At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.

An imaging sensor comprises: an array of light-detecting elements, wherein each light-detecting element in the array of light-detecting elements is arranged in the imaging sensor so as to detect a respective wavelength interval, wherein the respective wavelength interval differs for different light-detecting elements; a pattern arranged on the array of light-detecting elements, wherein the pattern defines a plurality of transparent areas, each transparent area being associated with a corresponding light-detecting element in the array of light-detecting elements, wherein a size of a transparent area among the plurality of transparent areas is dependent of the corresponding light-detecting element with which the transparent area is associated.

Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.

A spectral imaging system comprises: a spatial encoder comprising a first light encoding device comprising a first mask for spatial encoding, the first mask being configured with one or more encoding patterns; a spectral encoder comprising: a dispersion arrangement for splitting spatially encoded light from the first light encoding device into a plurality of components; and a second light encoding device comprising a second mask for spectral encoding of the plurality of components, the second mask having one or more encoding patterns; and at least one single-pixel photodetector positioned to measure light that is encoded by the masks. The spatial encoder is operable to spatially encode light by generating a sequence of different patterns or partial patterns of the one or more encoding patterns of the first mask. The spectral encoder is operable to spectrally encode light by relative movement between the dispersion arrangement and the second mask.

A spectrophotometer 300 includes a white light source 212, condenser lenses 242a, 242b that collect light emitted from the white light source 212, a slit 245 that diffracts the light collected by the condenser lenses 242a, 242b, a concave diffraction grating 246 that splits the light having passed through the slit 245, and a multi-wavelength detector 248 having a plurality of photodetection elements 304 that detect the light split by the concave diffraction grating 246, and each of the plurality of photodetection elements 304 included in the multi-wavelength detector 248 is arranged at an image position of the concave diffraction grating 246.

Embodiments are directed to an optical spectrometry method, comprising: generating a sequence of 2D Hadamard masks along the time dimension, wherein each 2D Hadamard mask is arranged with a wavelength dimension and a coefficient dimension; detecting an optical signal from light transmitted through the sequence of 2D Hadamard masks; and reconstructing a spectrum to be detected by analyzing the optical signal, wherein each 2D Hadamard mask in the sequence of 2D Hadamard masks comprises a plurality of columns along the wavelength dimension, each column corresponding to a different Hadamard coefficient, and having different respective sequency values along the time dimension.

A system and method for detecting pathogenetic analytes including exciting a large target input area with radiation to produce scattered light to form an input beam, reformatting, with an optical slicer system, the input beam to produce an output beam, dispersing the output beam to produce an output area, capturing excitation data from the output area; and determining, with a processor, a presence of a particular analyte in the input area based on the excitation data. The input area can be greater than 100 micron squared and less than one million microns squared. The optical slicer system can be a high throughput virtual slit system. SERS analysis detects analytes of interest with both high resolution and sensitivity simultaneously, and is applicable for detection of the presence of viruses.

A device may determine a time-of-flight measurement by performing a sample of a sensor based on light received via at least one first spectral filter, wherein the at least one first spectral filter is associated with a spectral range for a time-of-flight measurement; determine that a condition is satisfied with regard to the time-of-flight measurement, wherein the condition relates to an orientation or a position of the sensor or the sensor device relative to a measurement target; trigger a spectrometry measurement to be performed based on determining that the condition is satisfied with regard to the time-of-flight measurement; and perform, based on light received via at least one second spectral filter and by performing a sample of the sensor, the spectrometry measurement for the measurement target based on the condition being satisfied with regard to the time-of-flight measurement.

An optical assembly is disclosed including two laterally variable bandpass optical filters stacked at a fixed distance from each other, so that the upstream filter functions as a spatial filter for the downstream filter. The lateral displacement may cause a suppression of the oblique beam when transmission passbands at impinging locations of the oblique beam onto the upstream and downstream filters do not overlap. A photodetector array may be disposed downstream of the downstream filter. The optical assembly may be coupled via a variety of optical conduits or optical fibers for spectroscopic measurements of a flowing sample.

Methods, apparatus and systems that relate to a low-cost reconfigurable polarimetric imaging are described. One example polarization imaging system includes a lens positioned to receive light reflected from one or more objects, and a spectral-polarization filter positioned at an aperture plane of the lens to filter the light received by the lens. The polarization imaging system can further include a sensor positioned to detect the filtered light from the spectral-polarization filter to form a polarization image of the one or more objects. The spectral-polarization filter comprises a first array of multiple spectral filters and a second array of multiple polarizers.