Patent classifications
G01B5/066
Fan blade masking/coating check inspection tool
A masking and coating check inspection tool for inspecting a masking and/or coating edge on a fan blade includes an elongate planar base having distal first and second ends, bottom surface, top face, length, width, and thickness. The length is greater than the width. A pillar perpendicular to the elongate planar base and projecting upward from the top face between the first and second ends has a first end datum, and a first masking check tolerance band disposed on the first end, configured to provide a pass/fail indication of the first masking edge with respect to the first end datum. The pillar can have second end datum and second masking check tolerance band on the second end configured to provide a pass/fail indication of a second masking edge with respect to the second end datum. The inspection tool can be used on root and platform masking/coating edges.
Capacitive-sensing paint borer
A boring apparatus including a drill having a drill bit; a capacitance sensor; and an alarm; wherein the capacitance sensor is electrically connected to the drill bit and detects a change in capacitance associated with a substrate material in proximity to the drill bit.
FAN BLADE MASKING/COATING CHECK INSPECTION TOOL
A masking and coating check inspection tool for inspecting a masking and/or coating edge on a fan blade includes an elongate planar base having distal first and second ends, bottom surface, top face, length, width, and thickness. The length is greater than the width. A pillar perpendicular to the elongate planar base and projecting upward from the top face between the first and second ends has a first end datum, and a first masking check tolerance band disposed on the first end, configured to provide a pass/fail indication of the first masking edge with respect to the first end datum. The pillar can have second end datum and second masking check tolerance band on the second end configured to provide a pass/fail indication of a second masking edge with respect to the second end datum. The inspection tool can be used on root and platform masking/coating edges.
Device and Method for Detecting a Layer Thickness of a Coated Component
A device for detecting a layer thickness of a coated component, particularly a brake disc for a disc brake of a motor vehicle, includes at least one holding device and a guiding device. The holding device has a bearing surface for the component. The guiding device is configured to hold and guide a sensor in order to measure the layer thickness. The sensor is configured to be moved by the guiding device along a vertical axis and pivot about a first axis of rotation that is oriented horizontally. The sensor is further configured to be moved by the guiding device along a horizontal axis.
DEVICES, SYSTEMS AND METHODS FOR EVALUATING OBJECTS SUBJECT TO REPAIR OR OTHER ALTERATION
A method can include authenticating the at least one inspection device to a user, presenting overlay data on an image of an inspected object showing inspection points, measuring at least a thickness of a layer at the inspection points, and acquiring at least one image of the inspected device. Object identification (ID) data for the inspected device can be received. Thickness measurements and object ID data can be transmitted and received at a server system as input values for a machine learned statistical model. Corresponding devices and systems are also disclosed.
CAPACITIVE-SENSING PAINT BORER
A boring apparatus including a drill having a drill bit; a capacitance sensor; and an alarm; wherein the capacitance sensor is electrically connected to the drill bit and detects a change in capacitance associated with a substrate material in proximity to the drill bit.
DEVICES, SYSTEMS AND METHODS FOR EVALUATING OBJECTS SUBJECT TO REPAIR OR OTHER ALTERATION
An inspection system can include a handheld inspection device having a meter portion comprising at least two different paint meters, at least one display, at least one processor configured to present paint measuring locations on an inspected object on the at least one display, and communication circuits configured to transmit inspection data generated by meter portion. Based on inspection results, a value of the inspected object can be automatically adjusted. A database can store inspection data for large numbers of objects, and track locations of objects. Corresponding methods are also disclosed.
PROBE AND CAP THEREFOR
Probes are provided with caps, the caps comprise rolling bearing elements so that the probes can be slid along a surface to be measured, without damaging the surface or wearing away the tip of the probe or a sacrificial cap. The rolling bearing elements can be arranged in a ring around the probe tip, with the plane of the foremost edges of the rolling bearing elements a predetermined distance from the probe tip. The caps can comprise a housing with a grip, to encourage users to grip the cap, which comprises the rolling bearing elements, rather than the probe.
PREDETERMINING THE THICKNESS OF A COATING
A method for predetermining a thickness of a coating which is to be arranged on a substrate is provided. A spray spot is arranged on a surface of the substrate or a test substrate. The volume of the spray spot is determined, and based on the determined volume, the thickness of a layer which is to be applied is worked out. An arrangement for predetermining the thickness of a coating is further provided.
Device for film thickness measurement and method for film thickness measurement
A device for film thickness measurement and a method for film thickness measurement are disclosed. The device includes a planar indenter, a collecting unit and a processing unit. The planar indenter includes a base plate and a piezoelectric film layer. The collecting unit includes a plurality of collecting circuits evenly distributed above the piezoelectric film layer and spaced from each other. The collecting circuits are used for collecting current signals generated when the piezoelectric film layer deforms at positions corresponding to the collecting circuits. The processing unit is used for calculating a film thickness of the film sample to be measured based on the current signals collected by each of the collecting circuits.