Patent classifications
G01N23/2076
Advanced X-Ray Emission Spectrometers
Spectroscopy systems require a crystal having specific properties for analyzing a spectrum of a sample, which is typically performed for measuring the presence of one element at a time. A two-dimensional (2D) crystal mount for performing simultaneous spectroscopy measurements includes a crystal holder having multiple rows of crystal mounts. Each crystal mount is positioned and orientated to physically support a crystal at a fixed position and fixed orientation relative to an optical axis. A sample provides radiation to analyzer crystals disposed in the crystal mounts, and a detector may detect radiation reflected from the analyzer crystals, for performing multiple simultaneous spectroscopy measurements.
MULTI-PHYSICAL FIELD MEASUREMENT DEVICE FOR METAL SOLIDIFICATION PROCESS AND HOUSING THEREOF, AND MEASUREMENT METHOD
A multi-physical field measurement device for a metal solidification process and a housing and a measurement method thereof are provided. The device includes: a sealed housing provided with a light-through hole; a heater provided inside the housing and located behind the light-through hole along an X-ray; a diffraction detector used for receiving the X-ray which penetrates through a sample sheet and is scattered; a CMOS camera located behind the heater along the X-ray (11) and used for receiving a visible light signal which penetrates through the sample sheet; a silicon drift X-ray detector located at one side of the X-ray and used for receiving a fluorescent signal sent by interaction between the X-ray and the sample piece sheet; and an infrared thermal imager located at the other side of the X-ray and used for receiving an infrared signal sent by the sample sheet.
Apparatuses and methods for combined simultaneous analyses of materials
An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.
Flex plate with removable inserts and cover
Technologies are described for methods and systems effective for flex plates. The flex plates may comprise a base plate. The base plate may include walls that define an insert location opening in the base plate. The insert location opening in the base plate may be in communication with a securement area. The flex plates may comprise an insert. The insert may include a reservoir region and a crystallization region separated by a wall including channels. The reservoir region and the crystallization region may include a backing. The insert may further include securement tabs. The securement tabs may be configured to secure the insert to the base plate at the securement area.
X-ray spectroscopic analysis apparatus and elemental analysis method
A spectroscopic element and a detector are disposed along a circumference of one Rowland circle. The spectroscopic element has a spectral surface whose length, measured along the Rowland circle, is shorter than a length in the Rowland circle plane, of an irradiation surface irradiated with excitation beams emitted to a sample holder. The spectroscopic element and the sample holder are disposed to separate a group of characteristic X-rays within a common spectral range of the spectroscopic element.
Integrated, portable sample analysis system and method
A flip top spectrometer sample cell including first and second members each includes a window aligned with each other when the first and second members are coupled together defining a predefined spacing between the windows when the first and second members are coupled together, the first and second members decoupled for manually placing a fluid sample on a the window. The flip top spectrometer sample cell is configured to be withdrawn out of a housing for cleaning of the windows.
X-ray spectrometer and methods for use
A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.
X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER
An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.
DIFFRACTIVE ANALYZER OF PATIENT TISSUE
An x-ray diffractometer may perform 3D-analysis of collagen tissue of a patient (a human or another animal). The diffractometer includes an oblong housing that may be hinged and that contains an x-ray projector on one side of a recess and a receiver on an opposite side of the recess. The recess accommodates analyzed tissue such as the external ear and skin of a patient. The x-ray projector directs an x-ray micro-beam at the patient's tissue, and the receiver contains a movable two-dimensional x-ray detector that detects a transmitted x-ray micro-beam passed through the analyzed tissue and detects x-rays scattered or diffracted by the analyzed tissue.
X-ray analyzer
An X-ray analyzer includes an X-ray source, a straight tube type multi-capillary, a flat plate spectroscopic crystal, a parallel/point focus type multi-capillary X-ray lens, and a Fresnel zone plate. A qualitative analysis is performed over an area on the sample, the flat plate spectroscopic crystal and the Fresnel zone plate are removed from the X-ray optical path, and X-rays are collected by the multi-capillary lens and the sample is irradiated. When analyzing the chemical morphology of an element, the multi-capillary lens retracts from the optical path, the source rotates, and the flat plate spectroscopic crystal and the Fresnel zone plate are inserted on the optical path. A narrow sample area is irradiated by the Fresnel zone plate with X-rays having energy extracted from the flat plate spectroscopic crystal. This makes it possible to carry out accurate qualitative analysis on the sample and perform detailed analysis of more minute parts.