A dot pattern projector includes a light source array, a lens and a diffracting unit. The light source array includes a plurality of light sources that emit light beams. The lens is configured to collimate the light beams. The diffracting unit is configured to diffract the collimated light beams thereby to project an illumination pattern, wherein the illumination pattern is formed by overlapping multiple dot patterns that are projected by different light sources or interlacing multiple dot patterns that are projected by different light sources.

A line pattern projector includes a light source array, a lens and a diffractive microlens array. The light source array includes a plurality of light sources that emit light beams, wherein the plurality of light sources are arranged along a first direction. The lens is configured to collimate the light beams. The diffractive microlens array (MLA) is configured to diffract the collimated light beams thereby to project an illumination pattern, wherein a lens pitch of the diffractive MLA with respect to the first direction is wider than a lens pitch of the diffractive MLA with respect to a second direction. The illumination pattern is formed by overlapping multiple dot patterns that are projected by the light sources; and the illumination pattern includes a plurality of line light patterns in the first direction.

The image inspection apparatus includes an image capturing unit which captures images of an object, a transparent illumination unit disposed between the object and the image capturing unit, and a control unit configured to control the image capturing unit and the illumination unit. The illumination unit radiates light to the object in a first direction and causes the light to scan and radiates light to the object in a second direction and causes the light to scan. The image capturing unit captures images of the object. The control unit identifies a light-emitting position of the illumination unit when a measurement point of the surface of the object is illuminated from images of the object captured, and calculates a distance to the measurement point on the basis of the identified light-emitting position, the first direction and the second direction.

A diffractive optical element includes: a substrate; a protrusion and recess portion that is formed on one surface of the substrate and imposes predetermined diffraction on incident light; and an antireflection layer provided between the substrate and the protrusion and recess portion. An effective refractive index difference Δn in a wavelength range of the incident light between a first medium constituting a protrusion of the protrusion and recess portion and a second medium constituting a recess of the protrusion and recess portion is 0.70 or more. An exit angle range θ.sub.out of diffraction light exiting from the protrusion and recess portion when the incident light enters the substrate from a normal direction of the substrate is 60° or more. Total efficiency of diffraction light exiting from the protrusion and recess portion in the exit angle range is 65% or more.

A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first substrate is detected, at least one image indicating a plurality of second solder pastes with anomalies detected by using an image about a first substrate, applies the at least one image to a machine-learning-based model, acquires a plurality of first values indicating relevance of respective first fault types to the at least one image and a plurality of first images indicating regions associated with one of a plurality of first fault types, determines a plurality of second fault types, which are associated with the plurality of second solder pastes by using the plurality of first values and the plurality of first images, and determines at least one third solder paste, which is associated with the respective second fault types.

Disclosed herein is a display device including an illumination source for projecting an illumination pattern including a plurality of illumination features on a scene; an optical sensor for determining a first image including a plurality of reflection features; a translucent display, where the illumination source and the optical sensor are placed in a direction of propagation of the illumination pattern in front of the display; and an evaluation device configured for evaluating the first image by identifying and sorting the reflection features with respect to brightness, each reflection feature including a beam profile, determining a longitudinal coordinate for each reflection feature by analyzing their beam profiles,

unambiguously matching reflection features with corresponding illumination features using the longitudinal coordinate classifying a reflection feature as a real feature or a false feature, rejecting the false features, and generating a depth map for the real features using the longitudinal coordinate.

A system includes a processor, a light source controlled by the processor and configured to emit a light, and an event based vision sensor controlled by the processor. The sensor includes a plurality of pixels. At least one of the plurality of pixels includes a photosensor configured to detect incident light and first circuitry configured to output a first signal based on an output from the photosensor. The first signal indicates a change of amount of incident light. The sensor includes a comparator configured to output a comparison result based on the first signal and at least one of a first reference voltage and a second reference voltage. The processor is configured to apply one of the first reference voltage and the second reference voltage to the comparator selectively based on an operation of the light source.

An optical assembly (13) for a three-dimensional measurement device is equipped with: an optical lens (320) that forms a pair of conjugate planes having an optically conjugate relationship; an optical device (341) that is disposed on one of the pair of conjugate planes; a temperature sensor (354) for detecting the temperature of the optical lens (320); a heater (350) for heating the optical lens (320); and a control part that controls the operation of the heater (350) on the basis of the result of the detection made by the temperature sensor (354) such that the optical lens (320) reaches a constant temperature.

An object recognition system of the disclosure includes: a light source emitting dot light having a predetermined pattern to an object; an event detection sensor receiving the dot light having the predetermined pattern reflected by the object and detecting the fact that a change in luminance of a pixel has exceeded a predetermined threshold as an event; and a signal processor removing information other than event information originated from the dot light emitted from the light source and having the predetermined pattern among event information detected by the event detection sensor.

A laser projection module is provided. The laser projection module includes a substrate assembly, a lens barrel assembly, a light source, a diffractive optical element and a collimation element. The lens barrel assembly includes a lens barrel and a stop member connected to the lens barrel. The lens barrel is disposed on the substrate assembly and configured to define a receiving cavity together with the substrate assembly. The light source is disposed on the substrate assembly, accommodated in the receiving cavity, and configured to emit laser to the receiving cavity. The diffractive optical element and the collimation element are accommodated in the receiving cavity. The light source, the collimation element and the diffractive optical element are sequentially disposed in an optical path of the light source. The stop member is configured to prevent the diffractive optical element from moving in a light-emitting direction of the laser projection module.