A sample holder unit 400 capable of quickly and easily soaking a sample in a crystalline sponge, and of quickly and accurately performing single-crystal X-ray structure analysis, is provided. The sample holder unit comprises a sample holder 214 and an applicator 300. The applicator 300 comprises an opening 302 and a storing space in which the sample holder is stored; a seal part 304 provided on a contact surface with the sample holder stored in the storing space; and a pull-out prevention part 305 that prevents the sample holder from being pulled out from the opening 302, the pull-out prevention part engaged with the sample holder stored in the storing space.

A sample holder unit 400 capable of quickly and easily soaking a sample in a crystalline sponge, and of quickly and accurately performing single-crystal X-ray structure analysis, is provided. The sample holder unit comprises a sample holder 214 and an applicator 300. The applicator 300 comprises an opening 302 and a storing space in which the sample holder is stored; a seal part 304 provided on a contact surface with the sample holder stored in the storing space; and a pull-out prevention part 305 that prevents the sample holder from being pulled out from the opening 302, the pull-out prevention part engaged with the sample holder stored in the storing space.

A transmission electron microscope sample holder capable of applying a magnetic field is provided. The transmission electron microscope sample holder includes a holder body and a holder head. The holder head is arranged at an end of the holder body and provided with a magnetic field generation device. The magnetic field generation device is provided with magnetic field generation end surface. The thickness of the magnetic field generation end surface is in a range of 100 nanometers to 280 micrometers. And the thickness is of a size that is parallel to a direction of an electron beam in a transmission electron microscope.

The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.

The invention described herein is a spectrometer having components allowing remote orientation of crystal analyzer and detector.

A sample cell including a sample space, restricted on its first side by a first inner side of a first membrane and on its second side by a second inner side of a second membrane. A spacer is arranged between the first and the second inner sides to establish a distance between the membranes. A first retaining element is arranged on a first outer side, facing away from the sample space, of the first membrane and a second retaining element is arranged on a second outer side, which faces away from the sample space, of the second membrane, the first and second retaining elements together form a retaining structure. The first and second retaining elements each have a plurality of apertures aligned with each other in a direction transverse to the flat sides, to form a plurality of examination windows, in which the outer sides of the membranes are exposed.

A sample cell including a sample space, restricted on its first side by a first inner side of a first membrane and on its second side by a second inner side of a second membrane. A spacer is arranged between the first and the second inner sides to establish a distance between the membranes. A first retaining element is arranged on a first outer side, facing away from the sample space, of the first membrane and a second retaining element is arranged on a second outer side, which faces away from the sample space, of the second membrane, the first and second retaining elements together form a retaining structure. The first and second retaining elements each have a plurality of apertures aligned with each other in a direction transverse to the flat sides, to form a plurality of examination windows, in which the outer sides of the membranes are exposed.

A single-piece hybrid droplet generator and nozzle component for serial crystallography. The single-piece hybrid droplet generator component including an internally-formed droplet-generation channel, an internally-formed sample channel, a nozzle, and a pair of electrode chambers. The droplet-generation channel extends from a first fluid inlet opening to the nozzle. The sample channel extends from a second fluid inlet opening to the droplet-generation channel and joins the droplet-generation channel at a junction. The nozzle is configured to eject a stream of segmented aqueous droplets in a carrier fluid from the droplet-generation channel through a nozzle opening of the single-piece component. The pair of electrode chambers are positioned adjacent to the droplet-generation channel near the junction between the droplet-generation channel and the sample channel. The timing of sample droplets in the stream of fluid ejected through the nozzle is controlled by applying a triggering signal to electrodes positioned in the electrode chambers of the single-piece component.

A single-piece hybrid droplet generator and nozzle component for serial crystallography. The single-piece hybrid droplet generator component including an internally-formed droplet-generation channel, an internally-formed sample channel, a nozzle, and a pair of electrode chambers. The droplet-generation channel extends from a first fluid inlet opening to the nozzle. The sample channel extends from a second fluid inlet opening to the droplet-generation channel and joins the droplet-generation channel at a junction. The nozzle is configured to eject a stream of segmented aqueous droplets in a carrier fluid from the droplet-generation channel through a nozzle opening of the single-piece component. The pair of electrode chambers are positioned adjacent to the droplet-generation channel near the junction between the droplet-generation channel and the sample channel. The timing of sample droplets in the stream of fluid ejected through the nozzle is controlled by applying a triggering signal to electrodes positioned in the electrode chambers of the single-piece component.

Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.