G01N2201/0638

BIOLOGICAL SAMPLE IMAGE COLLECTION DEVICE AND GENE SEQUENCER

A biological sample image collection device (100), comprising support (30) and an optical imaging assembly (50), also comprises: a plurality of movable platforms (40), for placing biological samples (20) wherein the plurality of movable platforms (40) are arranged on the support (30) in an array; the plurality of movable platforms (40) can move relative to the support (30); and forces acting on the support (30) during the movement of the movable platforms can cancel each other out, so as to avoid vibrations affecting the support (30) and the biological samples (20) are canceled. The optical imaging assembly (50) collects images of the biological samples (20) on the movable platforms (40) when the plurality of movable platforms (40) move, relative to the center of the array, in the same direction and at the same speed. Further provided is a gene sequencer including the biological sample image collection device (100).

Far-infrared light source and far-infrared spectrometer

The present invention provides a far-infrared light source capable of reducing the shift in the location irradiated with far-infrared light even when the frequency of the far-infrared light changes. A far-infrared light source according to the present invention is configured so that the variation in the emission angle of far-infrared light in a nonlinear optical crystal when the frequency of the far-infrared light changes is substantially offset by the variation in the refractive angle of the far-infrared light at the interface between the nonlinear optical crystal and a prism when the frequency of the far-infrared light changes (see FIG. 8).

Multiple Light Paths Architecture and Obscuration Methods for Signal and Perfusion Index Optimization

A photoplethysmographic (PPG) device is disclosed. The PPG device can include one or more light emitters and one or more light sensors to generate the multiple light paths for measuring a PPG signal and perfusion indices of a user. The multiple light paths between each pair of light emitters and light detectors can include different separation distances to generate both an accurate PPG signal and a perfusion index value to accommodate a variety of users and usage conditions. In some examples, the multiple light paths can include the same separation distances for noise cancellation due to artifacts resulting from, for example, tilt and/or pull of the device, a user's hair, a user's skin pigmentation, and/or motion. The PPG device can further include one or more lenses and/or reflectors to increase the signal strength and/or and to obscure the optical components and associated wiring from being visible to a user's eye.

OBJECTIVE OPTICAL SYSTEM FOR ATR MEASUREMENT
20170371139 · 2017-12-28 ·

An objective optical system includes a convex secondary mirror configured to reflect a measurement light irradiated from an infrared microscope, a concave primary mirror configured to reflect the measurement light reflected by the secondary mirror, a prism to which the measurement light reflected by the primary mirror is irradiated, and a light shielding means provided on an optical path of the measurement light between the primary mirror and the prism to shield a part of the light beam of the measurement light.

ELECTRONIC DEVICE INCLUDING FINGERPRINT SENSOR AND OPERATING METHOD THEREOF

An electronic device is provided which includes a light emitting module that radiates infrared light, a window disposed on the light emitting module and having a specific refractive index with respect to the infrared light, wherein the window includes a refraction part that totally reflects the infrared light inside the window in correspondence with the specific refractive index, and a fingerprint sensor disposed under the window and obtaining a fingerprint of a user based on a user input on the window by using scattered light of the infrared light.

MICRO-FLUIDIC CHIP TO PERFORM SURFACE PLASMON RESONANCE ASSAYS
20170370837 · 2017-12-28 ·

A micro-fluidic chip comprises a chip base, a lens, and a securing portion. The chip base has a flow cell and a micro-fluidic channel defined therein. The micro-fluidic channel is fluidly connected to the flow cell to deliver fluid to and from the flow cell, respectively via a fluid input port and a fluid output port. The lens has an apex and a base. The apex is positioned within the flow cell. The securing portion is affixed to the chip base such that the lens is sandwiched between the chip base and the securing portion. The securing portion has a circular cavity defined therein in a surface adjacent the chip base, for receiving the base of the lens. The securing portion further has separate light input and output channels to allow light in and out, respectively, of the circular cavity and the lens.

Optical metrology system for spectral imaging of a sample

An optical metrology device is capable of detection of any combination of photoluminescence light, specular reflection of broadband light, and scattered light from a line across the width of a sample. The metrology device includes a first light source that produces a first illumination line on the sample. A scanning system may be used to scan an illumination spot across the sample to form the illumination line. A detector collects the photoluminescence light emitted along the illumination line. Additionally, a broadband illumination source may be used to produce a second illumination line on the sample, where the detector collects the broadband illumination reflected along the second illumination line. A signal collecting optic may collect the photoluminescence light and broadband light and focus it into a line, which is received by an optical conduit. The output end of the optical conduit has a shape that matches the entrance of the detector.

Series absorbance glass and interference filters

An imaging assembly and processing system that includes a sample platform having a target region which can hold a sample, where the sample can be marked with fluorescent or phosphorescent markers. The imaging assembly can have an excitation light module proximate to the sample platform that emits light to excite the markers, and a lens module positioned to receive emission light from excited markers in target region. At least one series filter assembly or interference filter can be arranged in front of, behind, or both in front of and behind the lens module. The assembly includes a light sensor and a processor and imaging module configured to process data captured by the light sensor. Images of the sample are generated based on the emission light from the sample that transmit through and are filtered by the lens assembly and series filter assembly or interference filter.

Defect inspecting method, sorting method, and producing method for photomask blank

A method of inspecting a defect present at a surface portion of a photomask blank having at least one thin film formed on a substrate by use of the inspecting optical system. The method includes setting the distance between the defect and an objective lens of an inspecting optical system to a defocus distance, applying inspection light to the defect through the objective lens, collecting reflected light from the region irradiated with the inspection light, through the objective lens, as a magnified image, identifying a light intensity variation portion of the magnified image, and determining the rugged shape of the defect on the basis of a variation in light intensity of the light intensity variation portion of the magnified image.

Multi-parameter inspection apparatus for monitoring of additive manufacturing parts
11668658 · 2023-06-06 ·

Additive manufacturing, such as laser sintering or melting of additive layers, can produce parts rapidly at small volume and in a factory setting. To ensure the additive manufactured parts are of high quality, a real-time non-destructive evaluation (NDE) technique is required to detect defects while they are being manufactured. The present invention describes an in-situ (real-time) inspection unit that can be added to an existing additive manufacturing (AM) tool, such as an FDM (fused deposition modeling) machine, or a direct metal laser sintering (DMLS) machine, providing real-time information about the part quality, and detecting flaws as they occur. The information provided by this unit is used to a) qualify the part as it is being made, and b) to provide feedback to the AM tool for correction, or to stop the process if the part will not meet the quality, thus saving time, energy and reduce material loss.