The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components (70) by means of layered solidification of a construction material (55) by an energy beam (30). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (40), a processing plane (45), and a layer applicator (60). The device according to the invention comprises a movable beam barrier (17), a movable beam sampling module (20) and a measuring device (10) with a radiation detector (12).

An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.

The invention relates to a method and a device for the analysis of energy beams in systems for the additive manufacture of components (70) by means of layered solidification of a construction material (55) by an energy beam (30). The invention enables a determination of position-related beam data directly with respect to the processing point during the machining process. An additive manufacturing system includes a beam deflecting device (40), a processing plane (45), and a layer applicator (60). The device according to the invention comprises a movable beam barrier (17), a movable beam sampling module (20) and a measuring device (10) with a radiation detector (12). The method includes the following procedure steps. The beam barrier (17) and the beam sampling module (20) are positioned in the beam path between the beam deflecting device (40) and at least one selected processing coordinate (44) in the processing plane (45). The beam deflecting device (40) is aligned with the selected processing coordinate (44) and the energy beam (30) is turned on for a limited period of time. At least a portion of the beam (32) aligned by the beam deflecting device (40) toward the selected processing coordinate (44) is directed to the measuring device (10) with the radiation detector (12). At least one beam datum is determined by means of the measuring device (10). The process steps are performed during a production process of the component (70) in a period of time before or after solidification of a single layer of the component (70).

This disclosure provides methods and apparatuses which advantageously stabilize beam parameters and elongate crystal lifetime. In one aspect, a UV laser apparatus includes a non-linear crystal, a laser source, a beam-crystal displacer, a beam parameter monitor, and a laser control unit. The laser source directs a source beam to the non-linear crystal to produce a UV beam and the beam-crystal displacer shifts the non-linear crystal relative to the source beam at a plurality of shift speeds. The beam parameter monitor measures the UV beam and outputs a measurement of a beam parameter. The laser control unit: receives the measurement; determines, based on the measurement, an adjustment in shift speed that steers the beam parameter toward a target value; and outputs the adjustment to the beam-crystal displacer.

An information processing device configured to obtain an index with regard to light entering a measurement target region in a wider range is disclosed. The information processing device calculates, on a basis of a measured value of a reference reflection region, a reference index including a sunny place reference index and a shady place reference index, and calculates, on a basis of a measured value of a measurement target region obtained by performing sensing for the measurement target region and the reference index, a measurement target region index including a sunny measurement target region index being an index with regard to light entering a sunny region in the measurement target region and a shady measurement target region index being an index with regard to light entering a shady region in the measurement target region.

A method and a gonioradiometer for the direction-dependent measurement of at least one photometric or radiometric characteristic of an optical radiation source. The emission direction of the photometric or radiometric characteristic is described using a system of planes (A, B, C), the planes of which intersect at an intersection line which passes through the radiation centroid of the radiation source, and using an emission angle (, , ) which specifies the emission direction (, , ) within a considered plane. A sensor or the radiation source is fastened to a multi-axis articulated robot. The robot is configured to only swivel about precisely one of its axes during a measuring process, in which measurement values relating to different emission angles (, , ) within a considered plane of the system of planes (A, B, C) or to different planes at a considered emission angle (, , ) are detected.

A laser processing apparatus includes a branching unit configured to branch a laser beam to a first optical path and a second optical path, a condenser configured to condense the branched laser beams on a processing face of a workpiece, an output power measuring unit configured to measure the output power of the laser beam emitted from a laser beam generation unit and having passed through the condenser, and a blocking member positioning mechanism disposed between the condenser and the output power measuring unit and capable of positioning a blocking member between a first laser beam blocking position at which the blocking member blocks only the laser beam of the first optical path from between the branched laser beams and a retracted position at which the blocking member blocks none of the laser beams.

The invention relates to a measuring probe for scanning light beams (10) or laser beams. The measuring probe is suitable for scanning laser beams with very high power and for determining geometric parameters of a light beam (10) with high spatial resolution. For this purpose, a device is proposed which comprises a body (20), a probe area (30) and a detector (40). The body (20) is made of an optically transparent material and has a light beam entry surface (22), a light beam exit surface (23) and a detection light exit surface (25). The light beam entry surface (22) and the light beam exit surface (23) are for the most part smooth and polished. The body (20) includes the probe area (30) having light-deflecting structuring. The detector (40) is designed to detect at least part of the beam portion (15) deflected from the light beam (10) by the probe area (30). The body (20) and the light beam (10) are movable in two different directions of movement (51, 52) perpendicular to the direction of the axis (11) of the light beam (10) relative to each other. The probe area (30) has a shape whose two-dimensional projection on a surface perpendicular to the axis (11) of the light beam (10) approximately the same dimensions in the two different directions of movement (51, 52) perpendicular to the axis (11) of the light beam (10).

An apparatus for the determination of geometric parameters of a laser beam, such as, for example, the beam diameter or the focus diameter. The apparatus includes a device for the emission of a laser beam into an active region, a detector arrangement, which can be positioned in the active region, a device for the provision of a relative movement between the laser beam and the detector arrangement, and a device for the registration and evaluation of a temporally varying signal of the detector arrangement. The detector arrangement includes at least one light guide, at least two flight-diffusing structures, and at least one light-sensitive sensor. The light guide has a light-emitting surface and a light-conducting region, with an elongated shape. The at least two light-diffusing structures are essentially extended along two different directions.

A light beam measurement device includes: a polarization measurement unit including a first measurement beam splitter provided on an optical path of a laser beam and configured to measure a polarization state of the laser beam having been partially reflected by the first measurement beam splitter; a beam profile measurement unit including a second measurement beam splitter provided on the optical path of the laser beam and configured to measure a beam profile of the laser beam having been partially reflected by the second measurement beam splitter; and a laser beam-directional stability measurement unit configured to measure a stability in a traveling direction of the laser beam, while the first measurement beam splitter and the second measurement beam splitter are made of a material containing CaF.sub.2.