The present invention discloses a multi-bit-per-cell three-dimensional read-only memory (3D-OTP.sub.MB). It comprises a plurality of OTP cells stacked above a semiconductor substrate. Each OTP cell comprises an antifuse layer, which is irreversibly switched from a high-resistance state to a low-resistance state during programming. By adjusting the programming current, the programmed antifuses have different resistances.

The present disclosure is directed to read sample offset most probable bit operation associated with a memory component. A processing device generates a first set of read data associated with a memory component, the first set of read data comprising a first sequence of bit values. The processing device generates a second set of read data associated with the memory component, the second set of read data comprising a second sequence of bit values. The processing device generates a third set of read data associated with the memory component, the third set of read data comprising a third sequence of bit values. A most probable bit operation is performed to compare the first sequence of bit values, the second sequence of bit values, and the third sequence of bit values to generate and store a most probable bit sequence.

The present invention discloses a multi-bit-per-cell three-dimensional resistive random-access memory (3D-RRAM.sub.MB). It comprises a plurality of RRAM cells stacked above a semiconductor substrate. Each RRAM cell comprises a RRAM layer, which is switched from a high-resistance state to a low-resistance state during programming. By adjusting the programming current, the programmed RRAMs have different resistances.

The present disclosure is directed to read sample offset most probable bit operation associated with a memory component. A processing device generates a first set of read data associated with a memory component, the first set of read data comprising a first sequence of bit values. The processing device generates a second set of read data associated with the memory component, the second set of read data comprising a second sequence of bit values. The processing device generates a third set of read data associated with the memory component, the third set of read data comprising a third sequence of bit values. A most probable bit operation is performed to compare the first sequence of bit values, the second sequence of bit values, and the third sequence of bit values to generate and store a most probable bit sequence.

The present disclosure is directed to read sample offset most probable bit operation associated with a memory component. A processing device performs a first read, a second read, and a third read of data from the memory component using a center value corresponding to a read threshold voltage value, a negative offset value, and a positive offset value, respectively. The processing device performs a most probable bit operation on the first set of data, the second set of data, and the third set of data to generate a most probable bit sequence corresponding to the data associated with the memory component. The processing device can store or output the generated most probable bit sequence.

The present disclosure is directed to read sample offset most probable bit operation associated with a memory component. A processing device performs a first read, a second read, and a third read of data from the memory component using a center value corresponding to a read threshold voltage value, a negative offset value, and a positive offset value, respectively. The processing device performs a most probable bit operation on the first set of data, the second set of data, and the third set of date to generate a most probable bit sequence corresponding to the data associated with the memory component. The processing device can store or output the generated most probable bit sequence.

The present invention discloses a multi-bit-per-cell three-dimensional resistive random-access memory (3D-RRAM.sub.MB). It comprises a plurality of RRAM cells stacked above a semiconductor substrate. Each RRAM cell comprises a RRAM layer, which is switched from a high-resistance state to a low-resistance state during programming. By adjusting the programming current, the programmed RRAMs have different resistances.

A double-biased three-dimensional one-time-programmable read-only memory (3D-OTP) comprises an OTP array stacked on a semiconductor substrate. The OTP array comprises a dummy word line, a plurality of data word lines and data bit lines. The dummy OTP cells at the intersections of the dummy word line and all data bit lines are unprogrammed. During read, both voltages on the dummy word line and a selected data word line are raised.

A read table management method for a solid state storage device includes the following steps. If the lowest computation value in a hot group is lower than the highest computation value in a cold group when a read table adjusting process is enabled, a first read voltage set corresponding to the lowest computation value in the hot group and a second read voltage set corresponding to the highest computation value in the cold group are swapped with each other. Consequently, the second read voltage set becomes to belong to the hot group, and the first read voltage set becomes to belong to the cold group.

To reduce the pre-programming cost, an efficient three-dimensional one-time-programmable read-only memory (3D-OTP) is disclosed. It comprises a dummy word line and a plurality of dummy bit lines. Only the dummy OTP cells at the intersections of the dummy word line and dummy bit lines are programmed. All other dummy OTP cells are unprogrammed.