A polarization holographic microscope system is disclosed. The polarization holographic microscope system can acquire a birefringence image and a three-dimensional phase image with high sensitivity by aperture synthesis of sample beams at various angles, and a sample image acquisition method using the microscope system.

An interferometer having a fundamental beam generator, a first second harmonic generator, a waveplate, a second second harmonic generator, a harmonic separator, and a polarizing beam splitter, mounted uniaxially, (i.e., the components are aligned along one optical axis), wherein the interferometer is adapted to change a diameter of a beam to match a diameter of a sample, and to change the diameter of the beam back to its original diameter.

Provided is an ellipsometer including a polarizing optical device configured to separate light, reflected from a sample that is irradiated with illumination light comprising a linearly polarized light, into a first linearly polarized light in a first polarization direction and a second linearly polarized light in a second polarization direction that is orthogonal to the first polarization direction, and a light-receiving optical system configured to calculate an Ψ and Δ, an amplitude ratio and a phase difference of the two polarized light respectively, from an interference fringe formed by interference between the first linearly polarized light and the second linearly polarized light after passing through an analyzing device with transmission axis different from the first polarization direction and the second polarization direction.

The present disclosure provides a system and method for cutting a flap in laser ophthalmic surgery using polarization sensitive optical coherence tomography (PS-OCT). The system includes a PS-OCT system, a femtosecond laser, control device, and processor. The PS-OCT system includes a PS-OCT source, a polarization component, a reference reflector, a beam splitter, a wave plate, and a detector. The processor receives data relating to an interference pattern of a reflected PS-OCT beam, received at the detector, determines a relative fiber orientation of the sample, determines whether a photodisruption pattern generated by the femtosecond laser to cut the flap should be adjusted horizontally or vertically, based on the relative fiber orientation, and may generate a control signal to adjust the photodisruption pattern generated by the femtosecond laser. The disclosure further provides a method for cutting a flap on an eye using PS-OCT.

A method and a device for characterizing the surface shape of an optical element. In the method, in at least one interferogram measurement carried out by an interferometric test arrangement, a test wave reflected at the optical element is caused to be superimposed with a reference wave not reflected at the optical element. In this case, the figure of the optical element is determined on the basis of at least two interferogram measurements using electromagnetic radiation having in each case linear input polarization or in each case circular input polarization, wherein the input polarizations for the two interferogram measurements differ from one another.

A method of determining a displacement comprises: generating an interferometric superoscillatory field from coherent electromagnetic radiation, the interferometric superoscillatory field comprising an interference pattern between a reference field and a superoscillatory field; detecting with a detector a first set of intensity distributions of the interferometric superoscillatory field, each intensity distribution from a different polarisation state of the electromagnetic radiation; detecting with the detector a second set of intensity distributions of the interferometric superoscillatory field, each intensity distribution from the same polarisation states of the electromagnetic radiation as the first set of intensity distributions; extracting a first local wavevector distribution from the first set of intensity distributions and a second local wavevector distribution from the second set of intensity distributions; comparing the first local wavevector distribution and the second local wavevector distribution to identify any change in position of one or more features in the local wavevector distributions; and ascertaining that a lateral displacement has occurred between the interferometric superoscillatory field and the detector if a change in position is identified.

A three-dimensional measurement device includes: an optical system that splits incident light into two lights and radiates lights to a measurement object and to a reference surface, and recombines the two lights to emit combined light; a first irradiator that emits first light including first polarized light and entering a first surface; a second irradiator that emits second light including second polarized light and entering a second surface; a first imaging system to which the first output light enters wherein the first output light is emitted from the first surface when the first light enters the first surface; a second imaging system to which the second output light enters wherein the second output light is emitted from the second surface when the second light enters the second surface; and an image processor that performs three-dimensional measurement based on interference fringe images obtained by the first and second imaging systems.

An optical refraction barometer measures pressure based on refractivity changes and includes: an optical light source; an optical frequency controller; a first optical phase controller; a first polarization controller; an electronic reference arm in optical communication with the first polarization controller; a second optical phase controller in optical communication with the optical frequency controller; a second polarization controller in optical communication with the second optical phase controller; an electronic sample arm in optical communication with the second polarization controller and in electrical communication with the second optical phase controller; a second sideband frequency generator; a mixer in electrical communication with the detector and the second sideband frequency generator; and a first sideband frequency generator in electrical communication with the mixer; and a dual fixed length optical cavity refractometer.

An interferometer uses a phase shift mask that includes an array of pixels that are aligned with a corresponding array of pixels of a detector. Each pixel in the phase shift mask is adapted to produce one of a number of predetermined phase shifts between a test beam and a reference beam. For example, the pixels may be linear polarizers or phase delay elements having one of the number of polarizer orientations or phase delays to produce the predetermined phase shifts between the test beam and the reference beam. The pixels in the phase shift mask are arranged in the array to include each of the predetermined phase shifts in repeating pixel groups in rows that are one column wide, columns that are one row high, or blocks of multiple rows and columns.

Exemplary embodiments relate to providing an optical image measurement apparatus that is capable of acquiring information on birefringence of a sample while suppressing size and cost of the apparatus. In the present disclosure: second measurement light different from first measurement light is generated using a passive optical element that generates light of second polarization state different from first polarization state; a time when the first measurement light is irradiated onto a sample is adjusted at a first time, and a time when the second measurement light is irradiated onto the sample is adjusted at a second time different from the first time.