Patent classifications
G01J2001/4261
LASER RADIATION SYSTEM AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
A laser radiation system according to a viewpoint of the present disclosure includes a first optical system configured to convert a first laser flux into a second laser flux, a multimirror device including mirrors, configured to be capable of controlling the angle of the attitude of each of the mirrors, and configured to divide the second laser flux into laser fluxes and reflect the laser fluxes in directions to produce the divided laser fluxes, a Fourier transform optical system configured to focus the divided laser fluxes, and a control section configured to control the angle of the attitude of each of the mirrors in such a way that the Fourier transform optical system superimposes the laser fluxes, which are divided by the mirrors separate from each other by at least a spatial coherence length of the second laser flux, on one another.
AN APPARATUS AND METHOD FOR ASSESSING THE BEAM PROFILE OF A NON-CONTACT TOOL SETTING APPARATUS
A method assesses the beam profile of a light beam of a non-contact tool setting apparatus, the apparatus including a transmitter for emitting the light beam and a receiver for receiving the light beam. The receiver generates a beam intensity signal describing the intensity of received light. The apparatus is mounted to a machine tool having a spindle that is moveable relative to the non-contact tool setting apparatus. The method includes loading an object having an edge into the spindle of the machine tool and using the machine tool to move the spindle relative to the apparatus so that the edge of the object passes through the light beam. The beam profile of the light beam is then determined using the beam intensity signal generated at a plurality of positions during the step (ii) of moving the edge of the object through the light beam.
Information processing device, information processing method, and program
An information processing device configured to obtain an index with regard to light entering a measurement target region in a wider range is disclosed. The information processing device calculates, on a basis of a measured value of a reference reflection region, a reference index including a sunny place reference index and a shady place reference index, and calculates, on a basis of a measured value of a measurement target region obtained by performing sensing for the measurement target region and the reference index, a measurement target region index including a sunny measurement target region index being an index with regard to light entering a sunny region in the measurement target region and a shady measurement target region index being an index with regard to light entering a shady region in the measurement target region.
DETERMINATION DEVICE FOR DETERMINING AT LEAST ONE PARAMETER OF AN ENERGY BEAM
Determination device (1) for determining at least one parameter of an energy beam (5) for an apparatus (3) for additively manufacturing three-dimensional objects by means of successive layerwise selective irradiation and consolidation of layers of a build material which can be consolidated by means of an energy beam (5), wherein the determination device (1) comprises a beam guiding element (12) adapted to guide the energy beam (5) to a determination unit (7) which is adapted to determine at least one parameter of the energy beam (5), wherein the determination unit (7) and the beam guiding element (12) are arranged as a determination assembly in a defined spatial arrangement relative to each other, wherein the determination assembly is movable, in particular rotatable, into at least a first and a second determination position, wherein the determination unit (7) is adapted to receive the energy beam (5) being guided to a first spatial position from the beam guiding element (12) in the first determination position and to receive the energy beam (5) being guided to a second spatial position from the beam guiding element (12) in the second determination position.
Method and Apparatus for Determining a Radiation Beam Intensity Profile
Methods and apparatus for determining an intensity profile of a radiation beam. The method comprises providing a diffraction structure, causing relative movement of the diffraction structure relative to the radiation beam from a first position wherein the radiation beam does not irradiate the diffraction structure to a second position wherein the radiation beam irradiates the diffraction structure, measuring, with a radiation detector, diffracted radiation signals produced from diffraction of the radiation beam by the diffraction structure as the diffraction structure transitions from the first position to the second position or vice versa, and determining the intensity profile of the radiation beam based on the measured diffracted radiation signals.
DETECTION OF OPTICAL SURFACE OF PATIENT INTERFACE FOR OPHTHALMIC LASER APPLICATIONS USING A NON-CONFOCAL CONFIGURATION
An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.
SYSTEMS, METHODS, AND APPARATUSES FOR IN MACHINE PROFILING OF A LASER BEAM
A laser system includes a controller comprising a processor and a non-transitory machine-readable memory, a laser head configured to output a laser beam, a work bed positioned opposite the laser head, and a power meter communicatively coupled to the electronic control unit and integrated within the work bed. The laser system further includes a knife edge plate positioned between the power meter and the laser head, and a machine-readable instruction set stored in the non-transitory machine readable memory that causes the laser system to perform at least the following when executed by the processor: position the laser head at a distance from the power meter, cause the laser head to output the laser beam, translate the laser head across the power meter, receive power signals from the power meter as the laser beam is translated across the power meter, and calculate a spot size based on the power signals.
DIVERGENCE ANGLE MEASUREMENT DEVICE, DIVERGENCE ANGLE MEASUREMENT METHOD, LASER APPARATUS, AND LASER SYSTEM
A divergence angle measurement device that monitors a divergence angle of laser light propagated in an optical fiber having a core and a cladding is provided. The divergence angle measurement device includes: a first photodetector that detects laser light that leaks from the cladding; and a processor that obtains the divergence angle of the laser light propagated in the optical fiber based on a detection result of the first photodetector and power information that indicates power of the laser light propagated in the optical fiber.
Rapid Beam Measuring in Several Planes
The invention relates to a method and an apparatus for the direct determination of spatial dimensions of a light beam with high precision and short measuring period, which are also suitable for the measuring of laser beams with high power in the range of the beam focus. For this purpose, an apparatus is proposed that includes a beam scanner (20), at least one light sensor (60), a movement device (50) for the execution of a relative movement between the light beam (10) and the beam scanner (20), and a device (64) for the signal recording of a temporally variable signal of the light sensor (60). The beam scanner (20) comprises at least one scanning body (21) with at least three sampling areas (22), which extends along sampling lines. The sampling areas (22) are configured for the extraction of linear or strip-shaped light samples from a cross-section (14) of the light beam (10). Several scanning surfaces (25) are defined by the sampling lines of the sampling areas (22), each spanned by a movement vector (55) of the relative movement. At least three scanning surfaces (25) have a non-zero distance from one another in the direction of the axis of the light beam. The light sensor (60) is configured for the detection of at least a portion of the sampled light extracted by the sampling areas (22) from the cross-section (14) of the light beam (10).
Transparent measuring probe for beam scanning
The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30). The body (20) and the light beam (10) are movable in two different directions of movement (51, 52) perpendicular to the direction of the axis (11) of the light beam (10) relative to each other. The probe area (30) has a shape whose two-dimensional projection on a surface perpendicular to the axis (11) of the light beam (10) approximately the same dimensions in the two different directions of movement (51, 52) perpendicular to the axis (11) of the light beam (10).