A method is disclosed for operating a coordinate measuring machine (CMM) including a workpiece scanning probe. The method provides two different measurement sampling period durations in the scanning probe: a first shorter sampling duration provides a faster measurement having a first accuracy, a second longer sampling duration provides a slower measurement having a second (better) accuracy. The shorter sampling duration may be repeatedly interleaved or alternated with the longer sampling duration to provide sufficient accuracy and response time for motion control purposes during ongoing operation of the CMM. The longer sampling duration may provide high accuracy probe measurements to combine with position coordinate values from encoders located on motion axes of the CMM (outside the scanning probe) to provide high accuracy workpiece measurements at a desired frequency, or upon demand. A probe measurement timing subsystem may determine initiation times of the first and second sampling durations.

A coordinate measurement machine includes a column that can move relative to a placement surface on which a workpiece is placed, a guide part that is provided on the placement surface, the guide part guiding the column, a scale of a linear encoder that is supported on a side surface of the guide part, and detectors that are provided on the column, the detectors detecting a relative displacement with respect to the scale. The detectors detect a displacement of the column in each of a moving direction and a vertical direction. A coordinate measurement machine further includes a deformation amount acquisition part that acquires an amount of deformation of the guide part relative to the scale on the basis of detection results of the detectors.

A coordinate measuring system for determining 3D coordinates of an object, comprising a coordinate measuring device comprising an arrangement of sensors configured to generate measurement data from which 3D coordinates of measurement points on the object are derivable, and a computing device configured to determine, based on the measurement data, 3D coordinates of the measurement points, and for storing nominal data of the object in a data storage, the nominal data comprising nominal dimension data of the object for a pre-defined temperature, wherein the nominal data comprises one or more expansion coefficients of the object, the coordinate measuring system comprises at least one temperature sensor that is configured to determine actual temperature values of the object, the at least one temperature sensor is configured to generate temperature data; and the computing device is configured to determine tempered coordinates of the object.

A metrological apparatus (15) is disposed for adjustment of an attitude of a workpiece (16) having an arcuate upper surface (17) relative to a rotary axis (C) of the metrological apparatus (15). The workpiece (16) is brought into a first rotary position (c1). A plurality of measured points within a measuring plane on the upper surface (17) is recorded. The workpiece (16) is moved into a further rotary position (c2) about the rotary axis (C), and again measured points in the measuring plane (E) on the upper surface (17) of the workpiece (16) are recorded. Based on these recorded measured points, the actual attitude (Li) of the workpiece (16) deviation from a specified target attitude (Ls) are determined. Adjustment parameters are determined, and an adjustment assembly (24) of the metrological apparatus (15) is activated as a function of the calculated adjustment parameters to adjust the workpiece (16).

A magnetic sensor system includes a magnetic sensor device and a signal processing circuit. The magnetic sensor device generates first to third detection signals corresponding to components in three directions a field generated by a magnetic field generator that is able to change its relative position with respect to the magnetic sensor device. The signal processing circuit includes first and second processors. The second processor generates sphere information and transmits it to the first processor. When coordinates representing a set of values of the first to third detection signals in an orthogonal coordinate system are taken as a measurement point, the sphere information includes data on center coordinates of a virtual sphere having a spherical surface approximating a distribution of a plurality of measurement points. The first processor detects a change in offsets of the first to third detection signals by using the sphere information transmitted from the second processor.

The invention relates to a terahertz (THz) apparatus for transmitting and/or receiving THz radiation, comprising at least one THz element, which is designed to transmit and/or receive THz radiation, and a digital data processing device, wherein in particular the digital data processing device is designed to at least temporarily process a first signal of at least one component of the apparatus.

A touch probe circuit comprises a displacement sensor having a sensor signal responsive to touch probe stylus displacement, an offset compensation controller, and a difference amplifier. The offset compensation controller provides a varying offset compensation signal to compensate drift in a rest-state signal component of the sensor signal. The difference amplifier inputs the offset compensation signal and the sensor signal and amplifies the difference therebetween to provide an offset compensated displacement signal, which is output to a touch trigger signal generating circuit that provides a touch signal when the stylus touches a workpiece, and is also output to the offset compensation controller. The offset compensation controller portion provides a feedback loop that inputs the offset compensated displacement signal and outputs a responsive low pass filtered offset compensation signal to the difference amplifier, in order to provide the offset compensated displacement signal.

A measuring apparatus that performs measurement of position and posture of an object, the apparatus comprising: a measuring head for performing the measurement; a detector configured to detect a temperature; and a processor configured to output information of an offset amount of a position of the measuring head, based on the detected temperature.

A surface texture measuring device according to the present invention includes a surface texture detecting component that outputs measurement results for a surface texture of a measurable object, where the measurement results are recognized as a change in the movement of a contact pin of a detector when tracing a surface of the measurable object with the contact pin; a posture detecting sensor that detects a measured posture, which is a posture at the time of measurement by the detector; a memory component that is preloaded with correction values corresponding to each of a plurality of postures; and a correcting component that compares the measured posture with the plurality of postures stored in the memory component, and corrects the measurement results using a correction value that corresponds to a posture equivalent to the measured posture.

A method for providing static and dynamic position information of a designated point of a measuring device having a surface and a structure that includes the designated point and being arranged moveable relatively to the surface. The method includes defining a model for representing an actual position of the designated point relative to the surface and deriving the actual position of the designated point by a calculation based on the defined model. At least two cells are used to model the structure. The at least two cells are linearly arranged in a linear extension direction. At least one of the cells is a variable cell of a set of at least one variable cell and exhibits variable elongation as to the extension direction. An actual elongation of the at least one variable cell is set to model a positional change, particularly in linear extension direction, of the designated point.