An imaging device includes: an area light source including an emission surface from which a sub-terahertz wave is emitted to a measurement target; and a detector including an image sensor that receives a reflected wave generated by the measurement target reflecting the sub-terahertz wave emitted from the emission surface. The area light source includes: at least one point light source that emits a sub-terahertz wave; and a reflector that reflects the sub-terahertz wave emitted from the at least one point light source, to generate a sub-terahertz wave to be emitted from the emission surface. The reflector has a reflection surface that is a bumpy surface which includes two or more frequency components in a spatial frequency range and whose roughness curve element mean length RSm is at least 0.3 mm.

The single-use disposable spectrophotometer described herein can measure one or more blood chemistry analytes from a drop of whole blood. A passive filtration system takes whole blood and delivers plasma along with a dissolved reporter molecule to one or more spectrophotometers which can operate with narrow band optical spectrum centered on an optical detection frequency. The spectrophotometer detects the changes in absorption of the plasma as a result of a chemistry reaction to determine the concentration or activity of one or more analytes.

Fourier Transformation Spectrometer, FT Spectrometer, comprising: Michelson-Type Interferometer (601, 602, 603, 604, 605, 606, 607, 608, 609) comprising: at least one beam splitter unit designed to split an incident light beam (EB) of a spatially expanded object into a first partial beam (TB1) and a second partial beam (TB2); and for at least partially overlaying the first partial beam (TB1) and the second partial beam (TB2) with a lateral shear (s); a first beam deflection unit designed to deflect the first partial beam (TB1) at least once; a second beam deflection unit designed to deflect the second partial beam (TB2) at least once; wherein at least one among the first beam deflection unit and the second beam deflection unit represents a (2n+1) periscope group with (2n+1) mirror surfaces, and all (2n+1) mirror surfaces are arranged vertically in relation to a common reference plane, in order to respectively deflect the first partial beam (TB1) and/or the second partial beam (TB2) (2n+1) times, and wherein the (2n+1)-fold deflection generates the lateral shear (s) between the first partial beam (TB1) and the second partial beam (TB2), and wherein n is a natural number ≥1.

An optical system includes an optical element and an optical filter with a first set of channels and a second set of channels respectively associated with a first region and a second region of the optical filter. The optical element causes first light beams and second light beams associated with a subject to respectively fall incident on the first region within a first incidence angle range and on the second region within a second incidence angle range. A first channel, of the first set of channels, passes, based on the first incidence angle range, a set of the first light beams that are associated with a first subrange of a particular wavelength range. A second channel, of the second set of channels, passes, based on the second incidence angle range, a set of the second light beams that are associated with a second subrange of the particular wavelength range.

A spectroscopic module includes a plurality of beam splitters; a plurality of bandpass filters disposed on one side in a Z direction with respect to the plurality of beam splitters; a light detector disposed on the one side in the Z direction with respect to the plurality of bandpass filters and includes a plurality of light receiving regions; a first support body supporting the plurality of beam splitters; a second support body supporting the plurality of bandpass filters; and a casing including a third wall portion integrally formed with the second support body. The first support body is attached to the third wall portion such that an outer surface of the first support body is in contact with an inner surface of the third wall portion in a state where the position is defined by a plurality of positioning pins and a plurality of positioning holes.

A Raman spectrometer arrangement comprising a Raman spectrometer 1 having a laser 1001 for illuminating a sample S and a spectrometer accessory 4 configured to be mounted on the spectrometer, wherein the spectrometer accessory comprises a surface configured to receive the sample S. The Raman spectrometer arrangement is configured to operate in at least a first configuration and a second configuration, wherein the first configuration is such that the laser 1001 illuminates the sample S before reaching a level of the surface and the second configuration is such that the laser 1001 reaches the level of the surface before illuminating the sample S.

A multiband IR adjunct (MIRA) sensor to spectroscopically determine the content and the concentration of chemical composition of a targeted object, includes a sensor housing, a first front optics in a first optical channel, a second front optics in the first optical channel, an acousto-optic tunable filter (AOTF), a photo detector (PD), a set of back optics in the first optical channel that focuses polarized narrow-band light beams received from the AOTF device onto the PD, the PD converting the polarized narrow-band light beams into an electrical signal, and a data acquisition unit signal-connected to the PD, the data acquisition unit collecting the electrical signals. Multiple optical channels can be provided within the housing to analyze UV/VIS/near infrared (NIR), short-wavelength infrared (SWIR), mid-wavelength infrared (MWIR), and LWIR wavelength ranges respectively.

This disclosure relates to a method for measuring an electric field in the near-field region of an optically excited sample. The method includes optically exciting at least part of the sample. This step includes directing excitation light onto an interface between the sample and a medium. The excitation light is incident onto the interface under an angle of incidence such that total internal reflection of the excitation light occurs at the interface. The method further includes measuring the electric field using a terahertz near-field probe, wherein the terahertz near-field probe is positioned on one side of the interface and the excitation light approaches the interface on another side of the interface. This disclosure further relates to a system and computer program for measuring an electric field in the near-field region of an optically excited sample.

A method of optical analysis comprises receiving light at an optical spectrometer module from a light source, distributing the received light into two or more light beams with a light distribution component of the optical spectrometer module, concurrently exposing each of a reference and one or more test samples to one of the two or more light beams, and concurrently measuring a property of the light associated with each of the reference sample and one or more test samples with a corresponding detector.

Disclosed is an instrument including a multipath, monolithic optical component, made up of a portion of a transparent material between two opposite faces of the component. One of the two faces of the component is formed by a first refracting surface, and the other face includes several second refracting surfaces which are juxtaposed. Each optical path of the component is formed by one of the second refracting surfaces in combination with a corresponding portion of the first refracting surface. One such component is suited for being part, within the instrument, of a detection module with multiple optical paths arranged in parallel, with a matrix photodetector shared by the optical paths. Such a detection module may be compact enough in order to be integrated into a cryostat cold screen, improving cooling thereof, and may be combined with an objective in order to form an instrument with multiple optical paths.