G01J3/0229

HYPERSPECTRAL IMAGING SYSTEM FOR GEOLOGICAL SAMPLE ANALYSIS
20220412803 · 2022-12-29 ·

Improved imaging and spectrographic devices and systems, and in particular hyperspectral systems and devices suitable for use in analysis of soils and other geological substances, as well as other types of samples. The hyperspectral systems comprise diffraction gratings and a linear image sensor, and optionally one or more of light sources, lenses, slits, and digital light processors, and corresponding control processors and memory. Among other advantages, the hyperspectral systems and devices enable detailed spectrographic analysis of specific points, regions, and/or areas in analytical samples such as core samples and other types of soil blocks, using visible, infrared, and/or ultraviolet electromagnetic radiation.

Limitation of noise on light detectors using an aperture

The present disclosure relates to limitation of noise on light detectors using an aperture. One example embodiment includes a system. The system includes a lens disposed relative to a scene and configured to focus light from the scene onto a focal plane. The system also includes an aperture defined within an opaque material disposed at the focal plane of the lens. The aperture has a cross-sectional area. In addition, the system includes an array of light detectors disposed on a side of the focal plane opposite the lens and configured to intercept and detect diverging light focused by the lens and transmitted through the aperture. A cross-sectional area of the array of light detectors that intercepts the diverging light is greater than the cross-sectional area of the aperture.

Image sensor and method of operating

Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm.sup.2, allowing it to fit on mobile devices.

Computational High-Speed Hyperspectral Infrared Camera System

A hyperspectral infrared imaging system includes optical components, multi-color focal plane array or arrays, readout electronics, control electronics, and a computing system. The system measures a limited number of spatial and spectral points during image capture and the full dataset is computationally generated.

SPECTROMETER, METROLOGY SYSTEM, AND SEMICONDUCTOR INSPECTION METHOD
20220404197 · 2022-12-22 · ·

A spectrometer and a metrology system capable of improving spectral performance are provided. The spectrometer includes a collimator lens, a focusing lens, and a spatial light modulator (SLM), wherein light reflected by the SLM is output from an output slit through the focusing lens and a dispersive optical element, and on a second plane perpendicular to a first plane including optical paths of pieces of light dispersed at different angles, an incident slit, the output slit, and a reflective plane have a conjugate relationship.

Method and Fourier Transformation spectrometer with double beam interferometer for Single Shot Imaging Fourier Spectroscopy

Fourier Transformation Spectrometer, FT Spectrometer, comprising: A double beam interferometer, comprising: At least one beam splitter unit (622; 623; 624, 625, 626, 627; 636; 673, 674, 675) for splitting an incident light beam (EB) of a spatially expanded object into a first partial beam (TB1) and a second partial beam (TB2); at least a first beam deflection unit (630; 641; 651; 661; 697) designed to deflect the first partial beam (TB1) at least a first and a second time, wherein the second beam deflection unit (630) is designed to also deflect the second partial beam (TB2) at least at first and a second time; or the double beam interferometer comprises a second beam deflection unit (642; 652; 662) designed to deflect the second partial beam (TB2) at least a first and a second time, wherein the beam deflection unit is also designed to at least partially spatially overlay the first partial beam (TB1) and the second partial beam (TB2), and the respectively first and second deflection of the first partial beam (TB1) and of the second partial beam (TB2) generates a lateral shear (s); at least a first field of view discriminator unit (BFD1; 631; 645; 653; 656; 666; 677; 976) arranged such that the first partial beam (TB1) is spatially selected after the splitting and prior to the second deflection; at least a second field of view discriminator unit (BFD2; 632; 646; 654; 657; 667; 678; 977) arranged such that the second partial beam (TB2) is spatially selected after the splitting and prior to the second deflection.

Optical sensor device
11530951 · 2022-12-20 · ·

An optical sensor device may include an optical sensor that includes a set of sensor elements; an optical filter that includes one or more channels; a phase mask configured to distribute a plurality of light beams associated with a subject in an encoded pattern on an input surface of the optical filter; and one or more processors. The one or more processors may be configured to obtain, from the optical sensor, sensor data associated with the subject and may determine a distance of the subject from the optical sensor device. The one or more processors may select, based on the distance, a processing technique to process the sensor data, wherein the processing technique is an imaging processing technique or a spectroscopic processing technique. The one or more processors may process, using the selected processing technique, the sensor data to generate output data and may provide the output data.

AUTOFOCUSING METHOD, SPECTROSCOPIC CAMERA, AND COMPUTER PROGRAM
20220397456 · 2022-12-15 ·

An autofocusing method includes causing light having n wavelengths different from one another to sequentially pass through a spectral filter and acquiring n image frames corresponding to the n wavelengths, n being an integer greater than or equal to two, selecting a wavelength corresponding to the image frame having the largest statistical value from the n image frames, the statistical value being one of the average, median, and mode of class values of pixels contained in a first region out of entire measurement pixels in each of the image frames, and determining a focusing point in a second region wider than the first region out of the entire measurement pixels while causing the light having the selected wavelength to pass through the spectral filter.

Optical device allowing the angular and spectral emission of an object to be measured simultaneously
11525734 · 2022-12-13 · ·

A system for measuring the spatial distribution of the spectral emission of a measurement zone of an object, comprises: a first objective; means for selecting a portion of an image formed by the first objective; a diaphragm; light-dispersing means located in the vicinity of the diaphragm and allowing the light coming from the selecting means to be dispersed; and a second objective placed between the selecting means and the diaphragm, interacting with the first objective so that the aperture of the diaphragm is optically conjugated with the measurement zone by the first and second objectives. The first objective forms an image on a predetermined Fourier surface on which each point corresponds to an emission direction of the object for one particular wavelength. The selecting means have a selection surface shaped depending on the predetermined. Fourier surface, and the selecting means are placed on the predetermined Fourier surface.

LARGE SPOT SIZE SPECTROMETER

Aspects relate to an optical device providing a large spot size spectrometer. The optical device includes an optical head, an optical window, and a spectrometer. The optical head includes a plastic molded part having an aperture and a plurality of reflectors around the aperture formed therein. Each reflector may include a respective lamp assembled therein. The optical window is configured to receive a sample, to pass input light from the lamps to the sample and to pass scattered light from the sample towards the aperture. The aperture is configured to filter a first portion of scattered light containing unusable sample information and to pass a second portion of the scattered light to the spectrometer.