Embodiments of the disclosed technology relate to a memory system, a memory controller, and an operation method of the memory system. According to embodiments of the present disclosure, the memory system may calculate a time period T1 that is between a beginning of a program operation on a memory page included in the memory device and a suspension of the program operation, may calculate a time period T2 that is between the suspension of the program operation and a time point that is before a resumption of the program operation, may calculate, based on the time period T1 and the time period T2, a read offset voltage to be applied to the memory cell to mitigate the change of the threshold voltage distribution, and may store the read offset voltage in the memory page in the memory device before the resumption of the program operation. Accordingly, the memory system is able to improve the reliability of operations of suspending and resuming a program operation and to improve the performance of a read operation.

Memory devices might include an array of memory cells and a controller configured to access the array of memory cells. The controller might be further configured to receive a command to perform an erase operation; and in response to the command to perform the erase operation, begin execution of the erase operation. The controller might be further configured to while executing the erase operation, receive a command to perform a program operation; in response to the command to perform the program operation, suspend the execution of the erase operation; and with the execution of the erase operation suspended, execute the program operation.

A system includes a memory component and a processing device, operatively coupled with the memory component, to send a read command to the memory component while a program or erase operation being executed by the memory component is suspended. The processing device, operatively coupled with the memory component, can then send an auto resume command to the memory component to automatically resume execution of the program or erase operation after the read command is executed.

Provided herein is a memory device and a method of operating the same. The memory device may include a plurality of memory cells, a peripheral circuit, and a control logic. The peripheral circuit may be configured to perform a plurality of program loops, each including a program pulse apply operation and a program verify operation, on selected memory cells of the plurality of memory cells. The control logic may be configured to control, in response to a suspend command, the peripheral circuit to suspend an n-th program loop of the plurality of program loops, where n is a natural number of 1 or more, and configured to control, in response to a resume command, the peripheral circuit to resume the suspended n-th program loop after performing a recovery pulse apply operation compensating for charges detrapped from a channel area of the selected memory cells.

Memory devices might include an array of memory cells and a controller configured to access the array of memory cells. The controller might be further configured to receive a command to perform an erase operation; and in response to the command to perform the erase operation, begin execution of the erase operation. The controller might be further configured to while executing the erase operation, receive a command to perform a program operation; in response to the command to perform the program operation, suspend the execution of the erase operation; and with the execution of the erase operation suspended, execute the program operation.

A semiconductor storage device includes a first memory die. The first memory die includes a first memory plane including a plurality of first memory blocks, a second memory plane including a plurality of second memory blocks, a first sequencer, and a second sequencer. The first sequencer is configured to start a first write sequence with respect to one of the first memory blocks in response to a first command set designating the one of the first memory blocks if no write sequence is being performed by the first sequencer. The second sequencer is configured to start a second write sequence with respect to one of the second memory blocks in response to a second command set designating the one of the second memory blocks if the first sequencer is performing the first write sequence and no write sequence is being performed by the second sequencer.

A memory system includes a memory cell array and a controller coupled to the memory cell array. The controller is configured to control applying a first program voltage to a word line to program memory cells in the memory cell array, the memory cells being coupled to the word line, and in response to receiving a suspend command, control applying a positive bias discharge voltage to the word line when the first program voltage ramps down.

An operating method of a nonvolatile memory device includes receiving, at the nonvolatile memory device, a suspend command, suspending, at the nonvolatile memory device, a program operation being performed, in response to the suspend command, receiving, at the nonvolatile memory device, a resume command, and resuming, at the nonvolatile memory device, the suspended program operation in response to the resume command. The program operation includes program loops, each of which includes a bit line setup interval, a program interval, and a verify interval. In the program interval of each of the program loops, a level of a program voltage to be applied to selected memory cells of the nonvolatile memory device increases as much as a first voltage. A difference between a level of the program voltage finally applied s suspend and a level of the program voltage applied first after resume is different from the first voltage.

A system includes a memory component and a processing device, operatively coupled with the memory component, to send a read command to the memory component while a program or erase operation being executed by the memory component is suspended. The processing device, operatively coupled with the memory component, can then send an auto resume command to the memory component to automatically resume execution of the program or erase operation after the read command is executed.

A control method, for a memory array, the control method comprises programming the bit-cell of the memory array in a programming stage; and discharging the bit-cell of the memory array in a discharge stage; wherein the programming stage comprises: programming the bit-cell of the memory array with a plurality of programming voltage pulses; wherein the discharge stage comprises: isolating a select line of the bit-cell of the memory array; and generating a programming voltage pulse to the bit-cell of the memory array; wherein the programming stage can be suspended to a suspend stage by a suspend command after the discharge stage; wherein the suspend command is received during one of the plurality of programming voltage pulse.