A device for detecting an object conveyed through a measuring region comprises a transmission apparatus configured to emit measuring radiation onto the outer contour of the object. The measuring radiation comprises a frequency in a range of one of gigahertz and terahertz. A protective mesh is positioned between the measuring region and at least one of the transmission apparatus and the receiving apparatus. The protective mesh is transparent for the measuring radiation and permeable to as gas.

The invention relates to apparatus for monitoring an extruded product moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product as the product passes therethrough in a linear manner. The composition of the emitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters of the moving products. The imaging analysis involves applying correction values to the measured transit times of the rays crossing the products which depends on its position within the curtain of rays thereby to remove inaccuracies in the final measurement results.

In a method of operating a dimensioning system with a plurality of laser scanners, a processor controls the operations of the scanners and processes the scanner signals, and further with memory for storing data delivered by the processor, the data acquired by the dimensioning system in its regular mode of operation are used to construct a three-dimensional model of surface points of the object including spatial coordinates and image intensity for each surface point. The three-dimensional model is stored in the memory. Based on the three-dimensional model, two-dimensional images from any desired viewing angle that was exposed to the scanner rays can be produced on demand to document the appearance of the object at the time the scan was taken.

Systems and methods are provided for determining a thickness of a material or an article of manufacture thereof such as a wall thickness of a plastic container or plastic bottle during manufacturing. In some embodiments, for example, a measurement system can include a light source disposed adjacent to a production line for plastic bottles. The light source can be configured to transmit light of a known frequency through the plastic bottles. A camera can be disposed opposite the light source. The camera can be configured to receive the light transmitted through the plastic bottles. An optional trigger, when present, can be configured to coordinate timing of the camera and the light source. A computer can be configured to determine wall thicknesses for the plastic bottles by an experimentally determined correlation between the light received by the camera and a known absorbance spectrum of the material forming the plastic bottles.

The present disclosure is a sheet producing device for producing a multi-layer sheet by applying a coating material to a sheet material. The sheet producing device includes a radiation light source that emits radiation light, a division part that divides the radiation light into measurement light to be incident on the multi-layer sheet and reference light with which a reference surface is to be irradiated, and an optical member that emits the measurement light onto the multi-layer sheet and receives the measurement light reflected by the multi-layer sheet. An interference detector that detects interference light between the measurement light reflected by the multi-layer sheet and the reference light reflected by the reference surface, and a thickness calculator that calculates a thickness of the sheet material and a thickness of the coating material of the multi-layer sheet based on the detected interference light are further included. As a result, the tact time from the production of the multi-layer sheet to the calculation of the thickness can be shortened.

A measuring device for measuring thickness of a planar object, where the measuring device comprises a first optical sensor module and a second optical sensor module that located on opposites of the measured planar object with mutual distance the optical sensor modules having at least one light source, a reference shade with two dimensional pattern and an imaging sensor and computing equipment, where the one light source is set to an angle towards measured object and the reference shade is set between the light and the object so that a shadow forms on the surface of the object and the imaging sensor is set so it can detect the reference shade and the shadow while the computing equipment calculates the distance between the surface of the object and sensor module from the distance between the detected shade and shadow of both optical modules and calculate the thickness of the object.

The invention relates to a method for calibrating a THz measuring apparatus (8), in particular a pipe, on a measurement object (10), comprising at least the following steps: providing a THz measuring apparatus (8) having a plurality of pivotable THz sensors (1), arranged in a circumferential direction around a measuring chamber (9), for outputting one THz transmitted beam (12) each along a sensor axis (B) (provision step); orienting the THz sensors (1) into a starting position in the measuring chamber (9) in which the measurement object (10) is received (orientation step in starting position); allocating the THz sensors (1) to at least one first and one second sensor group (group formation step); first calibration adjustment step, in which the second sensor group is adjusted as an adjustment group by means of the first sensor group as a starting group, and corresponding second calibration adjustment step, in which the first sensor group is adjusted as an adjustment group by means of the previously calibration-adjusted second sensor group as a starting group; wherein, in each of the calibration adjustment steps=by means of the THz sensors (S1, S3, S5, S7) of the starting group, spacing points on a surface (10a) of the measurement object (10) are determined, =sensor correction angles of the THz sensors (1; S2, S4, S6, S8) of the adjustment group are determined by means of the spacing points determined by the starting group, and =the THz sensors of the adjustment group are calibration-adjusted about the determined sensor correction angles (a).

Methods and apparatus for the in-situ measurement of metrology parameters are disclosed herein. Some embodiments of the disclosure further provide for the real-time adjustment of process parameters based on the measure metrology parameters. Some embodiments of the disclosure provide for a multi-stage processing chamber top plate with one or more sensors between process stations.

A media thickness detection system for inkjet printing applications monitors the thickness of media entering the printer to ensure correct printing performance by adjusting the position of the printheads on-the-fly to assure printing quality. Media that do have an acceptable printing thickness are passed through the printer without stopping operation of the printer transport and without being printed upon and are routed directly to a reject facility. Embodiments also prevent damage to the printer by immediately stopping operation of the printer when substrate thickness deviates significantly from an expected value due to variations in thickness that result from manufacturing tolerances or damage to the substrate.

The invention relates to a THz measuring device for measuring a layer thickness of a wall (4a) of a measurement object (4) and/or of a distance (18) between boundary surfaces (4a, 4b) of a measurement object (4), comprising a transmitter and receiver unit (2) including a Terahertz-Sender and a Terahertz receiver, a controller means configured to determine the layer thickness of the wall (4a) of the measurement object (4) and/or a distance (18) between boundary surfaces (4b, 4c) of the measurement object (4) from a time-of-flight difference of the Terahertz radiation reflected on a first boundary surface (4b, 4c) of the wall (4a) of the measurement object (4) and the Terahertz radiation reflected on a second boundary surface (4b, 4c) of the wall (4a), where in the beam path (5) of the at least one transmitter and receiver unit (2) an adjustable optical unit (7) including a reflector is arranged, where a surface of the reflector is designed to deflect the irradiated Terahertz radiation and/or the Terahertz radiation reflected from the respective boundary surface (4b, 4c) for adjusting the optical axis (C) of the transmitter and receiver unit (2).

Hereby, according to the invention, it is provided that the reflector is designed to be deformable so that a beam cross-section of the irradiated Terahertz radiation can be modified in a focusing plane (17) lying downstream from the reflector in the radiation direction of the irradiated Terahertz radiation, the focusing plane being adjustable by deforming the reflector.