A spectrometry apparatus (1) according to an embodiment includes a detection object lens that signal light from a sample S enters, a slit (41) through which the signal light passes, a wavelength dispersive element that disperses the signal light having passed the slit (41) in accordance with a wavelength, an optical detector (50) that detects the signal light that has been subjected to wavelength dispersion in the wavelength dispersive element, scanning means for scanning a detection region of the optical detector (50) in the sample, a processing unit (51) that generates a spectral image, based on a detection signal of the optical detector (50), and an illumination optical system (10) that illuminates the sample from a side of the detection object lens.

An automatic analysis apparatus comprises: a light source generating light having a center wavelength equal to or shorter than 340 nm; a fluorescent substance excited by the light source light, and generates light together with transmitted light from the light source, having a wavelength of 340 nm to 800 nm; a condenser lens; at least one slit; a reaction cell holding a reaction solution where a specimen and reagent are mixed, and that the light source light and the light from the fluorescent substance enter; and a detector that detects light transmitted through the reaction cell. The light source, fluorescent substance, condenser lens, and slit are provided along a straight light corresponding to the optical axis. The width of the slit's opening is equal to or narrower than the width of a ray forming an image of the light source at the position of the slit.

An optical instrument for spectroscopy applications includes a compact arrangement having a three-dimensional folded optical path. A plate configured as an optical reference plane is secured to a housing and is configured to secure optical components above or below the plate. A modular light source module may be secured within the housing without fasteners. A monochromator and spectrometer are secured below the plate. Mirrors disposed above the plate are configured to direct light from the monochromator passing through a first opening in the plate through a sample disposed above the plate, and to direct light from the sample through a second opening in the plate to the spectrometer. A controller is configured for communication with the monochromator and the spectrometer. The controller may control an entrance slit actuator for the spectrometer and positioning of an aperture upstream of the spectrometer to adjust resolution and throughput.

A slit slider assembly for providing a plurality of slits. The slit slider assembly includes: a holder including a first channel and a pair of set screws that each has a ball partially extruding into the first channel; and a slit carrier assembly configured to be slidably disposed in the first channel and carry a slit mask that includes a plurality of slits, the slit carrier assembly including a plurality of dimples for receiving a portion of the ball. When the balls of the pair of set screws engage two dimples of the plurality of the dimples, the holder is configured to pass light through one of the plurality of slits that corresponds to the two dimples.

A transmissive sampling module is provided, which is adapted to a spectrometer main body. The transmissive sampling module includes a light source assembly and a support base. The light source assembly is directly connected to the support base. The support base includes a tube body and at least one fixing member. The tube body surrounds an accommodating groove, and an extending direction of the tube body is not parallel to an optical path of the light source assembly, and the tube body includes a transparent portion, and the optical path of the light source assembly passes through the transparent portion and the accommodating groove. The at least one fixing member is disposed on the tube body and is adjustably protruded out of an inner surface of the tube body. A transmissive spectrometer is also provided.

An optical system includes a spectrograph having a concave diffraction grating and a detector. An aperture is selectively positioned by an associated actuator or positioning mechanism either into, or out of, an optical path of the input light beam downstream of a sample and prior to entering the spectrograph. A slit plate having a plurality of different size entrance slits is positioned downstream of the aperture and movable by an associated actuator or positioning mechanism to position one of the plurality of entrance slits in the optical path of the input light beam. A controller coupled to the detector and the actuators is configured to control the actuators to selectively position the aperture and the slit plate to provide a selectable resolution of the spectrograph. The aperture setting and slit plate setting may be determined from a lookup table in response to a request for finer or coarser spectral resolution.

An optical instrument for spectroscopy applications includes a compact arrangement having a three-dimensional folded optical path. A plate configured as an optical reference plane is secured to a housing and is configured to secure optical components above or below the plate. A modular light source module may be secured within the housing without fasteners. A monochromator and spectrometer are secured below the plate. Mirrors disposed above the plate are configured to direct light from the monochromator passing through a first opening in the plate through a sample disposed above the plate, and to direct light from the sample through a second opening in the plate to the spectrometer. A controller is configured for communication with the monochromator and the spectrometer. The controller may control an entrance slit actuator for the spectrometer and positioning of an aperture upstream of the spectrometer to adjust resolution and throughput.

An ICP emission spectrophotometer includes an inductively coupled plasma device, a spectroscope, and a computer. The spectroscope includes an incidence window, an incidence side slit, a diffraction grating, an emission window, an emission side slit, and a detector. Measurement conditions including diffraction condition and a measurement result are displayed on a display device. In a case where there are a plurality of diffraction conditions each including a combination of a diffraction grating and a diffraction order for measuring desired diffracted light, comparison information including at least an intensity and a resolution of emitted light in the diffraction condition is displayed on the display device. A measurer selects diffraction conditions in which resolution is higher from among the diffraction conditions, and selects a diffraction condition in which an intensity is obtained from among the selected diffraction conditions.

Aspects and embodiments are generally directed to modular imaging spectrometer assemblies and methods of operation thereof. In one example, a modular imaging spectrometer assembly includes foreoptics to receive electromagnetic radiation and produce a real exit pupil, the foreoptics having a first f-number, a first imaging spectrometer to receive and disperse the electromagnetic radiation into a first plurality of spectral bands at a first image plane, the first imaging spectrometer having a second f-number independent of the first f-number, a second imaging spectrometer separated from the first imaging spectrometer, the second imaging spectrometer to receive and disperse the electromagnetic radiation into a second plurality of spectral bands, the second imaging spectrometer having a third f-number independent of the first f-number, and at least one slit aperture positioned to receive the electromagnetic radiation from the real exit pupil and direct the electromagnetic radiation to the first and second imaging spectrometers.

Aspects and embodiments are generally directed to modular imaging spectrometer assemblies and methods of operation thereof. In one example, a modular imaging spectrometer assembly includes foreoptics to receive electromagnetic radiation and produce a real exit pupil, the foreoptics having a first f-number, a first imaging spectrometer to receive and disperse the electromagnetic radiation into a first plurality of spectral bands at a first image plane, the first imaging spectrometer having a second f-number independent of the first f-number, a second imaging spectrometer separated from the first imaging spectrometer, the second imaging spectrometer to receive and disperse the electromagnetic radiation into a second plurality of spectral bands, the second imaging spectrometer having a third f-number independent of the first f-number, and at least one slit aperture positioned to receive the electromagnetic radiation from the real exit pupil and direct the electromagnetic radiation to the first and second imaging spectrometers.