Patent classifications
G01N29/2468
System and method for traversing an obstacle with an inspection robot
System and methods for traversing an obstacle with an inspection robot are disclosed. An example system may include an inspection robot including an obstacle sensor to interrogate an inspection surface. The example may further include an obstacle sensory data circuit to interpret obstacle sensory data provided by the obstacle sensor, an obstacle processing circuit to determine refined obstacle data, and an obstacle notification circuit to generate and provide obstacle notification data to a user interface device. The example system may further include a user interface circuit to interpret a user request value from the user interface device, and to determine an obstacle response command value in response to the user request value; and an obstacle configuration circuit to provide the obstacle response command value to the inspection robot during the interrogating of the inspection surface.
System, method, and apparatus for rapid development of an inspection scheme for an inspection robot
- Edward A. Bryner ,
- Kevin Y. Low ,
- Joshua D. Moore ,
- Dillon R. Jourde ,
- Francesco H. Trogu ,
- Jeffrey J. Mrkonich ,
- William J. Pridgen ,
- Domenic P. Rodriguez ,
- Alexander C. Watt ,
- Michael Stephen Auda ,
- Logan A. MacKenzie ,
- Ian Miller ,
- Samuel Theodore Westenberg ,
- Katherine Virginia Denner ,
- Benjamin A. Guise ,
- Yizhu Gu ,
- Todd Joslin ,
- Mark J. Loosararian ,
- Mark Cho ,
- Edwin H. Cho
Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.
System, apparatus and method for providing an inspection map
Systems, apparatus and methods for providing an inspection map are disclosed. An apparatus for performing an inspection may include an inspection data circuit to interpret inspection data, a robot positioning circuit to interpret position data, and a processed data circuit to link the inspection data with the position data to determine position-based inspection data. The apparatus may further include a user interaction circuit to interpret an inspection visualization request for an inspection map and an inspection visualization circuit to determine the inspection map based on the position-based inspection data, and a provisioning circuit structured to provide the inspection map to a user device.
Inspection robot having replaceable sensor sled portions
Systems and methods for an inspection robot having replaceable sensor sled portions are disclosed. An example system may include: an inspection robot including a plurality of payloads; a plurality of arms, each of the plurality of arms pivotally mounted to one of the plurality of payloads; and a plurality of sleds, each sled mounted to one of the plurality of arms. At least one of the plurality of sleds includes an upper portion coupled to a replaceable lower portion, where the replaceable lower portion includes a portion of a delay line for a sensor of the inspection robot.
Ultrasonic transducer with via formed in piezoelectric element and method of fabricating an ultrasonic transducer including milling a piezoelectric substrate
An ultrasonic transducer that includes a delay line, an active piezoelectric element, and interposing metal conductive layer between the delay line and active piezoelectric element. The delay line and active piezoelectric element are joined so that ultrasonic waves may be coupled from the active piezoelectric element into the delay line or from the delay line into the active piezoelectric element. A via is formed, using a milling operation, in the active piezoelectric element to expose the edge of the interposing metal conductive layer between the delay line and active piezoelectric element. A conductive layer makes electrical contact between the interposing metal conductive layer and the surface of the active piezoelectric element to allow an electrical connection to be made from the surface of the active piezoelectric element to the interposing metal conductive layer.
Method and apparatus for providing real time air measurement applications in wet concrete using dual frequency techniques
Apparatus is provided having an acoustic-based air probe with an acoustic source configured to provide an acoustic signal into a mixture of concrete; and an acoustic receiver configured to be substantially co-planar with the acoustic source, to respond to the acoustic signal, and to provide signaling containing information about the acoustic signal injected into the mixture of concrete.
ULTRASONIC PROBE HAVING FLEXIBLE STABILIZING ELEMENT FOR PROBE ALIGNMENT
A stabilized ultrasonic probe includes a housing, at least one ultrasonic transducer, a flexible delay line, and a stabilizing element. The housing can be tubular and extend from a proximal to a distal end and define a cavity therein. The transducer can be positioned within the housing. The delay line can include recessed and tip portions. The recessed portion can be within the cavity and extend from the transducer(s) to the housing distal end. The tip portion can extend from the housing distal end to a distal terminal end of the delay line. The stabilizing element can be coupled to the housing distal end and extend distally from the housing distal end to a target facing surface. The stabilizing element can circumferentially surround at least part of the delay line tip portion. A stabilizing element modulus can be greater than or equal to a delay line modulus.
Ultrasonic probe having flexible stabilizing element for probe alignment
A stabilized ultrasonic probe includes a housing, at least one ultrasonic transducer, a flexible delay line, and a stabilizing element. The housing can be tubular and extend from a proximal to a distal end and define a cavity therein. The transducer can be positioned within the housing. The delay line can include recessed and tip portions. The recessed portion can be within the cavity and extend from the transducer(s) to the housing distal end. The tip portion can extend from the housing distal end to a distal terminal end of the delay line. The stabilizing element can be coupled to the housing distal end and extend distally from the housing distal end to a target facing surface. The stabilizing element can circumferentially surround at least part of the delay line tip portion. A stabilizing element modulus can be greater than or equal to a delay line modulus.
High-temperature ultrasonic sensor
A sensor for ultrasonically measuring a portion of a structure having a temperature significantly above room-temperature, the sensor comprising: a high-temperature portion for intimate contact with the structure, the high-temperature portion comprising at least: at least one transducer for converting a first signal to an ultrasonic transmit signal, and for converting an ultrasonic reflected signal to a second signal; a low-temperature portion comprising at least: at least one digital sensor interface (DSI) to which the transducer is electrically connected, the DSI being configured to transmit the first electrical signal and receive the second electrical signal, and to generate an A-scan signal based on the first and second electrical signals; a wireless interface for transmitting a digital signal based directly or indirectly on at least said A-scan signal; and a battery for powering the DSI and the wireless interface; and an elongated member containing one or more electrical conductors for conducting the first and second signals between the transducer and the DSI, the elongated member being configured to offset the low-temperature portion a sufficient distance away from the high-temperature portion such that the low-temperature portion is subjected to significantly less heat from the structure compared to the high-temperature portion.
DEVICE MONITORING SYSTEMS AND METHODS
Systems and methods for components, e.g., liquid or gas handling, are described. A tester includes a wand that is handheld that can communicate with a handheld electronic device which in turn can communicate with a central monitor for storing and compiling readings as historical profile data. The wand includes an acoustic probe to physically contact the device to acoustically sense the performance of the device. The acoustic probe includes a probe tip and a stack of acoustic elements, an electrode, a stack mass, and a head to convert the acoustic signal into an electrical signal. The tester can include onboard force sensors associated with the probe or a temperature sensor. The tester or a handheld device includes circuitry to process the information, interact with the user, and transmit information to and from the handheld electronic device and/or the central monitor.