Methods of determining the presence or absence of fluorocarbon(s) on a substrate using X-ray Photoelectron Spectroscopy (XPS). A method may be used to determine the presence or absence of per- or polyfluoroalkyl substances PFASs. A method may use a porous polymer substrate. A method may use solid-phase extraction (SPE). A method may be used to determine the presence or absence of fluorocarbons in an aqueous sample. An aqueous sample may be a groundwater sample, wastewater sample, potable water sample, drinking water sample, or surface water sample. The limit of detection of fluorine in a method may be 0.05% F or less (for XPS analysis) and/or 20 ng or less on a substrate.

Methods of determining the presence or absence of fluorocarbon(s) on a substrate using X-ray Photoelectron Spectroscopy (XPS). A method may be used to determine the presence or absence of per- or polyfluoroalkyl substances PFASs. A method may use a porous polymer substrate. A method may use solid-phase extraction (SPE). A method may be used to determine the presence or absence of fluorocarbons in an aqueous sample. An aqueous sample may be a groundwater sample, wastewater sample, potable water sample, drinking water sample, or surface water sample. The limit of detection of fluorine in a method may be 0.05% F or less (for XPS analysis) and/or 20 ng or less on a substrate.

An insulating device includes a first electrode, a second electrode, and an insulating film. The insulating film is located between the first electrode and the second electrode. The insulating film includes a positive charged region. The positive charged region is located at a portion in a direction from the first electrode toward the second electrode.

An insulating device includes a first electrode, a second electrode, and an insulating film. The insulating film is located between the first electrode and the second electrode. The insulating film includes a positive charged region. The positive charged region is located at a portion in a direction from the first electrode toward the second electrode.

A method is provided. The method includes the following steps: introducing a first physical vapor deposition (PVD) target and a second PVD target in a PVD system, the first PVD target containing a boron-containing cobalt iron alloy (FeCoB) with an initial boron concentration, and the second PVD target containing boron; determining parameters of the PVD system based on a target boron concentration larger than the initial boron concentration; and depositing a FeCoB film on a substrate according to the parameters of the PVD system.

A method is provided. The method includes the following steps: introducing a first physical vapor deposition (PVD) target and a second PVD target in a PVD system, the first PVD target containing a boron-containing cobalt iron alloy (FeCoB) with an initial boron concentration, and the second PVD target containing boron; determining parameters of the PVD system based on a target boron concentration larger than the initial boron concentration; and depositing a FeCoB film on a substrate according to the parameters of the PVD system.

A method is provided for manufacturing a particle analyzer in which the deterioration of the measurement function is suppressed during the measurement of the particles to be measured. The particle analyzer includes a first storage chamber in which a first liquid is stored, a second storage chamber in which a second liquid containing particles to be analyzed is stored, and a flow path connecting the first storage chamber in fluid communication with the second storage chamber. The method includes a surface modification step of irradiating a surface constituting the flow path with an ultraviolet ray to modify the surface of the flow path.

A method is provided for manufacturing a particle analyzer in which the deterioration of the measurement function is suppressed during the measurement of the particles to be measured. The particle analyzer includes a first storage chamber in which a first liquid is stored, a second storage chamber in which a second liquid containing particles to be analyzed is stored, and a flow path connecting the first storage chamber in fluid communication with the second storage chamber. The method includes a surface modification step of irradiating a surface constituting the flow path with an ultraviolet ray to modify the surface of the flow path.

An apparatus and method for characterisation of a sample via spectroscopy and/or imaging. The apparatus comprises a first detector for imaging or spectroscopy, a second detector for imaging or spectroscopy, and a toroidal capacitor type electrostatic energy analyser. The toroidal capacitor type electrostatic energy analyser comprises a first and a second entrance aperture arranged such that charged particles emitted from a sample and passing through the first entrance aperture traverse a first trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the first detector, and charged particles emitted from a sample and passing through the second entrance aperture traverse a second trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the second detector. A deflection assembly arranged between the sample and the analyser may be used to direct charged particles emitted from the sample towards the first and/or second entrance aperture of the analyser.

An apparatus and method for characterisation of a sample via spectroscopy and/or imaging. The apparatus comprises a first detector for imaging or spectroscopy, a second detector for imaging or spectroscopy, and a toroidal capacitor type electrostatic energy analyser. The toroidal capacitor type electrostatic energy analyser comprises a first and a second entrance aperture arranged such that charged particles emitted from a sample and passing through the first entrance aperture traverse a first trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the first detector, and charged particles emitted from a sample and passing through the second entrance aperture traverse a second trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the second detector. A deflection assembly arranged between the sample and the analyser may be used to direct charged particles emitted from the sample towards the first and/or second entrance aperture of the analyser.