Spectrometer device (100) with entrance aperture (2), diffraction grating (3), two detectors (5a, 5b) to spectrally measuring the incoming light (L), the detectors being located on the same side of the dispersion plane. Two vertically focusing mirrors (4, 4a, 4b) focus the light onto detectors, the minors being arranged as front row mirrors (4b) and back row minors (4a) along two polygon graphs (6a, 6b) offset to each other and to the focal curve. The angles of deflection (cp, .sub.91) for the front row mirrors are <90°, allowing to minimize the offset (dl) of the front row minors (4b) to the focal curve. The distances (d) between the front row minors and corresponding detectors (5b) is minimized while still avoiding collisions between the detectors (5b) and their mounts with back row detectors (5a) and their mounts. The front row mirror elements are overlapping the adjacent back row mirror element.

A system for measuring the spatial distribution of the spectral emission of a measurement zone of an object, comprises: a first objective; means for selecting a portion of an image formed by the first objective; a diaphragm; light-dispersing means located in the vicinity of the diaphragm and allowing the light coming from the selecting means to be dispersed; and a second objective placed between the selecting means and the diaphragm, interacting with the first objective so that the aperture of the diaphragm is optically conjugated with the measurement zone by the first and second objectives. The first objective forms an image on a predetermined Fourier surface on which each point corresponds to an emission direction of the object for one particular wavelength. The selecting means have a selection surface shaped depending on the predetermined. Fourier surface, and the selecting means are placed on the predetermined Fourier surface.

Aspects relate to an optical device providing a large spot size spectrometer. The optical device includes an optical head, an optical window, and a spectrometer. The optical head includes a plastic molded part having an aperture and a plurality of reflectors around the aperture formed therein. Each reflector may include a respective lamp assembled therein. The optical window is configured to receive a sample, to pass input light from the lamps to the sample and to pass scattered light from the sample towards the aperture. The aperture is configured to filter a first portion of scattered light containing unusable sample information and to pass a second portion of the scattered light to the spectrometer.

A spectral property acquisition apparatus includes: a first conveying device to convey an object in predetermined conveying direction; a color data acquisition device including a plurality of spectroscopic sensors in the conveying direction, the plurality of spectroscopic sensors receive light emitted and reflected by the object to acquire color data on the object; a second conveying device to convey the color data acquisition device in a direction orthogonal to the conveying direction; and circuitry to estimate a spectral property of the object based on the color data. The circuitry controls the first conveying device so as to generate predetermined tension for the object in a color data acquisition area in which the color data on the object is acquired.

A diffraction device includes a ZnS member and a ZnSe member coupled to the ZnS member, and a diffraction grating is provided on the ZnSe member.

A spectrometer for detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest, and a method of detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest. The method uses an entrance aperture; a dispersion and imaging optics containing at least one dispersion element; an exit aperture; a collection optics; and at least one single-pixel detector, each single-pixel detector sensitive to one or more of the wavelength components; and the method comprises the steps of spatially encoding at least one entrance slit of the entrance aperture along a direction substantially transverse to a direction of dispersion of the dispersion and imaging optics; creating, using the dispersion and imaging optics, dispersed images of the entrance aperture on a plane of the exit aperture, such that respective images at the different wavelength components are offset by different amounts of displacements along the direction of dispersion; spatially encoding a plurality of exit slits of the exit aperture along the direction substantially transverse to the direction of dispersion, wherein the exit aperture comprises a plurality of exit slits arranged in the direction of dispersion; gathering, using the collection optics, a total EM wave energy that enters the entrance aperture and exits the exit aperture to one of the at least one single-pixel detectors; changing at least one of an encoding pattern of the at least one entrance slits and an encoding pattern of the plurality of exit slits for a number of times; and measuring the output of the at least one detector for respective ones of the number of times for reconstructing the EM wave spectrum.

A Fourier spectrophotometer includes: a light source; an interferometer configured to obtain first and second interferograms whose intensity distributions are inverted from each other from the light emitted from light source; a multiplexing optical system configured to multiplex the first and second interferograms to irradiate the sample with a resultant interferogram; a demultiplexing optical system configured to demultiplex the first and second interferograms contained in the light passing through the sample; a light receiver configured to output a first light reception signal obtained by receiving the demultiplexed first interferogram and a second light reception signal obtained by receiving the demultiplexed second interferogram; and a signal processing device configured to perform processing for obtaining a noise-removed spectrum of the wavelength component in the analysis wavelength band by using the first and second light reception signals.

Aspects of the present disclosure provide a method for wavelength calibration of a spectrometer. The method can include receiving a calibration light signal having first spectral components of different first wavelengths; separating and projecting the first spectral components onto pixels of a detector of the spectrometer; establishing a relation between the first wavelengths and pixel numbers of first pixels on which the first spectral components are projected; calculating first residual errors between the first wavelengths and estimated wavelengths that are associated by the relation to the pixel numbers of the first pixels; receiving an optical signal having a second spectral component of a second wavelength; projecting the optical signal onto a second pixel; and calibrating the second wavelength based on a second residual error calculated based on one of the first residual errors that corresponds to a pair of the first pixels between which the second pixel is located.

Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.

In accordance with an example embodiment, a laser arrangement is provided, the laser arrangement comprising a light source for generating light output; a collimator assembly for collimating the light output from the light source into a pump beam; an optical resonator assembly for generating pulsed output beam based on the pump beam directed thereat; and a beam displacement assembly for laterally shifting the pump beam to adjust the position at which the pump beam meets a surface of the optical resonator assembly.