Provided herein is an apparatus for assessing a fluorescence characteristic of a gemstone. The apparatus comprises an optically opaque platform for supporting a gemstone to be assessed, one or more light source to provide uniform UV and non-UV illumination, an image capturing component, and a telecentric lens positioned to provide fluorescent images of the illuminated gemstone to the image capturing component. Also provided are methods of fluorescence analysis based on images collected using such an apparatus.

Provided are a diffusion plate that diffuses light emitted from a light source, and a prism having a first surface to receive the light transmitted through the diffusion plate, a second surface to reflect the light in contact with a measurement target liquid, and a third surface to extract the reflected light. The light source, the diffusion plate, a light receiving lens, and an imaging element are accommodated in a holder that presses the prism from the inner side to the outer side.

A configuration of the present disclosure specifies a signal point of a specific component and a background point, based on time series two-dimensional spectroscopic image data of a gas; calculates a correlation coefficient between a time series detection signal at the signal point and a time series detection signal at the background point; and generates a time series detection signal of the specific component, based on a corrected time series detection signal obtained by subtracting a product of the correlation coefficient and the time series detection signal at the background point from the time series detection signal at the signal point.

The light extraction device, the detection equipment and the operation method thereof are provided. The light extraction device includes at least one light splitting unit, each of the at least one light splitting unit includes a color separation grating, configured to separate light incident on the color separation grating into a plurality of light beams that are collimated and propagated in different directions and have different colors; a first lens, disposed corresponding to the color separation grating and configured to converge the plurality of light beams; and a first pinhole, located on a side of the first lens away from the color separation grating and correspondingly arranged with the first lens. The first lens is configured to converge a light beam having a preset color in the plurality of light beams to the first pinhole and allow the light beam having the preset color to exit.

A nephelometric turbidimeter for measuring a turbidity of a liquid sample in a sample cuvette. The nephelometric turbidimeter includes a measurement light source configured to emit an axial parallel light beam directed to the sample cuvette, a scattering light detector arranged to receive a scattered light from the sample cuvette, and a diffuser comprising a diffuser body and a diffuser actuator. The diffuser actuator is configured to move the diffuser body between a parking position in which the diffuser body does not interfere with the axial parallel light beam and a test position where the diffuser body is arranged between the measurement light source and the sample cuvette so that the diffuser body interferes with the axial parallel light beam and generates a diffuse test light entering the sample cuvette.

The invention relates to an apparatus for probing a sample comprising a light source for emitting an illuminating light beam, a birefringent element for splitting the illuminating light beam into two sheared beams, a reflective element for reflecting the two sheared beams, wherein the apparatus is configured such that the reflected beams propagate through the birefringent element for recombining the reflected beams, and a detector for detecting the recombined beam, wherein the sample is arrangeable in the optical path of the sheared beams or at the backside of a reflective surface in the optical path of the sheared beams, the reflective surface exhibiting a surface plasmon resonance or a localized surface plasmon resonance.

A biochip device includes a waveguide, chromophore elements, a diffusing structure, and a sloping surface. The chromophore elements are disposed on a portion of the waveguide and are configured to emit fluorescence in response to excitation by guided light waves transmitted by the waveguide. The diffusing structure is configured to generate guided light waves in the waveguide when illuminated. The sloping surface is sloped relative to a plane of the waveguide and is configured to direct excitation light into the waveguide, and the sloping surface and the waveguide are configured to deflect the excitation light to the diffusing structure to generate guided light waves within the waveguide. The sloping surface may be a face of a prism attached to or integrated with the waveguide, or the sloping surface may be a chamfer formed at an edge of the waveguide.

Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120° in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.

Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.

Methods and apparatus for obtaining a corrected digital mode spectrum for a chemically strengthened (CS) substrate having a curved surface are disclosed. The methods include digitally capturing transverse magnetic (TM) and transverse electric (TE) mode spectra of the CS substrate to form a digital mode spectrum image using an evanescent prism coupling system having a system calibration for measuring flat CS substrates. The method further includes establishing a calibration correction based on the difference in the digitally captured TM and TE mode spectra as compared to a reference TM and TE mode spectra for a reference CS substrate. The calibration correction is applied to the digital mode spectrum image to form the corrected digital mode spectrum image, which can be processed using the system calibration for measuring flat CS substrates to determine a refractive index profile and stress characteristics for the curved CS substrate.