According to one embodiment, a first string is coupled to the bit line via a first transistor and includes a first cell transistor. A second string is coupled to the bit line via a second transistor and includes a second cell transistor. The first and second cell transistors are coupled to the word line. A controller is configured to instruct the memory device to write first data to the first cell transistor and to write second data to the second cell transistor. The controller is further configured to instruct the memory device to read data from the first cell transistor while storing the first data and the second data after making the instruction for writing the first data and the second data.

According to one embodiment, a first string is coupled to the bit line via a first transistor and includes a first cell transistor. A second string is coupled to the bit line via a second transistor and includes a second cell transistor. The first and second cell transistors are coupled to the word line. A controller is configured to instruct the memory device to write first data to the first cell transistor and to write second data to the second cell transistor. The controller is further configured to instruct the memory device to read data from the first cell transistor while storing the first data and the second data after making the instruction for writing the first data and the second data.

A non-volatile memory device is disclosed. The non-volatile memory device comprises an array of flash memory cells comprising a plurality of flash memory cells organized into rows and columns, wherein the array is further organized into a plurality of sectors, each sector comprising a plurality of rows of flash memory cells, and a row driver selectively coupled to a first row and a second row.

A memory system includes a code flash and data flash merged flash memory, which may contain a code flash with differential cell structure, a data flash with single cell structure, decoder circuitry, a sense amplifier, and other suitable support circuitry. The code flash and data flash may be located in a same plane or multi planes. In some examples, the code flash may be also accessed to read while the data flash is performing write operation, and vice versa.

Independent multi-plane commands for non-volatile memory devices are described. In one example, a three-dimensional (3D) NAND memory device includes 3D NAND dies, each die including multiple planes of memory cells. The device includes input/output (I/O) circuitry to receive multiple commands from a host, each of the received commands to access one of the planes. The device includes logic (which can be implemented with, for example, an ASIC controller, firmware, or both) to queue the commands in separate queues for each of the planes based on a target plane of each of the commands. The logic issues the commands to their target planes independent of other planes' status, and tracks completion status of the commands independently for each plane.

In one embodiment of the present invention, one row is selected and two columns are selected for a read or programming operation, such that twice as many flash memory cells can be read from or programmed in a single operation compared to the prior art. In another embodiment of the present invention, two rows in different sectors are selected and one column is selected for a read operation, such that twice as many flash memory cells can be read in a single operation compared to the prior art.

An apparatus includes a first single-port memory, a second single-port memory, and one or more control circuits in communication with the first single-port memory and in communication with the second single-port memory. The one or more control circuits are configured to initiate a read of stored data on a clock cycle from a physical location of the stored data in the first or second single-port memory and to initiate a write of fresh data on the clock cycle to whichever of the first single-port memory or the second single-port memory does not contain the physical location of the stored data.

A variety of applications can include apparatus and/or methods of operating the apparatus that include a memory device having read levels that can be calibrated. A calibration controller implemented with the memory device can trigger a read level calibration based on inputs from one or more trackers monitoring parameters associated with the memory device and a determination of an occurrence of at least one event from a set of events related to the monitored parameters. The monitored parameters can include parameters related to a selected time interval and measurements of read, erase, or write operations of the memory device. Additional apparatus, systems, and methods are disclosed.

In one embodiment of the present invention, one row is selected and two columns are selected for a read or programming operation, such that twice as many flash memory cells can be read from or programmed in a single operation compared to the prior art. In another embodiment of the present invention, two rows in different sectors are selected and one column is selected for a read operation, such that twice as many flash memory cells can be read in a single operation compared to the prior art.

Subject matter disclosed herein relates to read and write processes of a memory device.