Disclosed are a dual-optical-path spectrophotometer and a color measurement method thereof. The spectrophotometer includes an integrating sphere, a light source, and a sensor. A second shutter, a semi-reflecting and semi-transmitting device and lenses are arranged between the detection hole and the sensor, and a light guide device and a first shutter are arranged between a light guide hole formed in the integrating sphere and the semi-reflecting and semi-transmitting device. The color measurement method includes the following steps. A first shutter is closed, a second shutter is opened, light, reflected by the measuring opening, enters a sensor and the sensor measures a spectral reflected signal of the object surface. The first shutter is opened, the second shutter is closed, reflected light enters the sensor, and the sensor measures a spectral reflected signal of a light source. A final sampled signal is calculated.

A colorimeter 1 that measures a chromaticity of a measured object A comprises: a first light source unit 11 that emits first irradiation light having a first spectrum S1; a second light source unit 12 that emits second irradiation light having a second spectrum S2 different from the first spectrum S1; an integrating sphere 61 that has irradiation light including the first irradiation light and the second irradiation light incident thereon; a light receiver 20 that detects measured light resulting from irradiation of the measured object A with the irradiation light emitted from the integrating sphere 61; and a controller 50 that calculates an optical spectrum of the measured light based on a detection signal of the measured light. A superimposed spectrum S of the first spectrum S1 and the second spectrum S2 corresponds to a reference spectrum S0 of a standard light source as reference for calculating the chromaticity.

Disclosed are a dual-optical-path spectrophotometer and a color measurement method thereof. The spectrophotometer includes an integrating sphere, a light source, and a sensor. A second shutter, a semi-reflecting and semi-transmitting device and lenses are arranged between the detection hole and the sensor, and a light guide device and a first shutter are arranged between a light guide hole formed in the integrating sphere and the semi-reflecting and semi-transmitting device. The color measurement method includes the following steps. A first shutter is closed, a second shutter is opened, light, reflected by the measuring opening, enters a sensor and the sensor measures a spectral reflected signal of the object surface. The first shutter is opened, the second shutter is closed, reflected light enters the sensor, and the sensor measures a spectral reflected signal of a light source. A final sampled signal is calculated.

The invention relates to a method for monitoring a spectroradiometer (4), in particular for measuring light-emitting test objects (1), in which the spectral data of the test objects (1) are captured by means of an optical system, wherein the radiometric, photometric and/or colorimetric quantities of the test objects (1) are ascertained from the spectral data. The problem addressed by the invention is that of specifying a method for monitoring a spectroradiometer (4), where it is not the continuous recalibration of the spectroradiometer (4) but the monitoring of when a calibration is necessary that is paramount. The invention solves this problem by virtue of changes in the wavelength scale, in the light throughput and/or in the spectral sensitivity of the spectroradiometer (4) being detected by way of a reference light source (5), integrated into the optical system, with a defined spectrum. Optionally, at least one detector integrated into the optical system can additionally monitor the stability of the reference light source (5). Moreover, the invention relates to a device for carrying out the method.

Provided is a lighting device that emits light of a color that approximates the color of the surface of an object or the like. Disclosed is a method for manufacturing a lighting device, including the steps of: spectroscopically measuring a spectrum that constitutes a color of a measurement target; and adjusting a color of a light source such that an emission spectrum approximates the spectrum that constitutes the color of the measurement target.

An optical characteristic measurement device has a measurement opening, includes a first optical measurement unit and a second optical measurement unit that measure different optical characteristics with different geometries with respect to a measurement target facing the measurement opening, and further includes a processing unit that corrects a measurement value obtained in the second optical measurement unit based on a measurement value obtained in the first optical measurement unit. The first optical measurement unit includes an illumination optical system that illuminates the measurement target facing the measurement opening, a first light receiving optical system that collects light reflected by the measurement target, and a first light receiving unit that receives light collected by the first light receiving optical system and outputs the light as a measurement signal, and has a diffuse reflection surface that diffuses and reflects incident light to the illumination optical system or the first light receiving optical system. The second optical measurement unit includes a light projecting optical system that projects light from a direction inclined by a predetermined angle with respect to a normal line of a measurement surface of the measurement target facing the measurement opening, a second light receiving optical system that collects light reflected by the measurement target in a regular reflection direction, and a second light receiving unit that receives light collected by the second light receiving optical system and outputs the light as a measurement signal.

A system and method include a wavelength shift correction light source emitting wavelength shift correction emission-line light and a spectrometer including: a spectroscopic unit receiving with photoelectric conversion elements rays of dispersed spectral light obtained by dispersing incident light based on wavelength, and outputs electrical signals corresponding to light intensities of the rays of dispersed spectral light; and a unit that measures temperature of the spectroscopic unit. When the wavelength shift correction emission-line light is measured as the incident light with the spectrometer, this system and method determine wavelength shift correction time emission-line wavelength corresponding to wavelength shift correction emission-line light, based on electrical signals from photoelectric conversion elements receiving wavelength shift correction emission-line light, and the measured temperature. The system and method determine wavelength variation from the difference between determined wavelength shift correction time emission-line wavelength and known emission-line wavelength of the wavelength shift correction emission-line light.

A method for generating uniform light with a tailored spectrum using one or more light sources, an integrating space, and one or more selected phosphors to build stable absolute irradiance calibration light sources for fiber and cosine correctors is disclosed.

A system and method include a wavelength shift correction light source emitting wavelength shift correction emission-line light and a spectrometer including: a spectroscopic unit receiving with photoelectric conversion elements rays of dispersed spectral light obtained by dispersing incident light based on wavelength, and outputs electrical signals corresponding to light intensities of the rays of dispersed spectral light; and a unit that measures temperature of the spectroscopic unit. When the wavelength shift correction emission-line light is measured as the incident light with the spectrometer, this system and method determine wavelength shift correction time emission-line wavelength corresponding to wavelength shift correction emission-line light, based on electrical signals from photoelectric conversion elements receiving wavelength shift correction emission-line light, and the measured temperature. The system and method determine wavelength variation from the difference between determined wavelength shift correction time emission-line wavelength and known emission-line wavelength of the wavelength shift correction emission-line light.

A method for characterizing a digital color camera includes, for each of three primary colors used in a field sequential color virtual image, determining a conversion model for each color using RGB values and the color-measurement values. For each primary color, the method includes illuminating a display device using an input light beam of a primary color having spectral properties representative of a light beam in a virtual image in a wearable device. The method includes capturing, with the digital color camera, an image of the display device, and determining, from the image, RGB values for each primary color. The method includes capturing, with a color-measurement device, a color-measurement value associated with each corresponding primary color at the display device, thereby acquiring a color-measurement value in an absolute color space. A conversion model for each color is determined using RGB values and the color-measurement values.