Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.

Crystallographic information of crystalline sample can be determined from one or more three-dimensional diffraction pattern datasets generated based on diffraction patterns collected from multiple crystals. The crystals for diffraction pattern acquisition may be selected based on a sample image. At a location of each selected crystal, multiple diffraction patterns of the crystal are acquired at different angles of incidence by tilting the electron beam, wherein the sample is not rotated while the electron beam is directed at the selected crystal.

Crystallographic information of crystalline sample can be determined from one or more three-dimensional diffraction pattern datasets generated based on diffraction patterns collected from multiple crystals. The crystals for diffraction pattern acquisition may be selected based on a sample image. At a location of each selected crystal, multiple diffraction patterns of the crystal are acquired at different angles of incidence by tilting the electron beam, wherein the sample is not rotated while the electron beam is directed at the selected crystal.

A closure device for the gas-tight closing of the input opening of a sample chamber of an x-ray analysis apparatus includes a slider having a closure plate and a carriage that is configured to be displaced in a lateral movement over the input opening on a linear guide arranged on a baseplate connected fixedly to the sample chamber. The closure plate is connected in an articulated manner to the carriage via deflecting elements that, upon butting against end stops connected rigidly to the baseplate, deflect the lateral movement of the carriage into a movement perpendicular thereto to press the closure plate over the input opening. A drive motor connected to the carriage via a drive means displaces the slider to provide the lateral movement on the linear guide.

Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle α in a pole figure with the small number of times of φ scan, thereby enabling the efficient measurement. The processing method for determining conditions of pole figure measurement by X-ray diffraction, includes the steps of: receiving input of a diffraction angle 2θ; and determining an angle ω formed by an incident X-ray and an x-axis, and a tilt angle χ of a sample in each φ scan for a rotation angle φ within a sample plane so as to make a range of an angle α continuous from α=90° to α=0° without overlapping, the angle α being formed by the sample plane and a scattering vector, the range of the angle α are detectable at a time on a two-dimensional detection plane in the pole figure measurement at the input angle 2θ, in which determining the angle ω and the angle χ is repeated.

Apparatus and methods are described for the automated transfer and storage of transmission electron microscope (TEM) and scanning/transmission electron microscope (STEM) lamella samples throughout a semiconductor manufacturing facility using existing automation infrastructure such as a Front Opening Unified Pod (FOUP). Also provided are wafer facsimiles corresponding to outer dimensions of semiconductor, data storage or solar cell wafers, wherein the facsimiles adapted to store, carry and/or provide a testing platform for testing of samples taken from semiconductor, data storage or solar cell wafers.

A sample analysis cup assembly, system and method for purging including a cell body, including a top end; a bottom end; a cell body wall extending axially from the top end to the bottom end; a transverse wall adjacent the top end, including a plurality of apertures extending therethrough; and a raised portion on the transverse wall including a central aperture extending therethrough; a rotatable cap, including a top surface; a bottom surface; and a series of apertures extending from the top surface through the bottom surface, the rotatable cap being structured to engage with the top end of the cell body; and a ring member structured to couple with the bottom end of the cell body are provided.

A sample holding device for studying light-driven reactions and a sample analysis method using the same are disclosed. The sample holding device comprises a main body, a supporting structure and a light source assembly. The main body has a channel which has a first end and a second end opposite to the first end, and a focusing lens which is located on the second end. The supporting structure is located on one end of the main body for sample supporting. The light source assembly is detachably disposed on the other end opposite to the end which is disposed with the supporting structure. The light source assembly emits a light beam into the first end of the channel. The light beam then irradiates the sample which locates on the supporting structure after passing through the focusing lens.

The present invention provides a method of generating a fingerprint for a gemstone (5), for example a diamond, using x-ray imaging. The fingerprint comprises a three-dimensional map of a crystal or crystals present within the gemstone (5) including internal imperfections of the crystals and may also comprise further information about the gemstone (5). The method comprising the steps of: mounting the gemstone (5) in a sample holder (4) of an imaging apparatus, the imaging apparatus comprising a detector (6), a sample holder (4) mounted on a sample stage (3), an x-ray source (1), the sample holder (4) and the x-ray source (1) aligned along an optical axis, wherein the sample holder (4) is movable relative to the at least one x-ray source (1) and the detector (6); exposing the gemstone (5) to x-ray radiation from the x-ray source (1), whilst moving the sample holder (4) according to a search strategy that is predetermined for the gemstone (5) based on known physical characteristics of the gemstone (5); using the detector (6) to locate diffraction and/or extinction spots generated by the lattice of the crystals; utilising the located diffraction and/or extinction spots to calculate information about the position, orientation, and phase of the crystals; generating a suitable x-ray diffraction scanning strategy from the calculated information, the strategy including moving the sample holder (4) relative to the x-ray source (1) and the detector (6) and exposing the gemstone (5) to appropriate x-ray radiation as the sample holder (4) is moved, wherein the strategy is generated to locate and classify internal imperfections in the at least one crystal; scanning the gemstone according to the scanning strategy and recording the diffraction and/or extinction images using the detector (6); and generating a fingerprint from the recorded diffraction and/or extinction images.

Described herein is a tool holder for small objects. A tool and tool holder as described herein improve the flexibility and ability to manipulate small objects (such as for example crystal used in X-ray crystallography) in a confined space.