A method of automatically setting optical parameters, using Automatic Optical Inspection (AOI) System, the method includes: obtaining a recommended object image when the AOI system under a first recommended optical parameter set; performing computation on a standard image of a and a recommended image of the to-be-measured object according to an optimized error function to obtain a recommended error value between the standard image and the recommended image; determining whether the recommended error value converges, when determining that the recommended error value does not converge, performing computation according to the recommended error value and first recommended optical parameter set to obtain a second recommended optical parameter set; when the recommended error value converges, deciding the first recommended optical parameter set as the best optical parameter set of the AOI system.

A method of automatically setting optical parameters, using Automatic Optical Inspection (AOI) System, the method includes: obtaining a recommended object image when the AOI system under a first recommended optical parameter set; performing computation on a standard image of a and a recommended image of the to-be-measured object according to an optimized error function to obtain a recommended error value between the standard image and the recommended image; determining whether the recommended error value converges, when determining that the recommended error value does not converge, performing computation according to the recommended error value and first recommended optical parameter set to obtain a second recommended optical parameter set; when the recommended error value converges, deciding the first recommended optical parameter set as the best optical parameter set of the AOI system.

A die inspection station for generating an inspection report. The station includes a work surface to receive an entire cutting die thereon for inspection; a housing supporting the work surface; an image capture system supported by the housing above the work surface with an optical axis of the image capture system generally perpendicular to the work surface, the image capture system arranged to capture at least one image of the entire cutting edge of the cutting die; and an illumination source supported by the housing and arranged to illuminate the entire cutting edge at an oblique angle while the image capture system captures the at least one image.

A position specifying section obtains an observation distance by specifying the position of an irradiated region from a picked-up image that is obtained from the image pickup of a subject on which the irradiated region is formed by auxiliary measurement light. An image processing section sets the amount of offset, which corresponds to a height of the irradiated region of a convex portion of the subject, for the observation distance, and generates an offset measurement marker on the basis of the offset distance that obtained by adding the amount of offset to the observation distance. A specific image in which the offset measurement marker is superimposed on the picked-up image is displayed on a display unit.

A non-destructive testing calibration system includes a first multi-axis robotic device having a first end effector, a second multi-axis robotic device having a second end effector. A calibration assembly includes an emitter arranged on the first end effector and a receiver arranged on the second end effector, where the emitter and the receiver exchange a calibration signal between the first robotic device and the second robotic device. A data processor and a memory storing instructions, which when executed causes the data processor to perform operations comprising: performing a calibration scan, where the calibration scan includes a plurality of measurement points along a scan path of the emitter and the receiver; measuring the deviation between the emitter and the receiver at each measurement point along the scan path; and determining a corrected scan path based on the deviation between the emitter and receiver at each measurement point during the calibration scan.

A non-destructive testing calibration system includes a first multi-axis robotic device having a first end effector, a second multi-axis robotic device having a second end effector. A calibration assembly includes an emitter arranged on the first end effector and a receiver arranged on the second end effector, where the emitter and the receiver exchange a calibration signal between the first robotic device and the second robotic device. A data processor and a memory storing instructions, which when executed causes the data processor to perform operations comprising: performing a calibration scan, where the calibration scan includes a plurality of measurement points along a scan path of the emitter and the receiver; measuring the deviation between the emitter and the receiver at each measurement point along the scan path; and determining a corrected scan path based on the deviation between the emitter and receiver at each measurement point during the calibration scan.

Systems and methods for providing optical distortion information of a vehicle glazing are disclosed. In one example, a method comprises obtaining and analyzing, via at least one processor of a computing device, optical characteristics of the vehicle glazing; generating digitized optical distortion information for the vehicle glazing based on analysis results; generating identification information for the vehicle glazing; and associating the digitized optical distortion information with the identification information.

Systems and methods for providing optical distortion information of a vehicle glazing are disclosed. In one example, a method comprises obtaining and analyzing, via at least one processor of a computing device, optical characteristics of the vehicle glazing; generating digitized optical distortion information for the vehicle glazing based on analysis results; generating identification information for the vehicle glazing; and associating the digitized optical distortion information with the identification information.

A pattering device inspection apparatus, system and method are described. According to one aspect, an inspection method is disclosed, the method including receiving, at a multi-element detector within an inspection system, radiation scattered at a surface of an object. The method further includes measuring, with processing circuitry, an output of each element of the multi-element detector, the output corresponding to the received scattered radiation. Moreover, the method includes calibrating, with the processing circuitry, the multi-element detector by identifying an active pixel area comprising one or more elements of the multi-element detector with a measured output being above a predetermined threshold. The method also includes identifying an inactive pixel area comprising a remainder of elements of the multi-element detector. Additionally, the method includes setting the active pixel area as a default alignment setting between the multi-element detector and a light source causing the scattered radiation.

The present disclosure provides systems and methods for calibration. In one example, the method may comprise optical image analysis for calibration. The method may comprise generating an optical projection of one or more calibration features onto a material surface provided in a material fabrication or processing machine, and determining one or more spatial characteristics of the calibration features. The one or more spatial characteristics may comprise a distance, a position, an orientation, an alignment, a size, or a shape of one or more calibration features. The one or more spatial characteristics may be used to adjust at least one of (i) a position or an orientation of an imaging unit relative to the material surface and the material fabrication or processing machine, (ii) an angle or an inclination of the material surface relative to the imaging unit, and (iii) one or more imaging parameters of the imaging unit.