Techniques for preventing contamination of an electronic component via gas flow are described. According to some aspects, an electronic component module is configured to provide gas flow past and away from an electronic component such that thermal and material exchange is limited between the electronic component module and a coupled system. In some embodiments, the coupled system may be a portion of an additive fabrication device. As a result, a reduced number of contaminants may adhere to the electronic component, extending its lifespan and reducing maintenance.

Provided is a flocculation state monitoring sensor with which blockage of an ejecting part which ejects a gas towards a light emitting part and a light receiving part can be prevented, and which performs stable monitoring. A flocculation state monitoring sensor comprising: a light emitting part which irradiates laser light towards a measuring region which measures a flocculation state; and a light receiving part which receives light scattered along a direction which intersects with a direction along an optical axis of said light emitting part, wherein the light emitting part and the light receiving part are cleaned by air being ejected from nozzles theretowards. A small amount of air is provided to the nozzles between cleaning periods to purge floc, etc.

Systems, devices, and methods for an optical head enclosure of a sensor; one or more imbedded nozzles disposed on a surface of the optical head enclosure; an inlet of the one or more imbedded nozzles, where the inlet comprises a nozzle channel for receiving a cleaning solution; a flow channel internal to the optical head enclosure, where the nozzle channel is connected to the flow channel, and where the flow channel comprises an outlet for dispersing the cleaning solution received from the nozzle channel; wherein the inlet comprises a break to stop a nozzle of a cleaning device from reaching a mirror of the sensor; where the outlet directs the cleaning solution from the inlet onto the mirror.

A sensor assembly includes a passageway for a process fluid, an optical window, an optical sensor, and a nozzle. The optical sensor configured to detect an optical property of the process fluid. The optical window includes an inner surface. The nozzle configured discharge an atomized fluid in a discharge direction that intersects the inner surface of the optical window. A sensor system includes a sensor assembly and conduits for supplying a gas and a liquid to a nozzle of the sensor assembly. A method of cleaning an optical window in a sensor assembly includes forming an atomized fluid and discharging the atomized fluid in a discharge direction that intersects the optical window.

ESP particle collector (1) for collecting particles in a particle containing gas stream, comprising an inlet section (4), a collector section (6), and an electrode arrangement (8), the inlet section comprising a flow tube (10) defining a gas flow channel (12) therein bounded by a guide wall (24) extending between an entry end (14) and a collector end (16) that serves as an inlet to the collector section (6), the entry end comprising an inlet (28) for the particle gas stream and a sheath flow inlet portion (26) for generating a sheath flow around the particle gas stream, the collector section comprising a housing (18) coupled to the flow tube, and a collector plate (20) mounted therein having a particle collection surface (23). The ESP particle collector comprises an optical measuring instrument (9) configured to transmit light through the collector plate along a centre axis (A) orthogonal or substantially orthogonal to the particle collection surface for optical analysis of the collector plate particle collection surface to measure particles collected thereon, and wherein the flow tube has a bent portion (15) such that the entry end (14) is positioned out of the centre axis A to allow the light to be transmitted through the collector plate in the direction of the centre axis and to be picked up without interfering with the gas flow or the gas inlet.

A tunable diode laser absorption spectroscopy (TDLAS) optical head includes a housing configured for attachment to a sight tube attached to a wall of a process chamber. The TDLAS optical head further includes optics within the housing for transmitting, receiving, or transmitting and receiving a laser beam within a process chamber through the sight tube. The TDLAS optical head further includes a photo sensor in the housing positioned to receive light emitted by combustion within the process chamber to which the housing is attached.

A particulate matter-sensing sensor assembly may include a housing in which an air flow passage through which air flowed thereinto from the outside thereof flows is formed, a fan motor internally disposed within the housing for flowing air into the air flow passage from the outside, a light source emitting light to allow light to intersect with air flowing into the air flow passage, and a light receiving sensor configured to receive light scattered by dust contained in air passing through the air flow passage, wherein the air flow passage is configured such that a region where air flows thereinto from the outside thereof has a cross-sectional area greater than that of a region where light emitted from the light source intersects with flowing air.

An enclosure surrounding the optical component can be connected with a vapor source. The vapor source can provide a vapor to the enclosure with a vapor level from 500 ppm to 15000 ppm. The concentration of vapor in the enclosure can increase the lifespan of the optical component in the enclosure.

An extractive gas analyser system includes a supply channel, a measuring channel connected thereto between first and second ends, an analysing unit comprising an optical arrangement for analysing gaseous material in the measuring channel, which optical arrangement comprises first and second optical units arranged respectively at first and second ends of the measuring channel, a barrier arrangement near each end of the measuring channel and comprising a barrier gas inlet and outlet arranged in opposing manner across said measuring channel, each in connection with a gas source and provided with a nozzle opening directed toward the opposing outlet, said barrier arrangement arranged to provide pressurized gas creating a barrier gas curtain between the barrier gas inlet and outlet to force least a part of the gaseous material from the supply channel into the measuring channel and out through the outlet and thereby separate the gaseous material from said optical units.

An inspection device for inspecting a cable end of a cable, with and without a connected crimp contact, includes a mirror arrangement having a central axis along which the cable end can be arranged for inspection. The mirror arrangement includes a plurality of mirrors arranged at a predetermined angle to one another and at a predetermined angle to the central axis, each mirror viewing the cable end from a different angle. The inspection device includes a camera for generating images of the cable end from the different viewing angles of the mirrors. A transparent disk is arranged between the camera and the mirror arrangement to prevent dirt and/or dust from moving from the mirror arrangement to the camera. A compressed air cleaning device cleans the disk and/or the mirrors with compressed air ejected along the disk and/or along at least a part of the mirrors.