An optical module includes a base which has a main surface and in which a mounting region and a driving region for moving the mounting region along a first direction parallel to the main surface are provided, a movable mirror which has a mirror surface having a positional relationship of intersecting the main surface and is mounted in the mounting region, a first fixed mirror which has a mirror surface having a positional relationship of intersecting the main surface and of which a position with respect to the base is fixed, and a beam splitter unit which constitutes a first interference optical system for measurement light together with the movable mirror and the first fixed mirror. The mirror surface of the movable mirror and the mirror surface of the first fixed mirror are directed to one side in the first direction.

A system for providing optical measurements and detection in optical spectrum analyzers (OSAs) with high dynamic range and high speed is disclosed. The system may include a slit to allow inward passage of an optical beam. The system may also include an optical portion to receive the optical beam. In some examples, the optical portion may include at least one optical splitter to split the optical beam into at least two optical paths. The system may also include an electrical portion to receive the optical beams split into the at least two optical paths. In some examples, the electrical portion may include at least one photodetector to receive each of the split optical beam. The electrical portion may also include at least one amplifier communicatively coupled to each of the at least one photodetector to amplify the split optical beam. The electrical portion may further include at least one analog-to-digital converter (ADC) communicatively coupled to each of the at least one amplifier to convert the split optical beams into digital signals.

A camera includes a first lens configured to focus incoming light onto a reflective slit assembly. The reflective slit assembly comprises an elongated strip of reflective material configured to reflect some but not all of the incoming light as return light. The first lens is configured to at least partially collimate the return light from the elongated strip of reflective material. A first mirror is configured to reflect the return light from the first lens. A second mirror is configured to reflect the return light from the first mirror. An optical element is configured to separate the return light from the first mirror as a function of wavelength. A second lens is configured to focus the return light from the optical element onto a first detector. The first detector is configured to measure intensities of the return light as a function of two dimensional position on the first detector.

Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.

The present invention relates to a device and a method for limiting the output of a laser, wherein a reflecting device arranged in the optical path of a laser beam comprises a switching layer which comprises or consists of a material exhibiting a metal-insulator transition and a reflecting layer which is positioned downstream of the switching layer in the optical path of the laser beam, wherein the reflecting device is configured such that an output of the laser beam when it is incident upon the reflecting device which exceeds a predefined threshold causes a change in the refractive index of the material in the switching layer, and the output of the laser beam reflected by the reflecting device is thus reduced as compared to the output of the laser beam when it is incident upon the reflecting device due to reduced reflection by the reflecting device.

Apparatus and methods are presented for spectral domain optical imaging, in particular for single shot 3-D spectral domain imaging of the retina of the human eye. In certain embodiments one or more 3-D images across elongated areas of an object are acquired, with scanning perpendicular to the long axis of the elongated areas for imaging extended volumes of the object. In preferred embodiments the captured light is sampled in the Fourier plane, in a dimension substantially perpendicular to the long axis, with a cylindrical lenslet array, while in other embodiments the captured light is sampled in the image plane. Apparatus and methods are also presented for hyperspectral imaging of the retina, with the illuminating beams preferably angled to suppress interference from corneal reflections. Apparatus and methods are also presented for multi-wavelength wavefront sensing, with simultaneous capture of light in two or more paths with different delays.

In various implementations, a sample cell for optical analysis can include a housing configured to confine a sample to be analyzed. The cell can include at least one planar reflector and at least one concave reflector. The at least one planar reflector can be disposed in the housing to receive light from a light source. The at least one concave reflector can be disposed in the housing with respect to the at least one planar reflector to receive light reflected from the at least one planar reflector and to reflect at least of portion of the light back to the at least one planar reflector. The at least one planar reflector can be configured to reflect at least a portion of the light away from said at least one planar reflector to be analyzed.

Methods, apparatuses, and systems for improving gas detecting devices are provided. An example gas detecting device may include a receiver element. In some examples, the receiver element may include a sample filter component and a reference filter component. In some examples, the sample filter component may be positioned coaxially with the reference filter component.

A spectrometer device includes a Fabry-Perot interferometer unit, which comprises a first carrier substrate, wherein the first carrier substrate is arranged on a lower side of the Fabry-Perot interferometer unit and includes an optical aperture. The spectrometer includes at least one of a first substrate, which is arranged on an upper side of the Fabry-Perot interferometer unit, which faces away from the lower side, and a second substrate with the first carrier substrate arranged with the lower side on the second substrate. The spectrometer further includes a photodetector device arranged on or in the at least one of the second substrate and the first substrate. A first electrical connection region of the photodetector device and a second electrical connection region of the Fabry-Perot interferometer unit are electrically contacted from the same direction.

A detector device for the remote analysis of materials, in particular hazardous materials, including at least one laser, which is designed to emit pulsed laser light onto a sample located at a detection distance, and a telescope, which is designed to collect and/or focus laser light scattered on the sample and to forward the scattered laser light into an optical spectrometer. The optical spectrometer is designed for a spectral analysis of the laser light scattered on the sample. The laser is followed by a first beam path with a first reference beam and an additional beam path with a second reference beam for the scattered laser light. A unit is provided for determining a time difference between pulses of the first reference beam and pulses of the second reference beam, wherein the detection distance can be determined from the time difference. The unit is designed to determine the detection distance in real-time.