Patent classifications
G01B9/0205
OPTICAL COHERENCE TOMOGRAPHY DEVICE
An optical coherence tomography device includes a base with a detection end and a mounting end, a movable base and a second drive mechanism. An optical imaging catheter is pivotally connected to the detection end. The optical imaging catheter is provided with an imaging end and a connecting end. The connecting end is detachably connected to the detection end, and the connecting end is provided with a first connecting part. The movable base is provided with a fiber optic rotary joint, a hollow shaft and a first drive mechanism. The end of the hollow shaft is provided with a second connecting part. When the movable base moves toward the detection end, the second connecting part is configured to be connected to the first connecting part so that the optical imaging catheter is coupled with the hollow shaft. The device is capable of manually or automatically connecting the optical imaging catheter.
SYSTEMS, DEVICES, METHODS, APPARATUS AND COMPUTER-ACCESSIBLE MEDIA FOR PROVIDING OPTICAL IMAGING OF STRUCTURES AND COMPOSITIONS
Exemplary systems, devices, methods, apparatus and computer-accessible media for providing and/or utilizing optical frequency domain imaging (OFDI) and fluorescence of structures and, e.g., multimodality imaging using OFDI techniques and fluorescence imaging techniques are described. For example, an arrangement can provide at least one electro-magnetic radiation to an anatomical structure. Such exemplary arrangement can include at least one optical core and at least one cladding at least partially surrounding the fiber(s). A region between the optical core(s) and the cladding(s) can have an index that is different from indexes of the optical core(s) and the cladding(s). The arrangement can also include at least one apparatus which is configured to transmit the radiation(s) via the optical core(s) and the cladding(s) to the anatomical structure.
Integrated optical coherence analysis system
Optical coherence tomography (OCT) probe and system designs are disclosed that minimize the effects of mechanical movement and strain to the probe to the OCT analysis. It also concerns optical designs that are robust against noise from the OCT laser source. Also integrated OCT system-probes are included that yield compact and robust electro-opto-mechanical systems along with polarization sensitive OCT systems.
Brain function measurement device and brain function measurement method
Provided is a brain function measurement device capable of improving the reliability of brain function measurement using a simple configuration. The brain function measurement device includes light source probes LD2 and LD12 for irradiating the scalp of a test subject with light beams; linearly polarizing films P2 and P3 for polarizing the light beams emitted from the light source probes LD2 and LD12 in a first direction; a linearly polarizing film P1 for blocking components in the first direction of reflected light beams that are generated as the light beams emitted from the linearly polarizing film P2 and P3 are reflected by the hairs of the test subject; and a detection probe PD1 for detecting the intensity of a light beam that has passed through the linearly polarizing film P1.
SELF-MIX MODULE UTILIZING FILTERS
A system and method for generating, enhancing, and detecting the amplitude and phase modulation of a laser under a condition of self-mixing is provided. The system may comprise a laser and a detector to extract the characteristic self-mix signal, which is then interpreted using algorithms implemented in hardware or software. In the case of the laser being a Vertical Cavity Surface Emitting laser (VCSEL), the output signal can be detected by monitoring the surface light emission by means of a beam splitter, or in some embodiments as emission from the bottom surface of the laser. In some embodiments, the system may further comprise a wavelength filter such as an etalon in the signal path.
SYSTEMS AND METHODS FOR AN ACTIVELY CONTROLLED OPTICAL IMAGING DEVICE
The present disclosure provides a common-path optical waveguide probe. The common-path optical waveguide probe includes an optical waveguide, a lens, and a reference reflector. The optical waveguide includes a proximal end and a distal end. The lens is coupled to the distal end. The reference reflector is positioned between the optical waveguide and the lens. The disclosure also provides a catheter and an optical coherence tomography system utilizing the common-path optical waveguide probe. The disclosure also provides methods of making and using the common-path optical waveguide probe.
Retro-reflective interferometer
There is provided retro-reflective interferometer device for detection and/or measurement of displacements and/or rotations and/or mechanical vibrations, the device includes a transceiver unit including at least one radiation source capable of emitting a radiation beam and at least one radiation receiver; a movable unit movably mounted with respect to said transceiver unit, the movable unit includes one or more movable elements that are susceptible to displacement and/or vibration by an external force; and at least one retro-reflective element capable of reflecting back the radiation beam to form a sequence of radiation patterns; and an analyzing element operationally associated with the radiation receiver for analyzing a displacement change, an intensity change and/or a frequency change in the sequence of radiation patterns. Further provided are systems including the device and methods utilizing the same.
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
Provided is a shape measurement system in order to perform three-dimensional measurement corresponding to a measurement object having various shapes, which includes a measurement probe, a probe tip, and a processor. The probe tip includes an optical element that is configured to irradiate an object with measurement light and a cylindrical unit that is configured to lock the optical element. The processor is configured to calculate an optical path length from the optical element to an object based on reflected light of the measurement light with which the object is irradiated; and calculate a three-dimensional shape of the object based on the input information and the optical path length.
OPTICAL INTERFERENCE MEASUREMENT APPARATUS
In one or more embodiments of an optical interference measurement apparatus, first return light received by a first measurement head is guided to a detector via a first optical path and a fiber coupler. Second return light received by a second measurement head is guided to the detector via a second optical path and the fiber coupler. Optical path lengths D1 and D2 from the fiber coupler to a leading end of the first measurement head and a leading end of the second measurement head respectively, a maximum optical path length R1max of the measurement range of the first measurement head, optical path lengths S1 and S2 of the first reference light that interferes with the first return light and of the second reference light that interferes with the second return light respectively are set such that the relation D1+R1max−S1<D2−S2 is satisfied.
A METHOD AND DEVICE FOR EVALUATING A MECHANICAL PROPERTY OF A MATERIAL
The present disclosure provides a method of evaluating a mechanical property of a material using a device for evaluating the mechanical property of the material. The device comprises a sensing layer having a thickness, a sensing surface and an opposite surface. The sensing layer is deformable such that, when the sensing surface is in direct or indirect contact with the material and a suitable load is applied across both the sensing layer and at least a portion of the material, the sensing layer deforms and the sensing surface moves relative to the opposite surface. The device also comprises a source of electromagnetic radiation in optical communication with the sensing layer. The source is arranged for generating electromagnetic radiation having a coherence length that is of the same order of magnitude as the thickness of the sensing layer or longer than the thickness of the sensing layer. Further, the device comprises a detector for detecting the electromagnetic radiation and being in optical communication with the sensing layer and arranged for receiving the electromagnetic radiation after the electromagnetic radiation is reflected at the interface at the sensing surface of the sensing layer. The method comprises positioning the sensing layer relative to the material such that the sensing surface is in direct or indirect contact with the material. Further, the method comprises applying the suitable load across both the sensing layer and at least a portion of the material whereby the sensing layer deforms and the interface at the sensing surface moves relative to a condition in which no load is applied. The method also comprises directing the electromagnetic radiation to the interface at the sensing surface such that at least a portion of the electromagnetic radiation is reflected at the interface at whereby a first signal is generated and directing electromagnetic radiation along a second optical pathlength to generate a second signal. Further, the method comprises allowing the first signal and the second signal to interfere and detecting an intensity associated with a resultant interference signal using the detector; and determining information concerning the mechanical property of the material from the detected intensity of the interference signal.