A diamond identification apparatus relates to the field of examining natural and synthetic diamonds. The claimed apparatus for identifying a cut diamond comprises a measurement location with a measuring aperture at which the cut diamond to be examined is fixedly positioned; a movable optical system including a spectrometer, two sources of radiation at wavelengths of 250-280 nm and 350-380 nm, respectively, said two sources of radiation and the spectrometer being connected to the measurement location by optical fibres for inputting radiation into the cut diamond and by an optical fibre for outputting radiation from the cut diamond; and also a source of laser radiation at a wavelength of 532 nm and a microcontroller, wherein the cut diamond is positioned at the measurement location in such a way that the table of the diamond faces the measuring aperture of the measurement location, and the culet of the diamond is situated directly above the measuring aperture to which the optical fibres for inputting radiation and the optical fibre for outputting radiation are connected, and wherein the microcontroller is configured to control the alternate operation of the sources of radiation in a set time sequence, the movement of the optical system to allow the input of radiation into the cut diamond, and the processing of the spectrometer data.

There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

A quantum yield calculation method uses a quantum yield calculation program for a spectrophotofluorometer. When a quantum yield is calculated using a spectrophotofluorometer 1, a calibration processing unit executes the processing to calibrate a photon number A2 that is a photon number of the fluorescence in a blank measurement state based on a photon number A1 that is the photon number of an excitation light in the blank measurement state and a photon number B1 that is the photon number of an excitation light in the sample measurement state. A quantum yield calculation processing unit calculates a first quantum yield based on a background photon number A2 after a calibration in addition to the photon number A1 of the excitation light in the blank measurement state and the photon number B2 of the fluorescence in the sample measurement state.

There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.

A spectroscopic measurement apparatus includes a light source, an integrator, a spectroscopic detector, and an analysis unit. The integrator includes an internal space in which a measurement object is disposed, a light input portion for inputting light to the internal space, a light output portion for outputting light from the internal space, a sample attachment portion for attaching the measurement object, and a filter attachment portion for attaching a filter unit. The filter unit has a transmission spectrum in which an attenuation rate for excitation light is larger than an attenuation rate for up-conversion light, and attenuates the light output from the light output portion. The analysis unit analyzes luminous efficiency of the measurement object on the basis of the transmission spectrum data and the spectroscopic spectrum data acquired by the spectroscopic detector.

A spectral measurement apparatus for irradiating a sample as a measurement object with excitation light and detecting light to be measured includes a light source generating the excitation light; an integrator having an input opening portion through which the excitation light is input, and an output opening portion from which the light to be measured is output; a housing portion arranged in the integrator and housing the sample; an incidence optical system making the excitation light incident to the sample; a photodetector detecting the light to be measured output from the output opening portion; and an analysis device calculating a quantum yield of the sample, based on a detection value detected by the photodetector, and the excitation light is applied to the sample so as to include the sample.

An array of sensor pixels is formed on a substrate, and a signal processing unit is connected to the array of sensor pixels. The signal processing unit includes multiple spectral channels that are defined by a respective transmission curve of each optical filter of at least one associated sensor pixel. Each of the sensor pixels includes a stack of a respective photodetector and a respective optical filter. Each spectral channel receives an output signal from one or more sensor pixels including an optical filter having the same transmission curve. At least one spectral channel has a greater number of sensor pixels than another spectral channel among the multiple spectral channels. The different number of pixels for the spectral channels can be employed to compensate for variations of sensor efficiency as a function of wavelength. Adjustment to sensor gain can be minimized through use of different number of pixels for different spectral channels.

Systems and methods are provided for measuring spectral hemispherical reflectance. One embodiment is a system that includes a laser that emits a beam of light, and an optical chopper disposed between the laser and a sample. The chopper blocks the beam while the chopper is at a first angle of rotation, redirects the beam along a reference path while the chopper is at a second angle of rotation, and permits the beam to follow a sample path through the chopper and strike the sample while the chopper is at a third angle of rotation. The system also includes a hollow sphere that defines a slot through which the sample path and reference path enter the sphere. The hollow sphere includes a spectral hemispherical reflectance detector, a mount that receives the sample at the sphere, and an actuator that rotates the sphere about an axis that intersects the sample.

A fluorescence spectrophotometer includes: a light source; an excitation side spectroscope configured to separate light from the light source to generate excitation light; an integrating sphere having an inner surface configured to scatter the excitation light that has entered the integrating sphere; a sample holder, which is provided at a position on the integrating sphere that is not directly irradiated with the excitation light that has entered the integrating sphere and that is capable of being irradiated with the excitation light that has been scattered by the inner surface, and which is capable of holding a sample to be measured; a detector configured to detect fluorescent light emitted from the sample irradiated with the excitation light that has been scattered by the inner surface; and an imaging device configured to take the sample image of the sample that emits the fluorescent light.