A printed circuit board inspection apparatus can inspect a mounting state of a component by generating depth information on the component by using a pattern of light reflected from the component mounted on a printed circuit board received by an image sensor, generating two-dimensional image data for the component by using at least one of light of a first wavelength, light of a second wavelength, light of a third wavelength, and light of a fourth wavelength reflected from the component received by a first image sensor, inputting the depth information and the two-dimensional image data for the component into a machine learning-based model, obtaining depth information with reduced noise from the machine learning-based model, and using the noise-reduced information.

A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens, a central aperture located along an optical axis for projecting an entire image of a target object, at least one defocusing aperture located off of the optical axis, a sensor operable for capturing electromagnetic radiation transmitted from an object through the lens and the central aperture and the at least one defocusing aperture, and a processor communicatively connected with the sensor for processing the sensor information and producing a 3-D image of the object. Different optical filters can be used for the central aperture and the defocusing apertures respectively, whereby a background image produced by the central aperture can be easily distinguished from defocused images produced by the defocusing apertures.

A three dimensional measurement apparatus comprising: a projection unit configured to project a pattern including a measurement pattern and a feature pattern onto an object; an image capturing unit configured to capture an image of the object onto which the pattern is projected; a grouping unit configured to divide the captured image into a plurality of regions using the measurement pattern in the pattern and a plurality of epipolar lines determined based on a positional relationship between the projection unit and the image capturing unit, thereby grouping predetermined regions among the plurality of divided regions; a feature recognition unit configured to recognize the feature pattern based on a difference in the feature pattern between the predetermined regions; and a three-dimensional shape calculation unit configured to calculate a three-dimensional shape of the object based on the feature pattern.

The disclosure is related to a method and apparatus of scanning a target object in three dimensions (3D). The method may include projecting a color dashed line pattern onto a target object, scanning the target object with the color dashed line pattern projected thereto, and producing a 3D data of the target object by processing the scanning result. The color dashed line pattern may include multiple dashed line patterns each of which is individually used to calculate the 3D data of the target object.

The present invention relates to a method and system for reliable 3D shape extraction of a metal surface. In this method, images are acquired at the same time by simultaneously irradiating interference-free polarized lights to a metal object. A photometric stereo method is then applied based on the images except for images which make the extraction of a 3D shape of the metal object inaccurate.

A device and method and system for utilizing confocal measurement and an optical arrangement to produce 3D color images. A color measurement optical path and a 3D measurement optical path may coincide at least at an object side of the device, and a minimal amount of light is extracted from a monitoring beam for color measurement without affecting 3D measurement.

A 3D measuring system includes a first projector that projects a first line onto an object at a first wavelength, a second projector that projects a second line onto the object at a second wavelength, a first illuminator that emits a third light onto some markers, a second illuminator that emits a fourth light onto some markers, a first camera having a first lens and a first image sensor, a second camera having a second lens and a second image sensor, the first lens operable to pass the first wavelength, block the second wavelength, and pass the third light to a first image sensor, the second lens operable to pass the second wavelength, block the first wavelength, and pass the fourth light. The system further includes one or more processors operable to determine 3D coordinates based on images captured by the first image sensor and the second image sensor.

A device and method and system for utilizing confocal measurement and an optical arrangement to produce 3D color images. A color measurement optical path and a 3D measurement optical path may coincide at least at an object side of the device, and a minimal amount of light is extracted from a monitoring beam for color measurement without affecting 3D measurement.

According to an embodiment, an optical device includes a light selection unit, an imaging element, and a deriving unit. The light selection unit splits an irradiated light beam into a plurality of spectral beams of different wavelength regions. The imaging element captures a subject irradiated with the spectral beams including beams of at least two different wavelengths to acquire a spectral image. The deriving unit derives a surface property or shape information of the subject from a specified result obtained by specifying, by the deriving unit, an irradiation region irradiated with each of the spectral beams on the subject based on a mixing ratio of the spectral beams and received light intensity of each of the spectral beams included in the spectral image.

Described herein is a projector for illuminating at least one object with at least two illumination patterns. The projector includes at least one tunable laser source and at least one diffractive optical element. The projector is configured to generate the at least two illumination patterns each including a plurality of illumination features by controlling at least one property of the tunable laser source. The projector includes at least one control unit. The control unit is configured for controlling the at least one property of the tunable laser source.