Disclosed is an optical device for deflecting a light beam, including: —a first flat reflective element arranged so as to reflect an incoming light beam into a reflected light beam, extending in a first plane, the incoming light beam and the reflected light beam defining an incidence plane; and —a second flat reflective element, arranged to reflect the reflected light beam into an outgoing light beam, extending in a second plane that is transverse to the plane of incidence. The first plane and the second plane are secant along a line of intersection and form between them a dihedral angle. The first reflective element and the second reflective element can be rotated together about an axis of rotation substantially coincident with the line of intersection.

Disclosed is a wavelength selection module for a metrology apparatus. The wavelength selection module comprises one or more filter elements being operable to receive an input radiation beam comprising multiple wavelengths to provide selective control of a wavelength characteristic of a corresponding output radiation beam. At least one of said one or more filter elements comprises at least two linear variable filters.

A filter device for an optical module for a lab-on-a-chip analysis device, in which the optical module has a light path, includes a support element, a filter support, and a drive device. The support element can be mounted in the optical module. The filter support is arranged so that it can move on the support element. The filter support also has a first filter region and a second filter region. The drive device is configured such that the filter support can move between a first position in which the first filter region is arranged in the light path, and a second position in which the second filter region is arranged in the light path.

A LIBS system to detect constituent elements of interest within a sample from plasma light resulting from irradiation of this sample is presented. The LIBS system has a hybrid configuration which provides both a low-resolution spectrum of the plasma light covering a broad spectral range, and a high-resolution spectrum of the same plasma light over a narrow spectral range centered on a spectral line or feature of a constituent element of interest of the sample. In some implementations, the LIBS system has a portable design and can perform onsite sample analyses.

The present invention discloses a wavelength-modulable spectrum generator as well as a system and method for measuring concentration of a gas component based thereon. The wavelength-modulable spectrum generator includes a filter plate, a to-be-measured gas box and a light intensity receiving plate. A plate surface of the filter plate is encircled with N filter holes, and a filter lens with a specific refractive index is correspondingly fixedly arranged in each filter hole. A light source mounting position is fixed to a side of an in-light surface of the filter plate. After any light source is mounted at the light source mounting position, lights of the light source irradiate the filter lens. A rotation and deflection driving mechanism is connected with an out-light surface of the filter plate and drives the filter plate to rotate or deflect along the axis according to a preset angle.

A system comprising a light source, and a retention device configured to receive and retain a sample for measurement. The system includes a detector. An optical path couples light between the light source, the sample when present, and the detector. An optical objective is configured to couple light from the light source to the sample when present, and couple reflected light to the detector. A controller is configured to automatically control focus and/or beam path of the light directed by the optical objective to the sample when present. The system includes a spatially variable filter (SVF) positioned in the optical path. The SVF is configured to have spectral properties that vary as a function of illuminated position on the SVF.

An optical device may include a narrowband optical filter to receive a beam of light at a selected angle of incidence, wherein the beam of light is caused to be received by the narrowband optical filter at the selected angle of incidence by a steering element included in the optical device, and output a filtered beam of light associated with the beam of light, wherein a wavelength of the filtered beam of light depends on the selected angle of incidence of the beam of light on the narrowband optical filter. The optical device may include a photodiode to receive at least a portion of the filtered beam of light after the filtered beam of light is outputted by the narrowband optical filter.

The invention discloses a hybrid and scanning/snapshot spectral imager operating in both staring-spectral scanning and video snapshot spectral imaging modes. Snapshot spectral imaging operation at a set of selectable critical spectral bands comprise the basis for a machine learning-based estimation and video-rate display of a full hyperspectral cube, without compromising spatial resolution. Operating in the staring-type scanning mode, the disclosed hybrid spectral imager acquires sets of narrow band images at a given tuning step and for a plurality of tuning steps until completing a hyperspectral cube sampling. Scanning operation may be used for optimally configuring snapshot operation, such that redundant information present in the collected spectra is discarded. The disclosed hybrid spectral imager includes embodiments susceptible for miniaturization and low power operation, allowing for their integration into mobile phone and computer platforms. The invention is intended to address applications comprising, at least in part, nondestructive testing, real-time spectral and chemical mapping, noninvasive diagnosis and spectral photography.

A LIBS system to detect constituent elements of interest within a sample from plasma light resulting from irradiation of this sample is presented. The LIBS system has a hybrid configuration which provides both a low-resolution spectrum of the plasma light covering a broad spectral range, and a high-resolution spectrum of the same plasma light over a narrow spectral range centered on a spectral line or feature of a constituent element of interest of the sample. In some implementations, the LIBS system has a portable design and can perform onsite sample analyses.

Systems and methods for forming a compact gas sensor include a multilayer etalon as a wavelength discriminating element. The position of the etalon may be adjusted to tune its transmission profile. And embodiment directed to carbon dioxide detection is described.