of subarrays. The memory device includes sensing circuitry coupled to the first subset, the sensing circuitry including a sense amplifier and a compute component. The first subset is configured as a cache to perform operations on data moved from the second subset. The apparatus also includes a cache controller configured to direct a first movement of a data value from a subarray in the second subset to a subarray in the first subset.

A method for operating a read command of N complementary memory cells, the method includes the steps of determining if each of the first and second memory cells of the N complementary memory cells is in a first binary state or a second binary state, generating a count value by counting a total number of the first and second memory cells that are in the first binary state, and determining if the N complementary memory cells are programmed or erased based on a result of comparing the count value to a threshold number.

In a semiconductor device, a high-side potential determination circuit outputs an event signal when a high-side reference potential detected by a high-side potential detection circuit rises. If at that time an input logic signal for controlling a high side is at a low (L) level, a pulse generation circuit regenerates a reset signal for a high-side drive circuit. When the input logic signal for controlling the high side is at the L level and the event signal is inputted, an overcurrent detection determination circuit makes an overcurrent detection signal from an overcurrent detection circuit invalid. When the event signal is not inputted, the overcurrent detection determination circuit makes the overcurrent detection signal valid.

The present disclosure includes apparatuses and methods for performing operations by a memory device in a self-refresh state. An example includes an array of memory cells and a controller coupled to the array of memory cells. The controller is configured to direct performance of compute operations on data stored in the array when the array is in a self-refresh state.

In one example, a method comprises determining a program resolution current value; and setting levels for a programming operation of a plurality of non-volatile memory cells in a neural network array such that a delta current between levels of each pair of adjacent cells in the plurality is a multiple of the program resolution current value.

Methods, systems, and devices for sensing techniques for differential memory cells are described. A method may include selecting a pair of memory cells that comprise a first memory cell coupled with a first digit line and a second memory cell coupled with a second digit line for a read operation, the pair of memory cells storing one bit of information. The method may further include applying a first voltage to a plate line coupled with the first memory cell and the second memory cell and applying a second voltage to a select line to couple the first digit line and the second digit line with a sense amplifier. The amplifier may sense a logic state of the pair of memory cells based on a difference between a third voltage of the first digit line and a fourth voltage of the second digit line.