Electro-optical conversion of an input analog signal and optical modulation of the optical signal to provide light of different intensity levels to 2.sup.n photodetection sites whose outputs can be encoded as an n-bit digital output value. The sample rate can exceed 10 GHz (rates above 100 GHz are possible) with much greater simplicity of electronic circuitry.

An optical sensor includes at least one photodetector configured to be reverse biased at a voltage exceeding a breakdown voltage by an excess bias voltage. At least one control unit is configured to adjust the reverse bias of the at least one photodetector. A method of operating an optical sensor is also disclosed.

According to one embodiment, an automatic analyzing apparatus includes: a holder including a plurality of placement portions for a reaction tube to be placed thereon; a photometry unit for performing photometry on a solution inside the reaction tube, the photometry unit including a plurality of light emitters and a plurality of first light receivers respectively disposed in the plurality of placement portions; and processing circuitry configured to adjust quantities of light of the plurality of light emitters based on a light quantity signal from a second light receiver that receives light generated by the light emitters and guided by jig inserted into the placement portions.

A current Iin is separated into currents I1 and I2. When I1 flows in a light emitting diode D1, the diode D1 emits light and the current path of a phototransistor Q1 becomes conductive. At that time, current Iout flows in a light emitting diode D2. When the diode D2 emits light, the current path of a phototransistor Q2 becomes conductive, and I2 flows. If the value of the current Iout is large, the light emitting strength of the diode D2 is large. A large current I2 flows in the phototransistor Q2, which decreases the value of the current I1 flowing in the diode D1. As a result, the light emitting strength of the diode D1 becomes small, and the value of the current Iout decreases. In this manner, since a photocoupler P2 functions as a negative feedback circuit, linearity of the current Iin and the current Iout improves.

Methods and systems for performing analog-to-digital conversion are proposed. In one example, An analog-to-digital converter (ADC) comprising a quantizer, the quantizer having a first quantization resolution for a first quantization operation subrange and a second quantization resolution for a second quantization operation subrange. At least one of the first quantization resolution or the first quantization operation subrange is programmable. At least one of the second quantization resolution or the second quantization operation subrange is programmable. The quantizer is configured to: receive an input voltage; and based on whether the input voltage belongs to the first quantization operation subrange or to the second quantization operation subrange, quantize the input voltage at the first quantization resolution or at the second quantization resolution to generate a digital output.

An optical parameter measurement device and a corresponding method are provided. A light beam from a to-be-tested display panel is split by a beam-splitting assembly into at least two testing light beams. A voltage value corresponding to a first testing light beam is measured by a trans-impedance amplification circuit corresponding to a first optical sensor. Next, an integration time period is determined by a control circuit according to voltage values from the trans-impedance amplification circuit and a predetermined relational model between voltage values corresponding to the light intensities and integration time periods. A voltage value corresponding to a second testing light beam is finely measured by the integration circuit corresponding to a second optical sensor within the integration time period. Finally, the display brightness value of the to-be-tested display panel is determined by the control circuit according to a voltage value from the integration circuit within the integration time period.

A system for generating clock signals for a photonic quantum computing system includes a pump photon source configured to generate a plurality of pump photon pulses at a first repetition rate, a waveguide optically coupled to the pump photon source, and a photon-pair source optically coupled to the first waveguide. The system also includes a photodetector optically coupled to the photon-pair source and configured to generate a plurality of electrical pulses in response to detection of at least a portion of the plurality of pump photon pulses at the first repetition rate and a clock generator coupled to the photodetector and configured to convert the plurality of electrical pulses into a plurality of clock signals at the first repetition rate.

Disclosed are an ultraviolet measuring device, a photodetector, an ultraviolet detector, an ultraviolet index calculation device, and an electronic device or portable terminal including the same. In one aspect, an ultraviolet measuring is provided to comprise: a substrate on which an electrode is formed; a readout integrated circuit (ROTC) unit electrically connected with the electrode; and an aluminum gallium nitride (AlGaN) based UVB sensor electrically connected with the readout integrated circuit unit and formed on an insulating substrate, wherein the read-out integrated circuit converts a photocurrent input from the UV sensor into a digital signal including UV data.

An optical parameter measurement device and a corresponding method are provided. A light beam from a to-be-tested display panel is split by a beam-splitting assembly into at least two testing light beams. A voltage value corresponding to a first testing light beam is measured by a trans-impedance amplification circuit corresponding to a first optical sensor. Next, an integration time period is determined by a control circuit according to voltage values from the trans-impedance amplification circuit and a predetermined relational model between voltage values corresponding to the light intensities and integration time periods. A voltage value corresponding to a second testing light beam is finely measured by the integration circuit corresponding to a second optical sensor within the integration time period. Finally, the display brightness value of the to-be-tested display panel is determined by the control circuit according to a voltage value from the integration circuit within the integration time period.

A light sensor assembly is provided including a base assembly configured to be fixedly mounted to a housing of a light fixture. The base assembly holds fixture contacts configured to be electrically connected to the light fixture. A photocell module is provided on the base assembly. The photocell module includes a control circuit board having an upper surface and a lower surface. The control board includes contact openings therethrough and conductors associated with corresponding openings. The photocell module has a photocell electrically connected to the control circuit board. Receptacle contacts are received in corresponding contact openings in the control board. Each receptacle contact has a socket removably receiving the corresponding fixture contact. Each receptacle contact has a mating interface electrically connected to the corresponding fixture contact. Each receptacle contact has a mounting beam terminated to the corresponding conductor of the control board. A cover is coupled to the base assembly over the photocell module.