G01N2201/06113

Method and Device for Superresolution Optical Measurement using Singular Optics
20230228561 · 2023-07-20 ·

A method for measuring a position of a fluorophore includes configuring a set of compact light distributions, the set having at least one member, each light distribution characterized by a center, so that there is substantially zero intensity at the center of the set of compact light distributions. The method additionally includes moving the set of compact light distributions in relation to a set of hypothesized positions of the fluorophore, detecting, in a plurality of locations corresponding to the hypothesized set of positions, a set of images; and estimating the position of the fluorophore, by determining from the set of images a set of parameters describing the position of the fluorophore using an inverse problem method.

Photoacoustic apparatus and methods
11561206 · 2023-01-24 · ·

A photoacoustic apparatus, comprising: at least one optical amplifier, configured to produce light; at least one photonic integrated circuit, configured as a tunable light filter; light guiding means, wherein the at least one optical amplifier, at least one photonic integrated circuit and light guiding means are configured as an optical cavity to produce laser light having an optical path within the optical cavity; and at least one acoustic sensor configured to detect sound produced by analyte introduced into the optical path of the laser light.

METHODS AND SYSTEMS FOR SPATIALLY IDENTIFYING ABNORMAL CELLS
20230228684 · 2023-07-20 · ·

The present invention provides compositions and methods for imaging tumor resections.

Radiation source and gas sensor using the radiation source

A radiation source for obliquely launching a narrowband electromagnetic radiation into a cavity, comprises an emitter structure having a main radiation emission region for emitting the narrowband electromagnetic radiation, wherein the emitter structure is optically coupled to the cavity, and a layer element coupled to the main radiation emission region of the emitter structure, wherein the layer element comprises a radiation deflection structure configured for deflecting the radiation emission characteristic of the emitter structure with respect to the surface normal of the main radiation emission region of the emitter structure.

Methods and systems for optical surface defect material characterization

Methods and systems for detecting and classifying defects based on the phase of dark field scattering from a sample are described herein. In some embodiments, throughput is increased by detecting and classifying defects with the same optical system. In one aspect, a defect is classified based on the measured relative phase of scattered light collected from at least two spatially distinct locations in the collection pupil. The phase difference, if any, between the light transmitted through any two spatially distinct locations at the pupil plane is determined from the positions of the interference fringes in the imaging plane. The measured phase difference is indicative of the material composition of the measured sample. In another aspect, an inspection system includes a programmable pupil aperture device configured to sample the pupil at different, programmable locations in the collection pupil.

Microorganism detection apparatus
11703449 · 2023-07-18 · ·

Provided is a microorganism detection apparatus including a body, a sample accommodator module provided in the body to accommodate a sample, a beam irradiation module for irradiating a beam to the sample, a sensor module for detecting speckles generated when the beam irradiated to the sample is scattered due to motion of bacteria or microorganisms included in the sample, and a controller for controlling the beam irradiated from the beam irradiation module, and storing and analyzing images detected by the sensor module, wherein the sample accommodator module includes a sample accommodation block having a sample hole capable of accommodating a container containing the sample, and a heater for supplying heat to the bacteria or microorganisms in the sample at a preset temperature.

Apparatus, systems, and methods for the laser inspection of holes in transparent materials

Apparatus, systems, and methods for the inspection of holes in transparent materials, the apparatus including a processor, an illumination probe, and a detection probe. The illumination probe includes a laser light source and a reflective surface and is configured to be inserted into a first hole in the transparent material. The detection probe includes a second reflective surface and a photodetector and is configured to be inserted in a second hole in the transparent material. Laser light is directed onto the first reflective surface within the first hole and is reflected through a wall of the first hole, into the transparent material, and reflected by the second reflective surface to the photodetector. The photodetector transmits a measured light intensity value to the processor, which compares the light intensity value to a standard intensity value to determine whether or not a crazing condition exists in the second hole.

LASER IRRADIATION STATE DIAGNOSIS METHOD, LASER IRRADIATION STATE DIAGNOSIS PROGRAM, LASER IRRADIATION STATE DIAGNOSIS DEVICE, AND LASER IRRADIATION DEVICE

Disclosed is a laser irradiation state diagnosing method which allows accurately diagnosing a laser irradiation state. When irradiating a laser beam so that an irradiation spot scans the surface of the irradiation object, acoustic information in vicinity of the irradiation spot is acquired. And based on characteristics of the acoustic information, such as an intensity of a component of a specific frequency band or a frequency band distribution, a state of peeling of the adhered substances existing on the surface of the irradiation object is determined.

QUANTUM ABSORPTION SPECTROSCOPY SYSTEM AND QUANTUM ABSORPTION SPECTROSCOPY METHOD
20230020945 · 2023-01-19 ·

A quantum absorption spectroscopy system (100) includes a laser light source (1), a quantum optical system (201), a photodetector (31), and a controller (4). The laser light source (1) emits pump light. The quantum optical system (201) includes a nonlinear optical crystal (23) that generates a quantum entangled photon pair of a signal photon and an idler photon by irradiation with pump light, and a moving mirror (25) that changes a phase of the idler photon, and causes quantum interference between a plurality of physical processes in which the quantum entangled photon pair is generated. The photodetector (31) detects the signal photon when the phase of the idler photon is changed by the nonlinear optical crystal (23) in a state where a sample is disposed on an optical path of the idler photon, and outputs a quantum interference signal corresponding to the detected number of photons. The controller (4) calculates an absorption spectroscopy characteristic of the sample by performing Fourier transform on the quantum interference signal.

LASER BASED INCLUSION DETECTION SYSTEM AND METHODS

Apparatuses and methods are described for detecting inclusions in glass. The apparatuses and methods employ a laser that is configured to project a laser sheet at a first angle from one side of a glass sheet, and a camera configured to capture images from a second angle from another side of the glass sheet. The glass sheet is moved thorough the laser sheet while the camera captures images. One or more processing devices execute image processing algorithms to identify areas of the glass sheet containing inclusions based on the captured images. In some examples, the identified areas of the glass sheet are revisited to confirm they contain inclusions.