Quantum network devices, systems, and methods are provided to enable long-distance transmission of quantum bits (qubits) for applications such as Quantum Key Distribution (QKD), entanglement distribution, and other quantum communication applications. Such systems and methods provide for separately storing first, second, third, and fourth photons, wherein the first and second photons and the third and fourth photons are respective first and second entangled photon pairs, triggering a synchronized retrieval of the stored first, second, third, and fourth photons such that the first photon is propagated to a first node, the second and third photons are propagated to a second node, and the fourth photon is propagated to a third node, and creating a new entangled pair comprising the first and fourth photons at the first and third nodes to transmit quantum information.

An optical measurement instrument includes optical coherence tomography (OCT) interferometer and a pupil retro illumination system which directs laser light onto the retina of an eye via the sample arm of the OCT interferometer. The laser light passes through an intraocular lens (IOL) implanted into the eye, and an iris camera captures an image of the eye from a portion of the light returned from the retina of the eye, the returned light also passing through the IOL. One or more fiducials of the IOL are detected from the captured image, and an angular orientation of the eye is ascertained from the one or more detected fiducials.

The present disclosure relates to an interferometer having an amplified piezoelectric actuator configured to move an optical component. Such an interferometer can be optimized for use in any region of the electromagnetic spectrum and can be used with various applications such as, but not limited to, spectroscopy.

A wafer shape metrology system includes a wafer shape metrology sub-system configured to perform one or more stress-free shape measurements on a first wafer, a second wafer, and a post-bonding pair of the first and second wafers. The wafer shape metrology system includes a controller communicatively coupled to the wafer shape metrology sub-system. The controller is configured to receive stress-free shape measurements from the wafer shape sub-system; predict overlay between one or more features on the first wafer and the second wafer based on the stress-free shape measurements of the first wafer, the second wafer, and the post-bonding pair of the first wafer and the second wafer; and provide a feedback adjustment to one or more process tools based on the predicted overlay. Additionally, feedforward and feedback adjustments may be provided to one or more process tools.

Self-mixed interferometer (SMI) devices and techniques are described for measuring depth and/or velocity of objects. The SMI devices and techniques may be used for eye-tracking. A light source of an SMI sensor emits coherent light that is directed to a target location with a scanning module. One or more SMI signals are measured. The one or more SMI signals are generated by the SMI sensor in response to feedback light received from the target location. The feedback light is a portion of the coherent light that illuminated the target location.

A laser interference device includes: a measurement mirror being movable in an X direction; a reference mirror disposed at a position different from a position of the measurement mirror in a Y direction; a beam splitter having a splitting surface that divides a laser beam into a measurement light and a reference light; a first light guide configured to guide the measurement light incident from the beam splitter and emit the measurement light toward the measurement mirror; and a second light guide configured to guide the reference light incident from the beam splitter and emit the reference light toward the reference mirror, in which a first distribution path formed by the first light guide and a second distribution path formed by the second light guide are mutually equal in a mechanical path length and an optical path length.

A measuring assembly for the frequency-based determination of the position of a component, in particular in an optical system for microlithography, includes at least one optical resonator, which has a stationary first resonator mirror, a movable measurement target assigned to the component, and a stationary second resonator mirror. The second resonator mirror is formed by an inverting mirror (130, 330, 430, 530), which reflects back on itself a measurement beam coming from the measurement target.

Interferometric systems and methods for measuring rotational movement are described. In one implementation, an interferometer for measuring rotational movement includes a housing and a light source within the housing configured to project coherent light toward a non-coded surface of an object. The interferometer further includes at least one optical element configured to modify the projected coherent light in a manner accounting for a rotation of the object. The interferometer also includes at least one sensor within the housing including at least one light detector configured to detect reflections of the modified projected coherent light from the opposing non-coded surface as the object rotates relative to the housing. The interferometer further includes at least one processor configured to receive input from the at least one sensor and determine an amount of rotation of the object around the at least one rotational axis.

Multichannel optical coherence systems and methods involving optical coherence tomography (OCT) subsystems are operably and respectively connected to optical fibers of a multichannel optical probe, such that each optical fiber forms at least a distal portion of a sample beam path of a respective OCT subsystem. The optical fibers are in optical communication with distal optical elements such that external beam paths associated therewith are directed towards a common spatial region external to the housing. Image processing computer hardware is employed to process OCT signals obtained from the plurality of OCT subsystems to generate an OCT image dataset comprising a plurality of OCT A-scans and process the OCT image dataset to generate volumetric image data based on known positions and orientations of the external beam paths associated with the OCT subsystems.

Disclosed is a heterodyne laser interferometer based on an integrated secondary beam splitting component, which belongs to the technical field of laser application; the disclosure inputs two beams that are spatially separated and have different frequencies to the heterodyne laser interferometer based on the integrated secondary beam splitting component, wherein the integrated secondary beam splitting component includes two beam splitting surfaces that are spatially perpendicular to each other; and the two beam splitting surfaces are plated with a polarizing beam splitting film or a non-polarizing beam splitting film, and a measurement beam and a reference beam are the same in travel path length in the integrated secondary beam splitting component. The heterodyne laser interferometer of the disclosure significantly reduces periodic nonlinear errors, has the advantages of simple structure, good thermal stability, large tolerance angle and easy integration and assembly compared with other existing heterodyne laser interferometers with spatially separated optical paths, and meets the high-precision and high-resolution requirements of high-end equipment on heterodyne laser interferometry.