An imaging device includes a plurality of temperature detection element units and a plurality of infrared absorption layer units arranged along a first direction and a second direction, in which: each of the temperature detection element units includes a first temperature detection element 21 and a second temperature detection element 22 adjacent to each other along the first direction; each of the infrared absorption layer units includes a first infrared absorption layer 41 and a second infrared absorption layer 42 adjacent to each other along the second direction; the first infrared absorption layer 41 is arranged above a first A region 21.sub.1 and a second A region 22.sub.1 and is thermally connected to the first temperature detection element 21; and the second infrared absorption layer 42 is arranged above a first B region 21.sub.2 and a second B region 22.sub.2 and is thermally connected to the second temperature detection element 22.

A pyroelectric infrared sensor device comprising: a pyroelectric infrared sensor part (2); and a cover member (3). The pyroelectric infrared sensor part comprises: a pyroelectric element (21); a housing (24) that the pyroelectric element is placed inside of and comprises an opening at a position facing a light receiving surface of the pyroelectric element; and an infrared transmission filter (25) that is located to cover the opening of the housing. The cover member covers at least a top surface of the pyroelectric infrared sensor part. The infrared transmission filter transmits light equal to or greater than a wavelength of 1 μm. The cover member has a property that a transmittance of infrared light having a wavelength of from 3 μm to 5.5 μm is equal to or greater than 10% and has a uniform material quality in an area corresponding to the top surface of the pyroelectric infrared sensor part.

A thermal pattern sensor including a plurality of pixels arranged on a substrate. Each pixel has a pyroelectric capacitance formed by at least one pyroelectric material portion arranged between a lower electrode and an upper electrode. The sensor has an abrasion-resistance coating, located on the side opposite the substrate and including pillars embedded in an abrasion-resistance layer, the pillars having a thermal conductivity strictly higher than that of the abrasion-resistance layer. A high thickness of the anti-abrasion protection coating can be achieved with a high rate of thermal transfer through the latter.

A device for measuring surface temperature of a turbine blade based on a rotatable prism includes a probe, a prism rotating apparatus and an optical focusing apparatus. The prism rotating apparatus and the optical focusing apparatus are located inside the probe. The probe includes a probe outer casing, a probe inner casing, a water-cooled casing pipe, a sapphire window piece, a quartz prism, a light pipe, a collimating lens, a focusing lens and an infrared array detector. The prism rotating apparatus includes a rotary motor, a worm, a gear and a prism rotary table, the rotary motor rotates to drive the prism rotary table to rotate. The optical focusing apparatus includes a telescopic motor, a coupler, a lead screw and a drive rod, the telescopic motor rotates to drive the lead screw, so as to further drive the drive rod to move along the slot.

An integrated photonics chip for thermal imaging comprises a photonics substrate including a plurality of receiver elements. Each receiver element comprises a first grating coupler optically coupled to a first waveguide filter and configured to receive a first wavelength of light at a given angle, with the first waveguide filter configured to pass the first wavelength of light; and a second grating coupler optically coupled to a second waveguide filter and configured to receive a second wavelength of light at the given angle, with second waveguide filter configured to pass the second wavelength of light. Each receiver element receives the wavelengths of light from an object of interest that emits the light due to blackbody radiation, and receives the wavelengths of light at respectively different angles. Each grating coupler receives a unique wavelength of light with respect to the other wavelengths of light received by the other grating couplers.

An apparatus includes a horn having a horn body including at least one horn sidewall defining a first opening that tapers down to a second opening in a direction of elongation and a port that is tubular and dimensionally uniform transverse to the direction of elongation and extends in the direction of elongation from a first port end that is in communication with the second opening to a second port end that defines an external opening. A dielectric rod includes a rod length extending between a first rod end and a second rod end with the first rod end extending through the external opening of the second port end and into the port cavity such that the first rod end is in a spaced apart relationship from the port sidewall along the light path.

An electromagnetic wave detection apparatus causes electromagnetic waves incident on a reference surface to propagate in a particular direction using each of the pixels, a detector to detect electromagnetic waves incident on a detection surface, and a second propagation unit that includes a first surface opposing the reference surface, a second surface opposing the detection surface, and a third surface intersecting the first and second surface. The third surface causes electromagnetic waves propagating in a first direction to propagate in a second direction. The first surface causes electromagnetic waves propagating in a second direction to be incident on the reference surface and causes electromagnetic waves re-incident from the reference surface to propagate in a third direction. The third surface causes electromagnetic waves propagating in the third direction to propagate in a fourth direction. The second surface emits electromagnetic waves propagating in the fourth direction to the detection surface.

An infrared transmitting lens for mounting in an aperture of a housing containing an apparatus to be subjected to infrared inspection, comprising a grille and an infrared transmitting material. The grille comprises a network of bars with an array of apertures between the bars, the grille providing mechanical protection to the infrared transmitting lens. The infrared transmitting material is positioned, in a combination of: on one, or both sides of the grille, or within the apertures of the grille; and thus enables infrared inspection through the array of apertures of the grille and through the infrared transmitting material. A method of manufacturing an infrared transmitting lens for mounting in an aperture of a housing containing an apparatus to be subjected to infrared inspection.

An electromagnetic wave detection apparatus causes electromagnetic waves incident on the reference surface to propagate in a particular direction using each of the pixels, a first detector to detect electromagnetic waves incident on a first detection surface, and a second detector to detect electromagnetic waves incident on a second detection surface. A third surface separates electromagnetic waves propagating in a first direction into electromagnetic waves to be incident on the second detector and electromagnetic waves to propagate in a second direction. A first surface causes electromagnetic waves propagating in a second direction to be incident on the reference surface and causes electromagnetic waves re-incident from the reference surface to propagate in a third direction. The third surface causes electromagnetic waves propagating in the third direction to propagate in a fourth direction. A second surface emits electromagnetic waves propagating in the fourth direction to the first detection surface.

Systems, methods, and apparatuses for providing on-board electromagnetic radiation sensing using beam splitting in a radiation sensing apparatus. The radiation sensing apparatuses can include a micro-mirror chip including a plurality of light reflecting surfaces. The apparatuses can also include an image sensor including an imaging surface. The apparatuses can also include a beamsplitter unit located between the micro-mirror chip and the image sensor. The beamsplitter unit can include a beamsplitter that includes a partially-reflective surface that is oblique to the imaging surface and the micro-mirror chip. The apparatuses can also include an enclosure configured to enclose at least the beamsplitter and a light source. With the apparatuses, the light source can be attached to a printed circuit board (PCB). Also, the enclosure can include an inner surface that has an angled reflective surface that is configured to reflect light from the light source in a direction towards the beamsplitter.