Patent classifications
G01B9/02038
METHOD AND APPARATUS FOR DIGITAL HOLOGRAPHIC MICROTOMOGRAPHY
A method for digital holographic microtomography comprises (a) providing at least one wavefront controlling device for driving a sample to be rotated and/or an incident beam scanning the sample, (b) utilizing a digital holographic access unit for recording the transmitted or reflected wavefronts of the sample, (c) utilizing a digital holography reconstructing method for reconstructing the transmitted or reflected wavefronts of the sample, and (d) utilizing a tomographic reconstruction approach for reconstructing three dimensional image information of the sample.
APPARATUS AND METHODS FOR MIRROR TUNNEL IMAGING DEVICE AND FOR PROVIDING PSEUDOBESSEL BEAMS IN A MINIATURIZED OPTICAL SYSTEM FOR IMAGING
Exemplary apparatus and method are provided for illuminating a sample. With such exemplary apparatus and/or method, it is possible to, using at least one source arrangement, provide at least one first electro-magnetic radiation. Using an optical system of an optics arrangement, it is possible to receive the first electro-magnetic radiation(s), and modifying the at least one first electro-magnetic radiation to be at least one second electro-magnetic radiation so as to be forwarded to the sample. Further, with the optical system, it is possible to extend the at least one second electro-magnetic radiation into or across the sample for a distance of at least 2 times the Raleigh range of a Gaussian beam when the optics arrangement and the sample are stationary with respect to one another. Additionally, using the optical system, it is possible to control a placement of a focus of the at least one second electro-magnetic radiation on or in the sample.
SYSTEM AND METHODS FOR MEASURING OPHTHALMIC LENS
The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens.
Displacement detection apparatus
A displacement detection apparatus can reduce a measurement error even when a diffraction grating is displaced and/or tilted to a direction other than the measurement direction. A displacement detection apparatus includes a light source which emits light, a luminous flux-splitting section, a diffraction grating, a diffracted light-reflecting section, a correcting lens, a luminous flux-coupling section, and a light-receiving section. The diffracted light-reflecting section reflects a first luminous flux and a second luminous flux so as to be perpendicular to one of measuring planes of the diffraction grating and be parallel to each other. The correcting lens is arranged between the diffracted light-reflecting section and the diffraction grating.
COHERENCE-GATED WAVEFRONT-SENSORLESS ADAPTIVE-OPTICS MULTI-PHOTON MICROSCOPY, AND ASSOCIATED SYSTEMS AND METHODS
In one embodiment, a sensorless adaptive optics imaging system includes a source of light, an optical delivery unit having a wavefront modifying element, and an optical coherence tomography (OCT) sensor configured to acquire OCT images based on light emitted by the source of light and transmitted through the optical delivery unit. The system also includes a processing unit that can: process the OCT images, and determine an adjustment of parameters of the wavefront modifying element. In some embodiments, the system includes a multi-photon microscopy (MPM) sensor that acquires MPM images based on the light transmitted through the optical delivery unit.
Method and Apparatus for Phase Resolved Heterodyne Shearographic Measurements
A phase-resolved heterodyne shearing interferometer has been developed for high-rate, whole field observations of transient surface motion. The sensor utilizes polarization multiplexing and multiple carrier frequencies to separate each segment of a shearing Mach-Zehnder interferometer. Post-processing routines have been developed to recombine the segments by extracting the scattered object phase from Doppler shifted intermediate carrier frequencies, providing quantitative relative phase changes and information to create variable shear, phase resolved shearographic fringe patterns without temporal or spatial phase shifting.
Reference signal filter for interferometric system
The invention provides a method and apparatus for applying spatial filtering the optical beam of a free space optical coherence tomography (OCT) system substantially without problematic reflections back to the optical source. The invention teaches spatially filtering the reference beam of the OCT system which is typically designed to provide isolation of the optical source from undesirable optical feed-back, thereby achieving spatial filtering without generating undesirable reflections back to the optical source. Various embodiments are taught.
Large numerical aperture phase-shifting dual pinhole diffraction interferometer and its test method
A diffraction interferometer includes a reference light passage, a test light passage and a pinhole substrate. The pinhole substrate includes a test pinhole and a reference pinhole. The diffracted wavefront emitted from the test pinhole is reflected by the optical component to be tested adjacent to the pinhole substrate and a converge adjacent to the reference pinhole. The diffracted wavefront includes surface shape information of an optical component to be tested that is reflected by the pinhole substrate. Interference with the diffracted wavefront is emitted by the reference pinhole and forms interference fringes. The large numerical aperture phase-shifting dual pinhole diffraction interferometer adopts a dual pinhole substrate and a illumination manner with two converged light paths to enable the separation of the reference light and test light, to prevent disturbance between the two light paths, which would induce the change of interferogram status during phase-shifting.
Optical measurement apparatus and optical measurement method
By utilizing the fact that the observation object has a three-dimensional shape and the boundary surface can be regarded as a plane surface, phase or intensity distribution is applied into a luminous flux of reference light, thereby selectively attenuating the influence of the reflected light from the boundary surface so as to obtain a high-quality OCT image.
Particle counter
Provided is a particle counter including: a light source; a light superimposition unit configured to superimpose light beams; an irradiation optical system configured to irradiate a fluid in a flow passage with one of a plurality of light beams from the light source; a detection optical system configured to make a part of scattered light beams by a particle in the fluid enter the light superimposition unit; a reference optical system configured to split another one of the plurality of light beams into a plurality of reference light beams and makes the reference light beams enter the light superimposition unit; and a counting unit configured to count the particles on the basis of detection signals corresponding to an interference light beam received by a light receiver. The interference light beam is generated by interference between the scattered light beam and one of the reference light beams at the light superimposition unit, and is received by the light receiver corresponding to the reference light beam.