G01B9/02012

HIGH-RESOLUTION HANDHELD OCT IMAGING SYSTEM
20240230315 · 2024-07-11 ·

A high-resolution handheld OCT imaging system related to the optical imaging field solves the issues of handheld OCT systems with low resolution and the inability to measure the skin's stratum corneum thickness accurately. Through adopting the visible wavelength band of supercontinuum laser as the light source, mainly applying reflectors instead of lenses in the OCT system, and replacing fiber propagation with optical propagation in free space in the interference optical paths, to significantly reduce dispersion loss in the axial resolution and improve the axial resolution of OCT systems. The filter, attenuator, grating, camera, and other components are separated from the handheld module through modular design to reduce the handheld terminal's size and weight and realize the system construction. The invention improves the axial resolution, obtains the thickness information of whole-body skin's stratum corneum, and provides technical approaches for skin diagnosis and related medicine development.

Optical sensing based on measurements of displacements induced by optical forces in viscoelastic media using phase-sensitive optical coherence tomography

A system for providing optical actuation and optical sensing can include an optical coherence tomography (OCT) device that performs optical imaging of a sample based on optical interferometry from an optical sampling beam interacting with an optical sample and an optical reference beam; an OCT light source to provide an OCT imaging beam into the OCT device which splits the OCT imaging beam into the optical sampling beam and the optical reference beam; and a light source that produces an optical actuation beam comprising a plurality of wavelengths that is coupled along with the optical sampling beam to be directed to the sample to actuate particles or structures in the sample so that the optical imaging captures information of the sample under the optical actuation.

INTERFEROMETRIC DISPLACEMENT MEASUREMENT APPARATUS
20240310158 · 2024-09-19 ·

An interferometric displacement measurement apparatus (100) includes at least one measurement interferometer (103) for measuring a change in optical path difference between a measurement beam (150) and a reference beam. A light source module (118) is arranged to generate a modulated light beam, having a particular optical spectrum, from which the measurement beam and reference beam are derived. A data acquisition and analysis module (105) can determine a measure representative of the displacement using interference intensity data received from a photodetector (111) which detects the interference of the measurement beam with the reference beam.

Optical sensing based on measurements of displacements induced by optical scattering forces in viscoelastic media using phase-sensitive optical coherence tomography

Disclosed are devices and techniques based on optical coherence tomography (OCT) technology in combination with optical actuation. A system for providing optical actuation and optical sensing can include an optical coherence tomography (OCT) device that performs optical imaging of a sample based on optical interferometry from an optical sampling beam interacting with an optical sample and an optical reference beam; an OCT light source to provide an OCT imaging beam into the OCT device which splits the OCT imaging beam into the optical sampling beam and the optical reference beam; and a light source that produces an optical actuation beam that is coupled along with the optical sampling beam to be directed to the sample to actuate particles or structures in the sample so that the optical imaging captures information of the sample under the optical actuation.

HEIGHT DETECTION APPARATUS AND COATING APPARATUS EQUIPPED WITH THE SAME
20180252512 · 2018-09-06 ·

A height detection apparatus successively changes the brightness of white light from a first level to a second level in accordance with a position of a Z stage and captures an image of interference light while moving a two-beam interference objective lens relative to a paste film in an optical axis direction, detects, as a focus position, a position of the Z stage where the intensity of interference light is highest in a period during which the brightness of white light is set to the first or second level, for each pixel of the captured image, and obtains the height of the paste film based on a detection result.

Laser-based coordinate measuring device and laser-based method for measuring coordinates

A method for measuring a distance includes modulating the light beam at a first frequency, receiving a second beam by the optical detector to produce a first electrical signal having the first frequency and a first phase; modulating the light beam at a second frequency different than the first frequency; receiving the second beam by the optical detector to produce a second electrical signal having the second frequency and a second. After these steps, the retroreflector is moved while modulating the light beam continuously at the second frequency; and a first distance to the retroreflector is determined based at least in part on a the first and second frequencies and phases.

INTERFEROMETER SYSTEM HAVING A CONTINUOUSLY VARIABLE BROADBAND REFLECTOR AND METHOD TO GENERATE AN INTERFERENCE SIGNAL OF A SURFACE OF A SAMPLE

An interferometer system to generate an interference signal of a surface of a sample includes a broadband illuminator to provide a broadband illumination beam, a beam splitter to split the broadband illumination beam in a reference beam for reflection on a reference reflector and a measurement beam for reflection on the surface of the sample, and a detector to receive an interference radiation intensity created between the reference beam reflected from the reference reflector and the reflected measurement beam from the surface of the sample to generate an interference signal. The interferometer system having a continuous variable broadband reflector in the beam splitter and/or the reference reflector to adjust the broadband radiation intensity balance between the measurement beam and the reference beam.

Intensity modulation at two frequencies for interferometric measuring of distance

A method for measuring a distance includes modulating the light beam at a first frequency, receiving a second beam by the optical detector to produce a first electrical signal having the first frequency and a first phase; modulating the light beam at a second frequency different than the first frequency; receiving the second beam by the optical detector to produce a second electrical signal having the second frequency and a second. After these steps, the retroreflector is moved while modulating the light beam continuously at the second frequency; and a first distance to the retroreflector is determined based at least in part on a the first and second frequencies and phases.

Locator camera arrangement having multiple light sources

A method for measuring a distance includes modulating the light beam at a first frequency, receiving a second beam by the optical detector to produce a first electrical signal having the first frequency and a first phase; modulating the light beam at a second frequency different than the first frequency; receiving the second beam by the optical detector to produce a second electrical signal having the second frequency and a second. After these steps, the retroreflector is moved while modulating the light beam continuously at the second frequency; and a first distance to the retroreflector is determined based at least in part on a the first and second frequencies and phases.

LASER-BASED COORDINATE MEASURING DEVICE AND LASER-BASED METHOD FOR MEASURING COORDINATES

A method for measuring a distance includes modulating the light beam at a first frequency, receiving a second beam by the optical detector to produce a first electrical signal having the first frequency and a first phase; modulating the light beam at a second frequency different than the first frequency; receiving the second beam by the optical detector to produce a second electrical signal having the second frequency and a second. After these steps, the retroreflector is moved while modulating the light beam continuously at the second frequency; and a first distance to the retroreflector is determined based at least in part on a the first and second frequencies and phases.