A method for measuring the activity of one or more excitable cells, such as neurons, in a target tissue is provided. The present method may include measuring the activity of individual, selected excitable cells by projecting one or more three dimensional (3D) multi-focal laser light patterns into a target tissue containing excitable cells adapted to emit cellular electrical activitysensitive fluorescence, to generate a multiplexed 2D diffraction pattern of fluorescence emitted by the neurons, and resolving the multiplexed 2D diffraction pattern. Also provided herein is a system configured to perform the present method, the system including a microscope configured to project one or more 3D multi-focal laser light patterns into a target tissue using a spatial light modulator and a mirror galvanometer, and a microlens array and an image detector to record individual and multiplexed 2D diffraction patterns of light emitted from the target tissue.

An apparatus for detecting material within a sample includes a light emitting unit for directing at least one light beam through the sample. The at least one light beam has a unique signature combination associated therewith responsive to passing through the sample. A Raman spectroscopic unit receives the at least one light beam that has passed through the sample and performs a Raman spectroscopic analysis to detect a first signature associated with the sample. An infrared spectroscopic unit receives the at least one light beam that has passed through the sample and performs an infrared spectroscopic analysis to detect a second signature associated with the sample. A database includes a plurality of unique combinations of the first signature and the second signature. Each of the plurality of unique combinations of the first signature and the second signature are associated with a particular material. A processor detects the material within the sample responsive to a comparison of a unique combination of the first signature and the second signature detected by the Raman spectroscopic unit and the infrared spectroscopic unit with the plurality of unique combinations of first signature and second signature within the database and determines a matching unique combination of the first signature and the second signature within the database, wherein identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone.

Systems and methods for confocal imaging are described. In one implementation, a confocal imaging system may include a light source configured to emit excitation light having one or more wavelengths, a sample holder configured to hold a sample, a two-dimensional (2-D) imaging device, a first set of optical elements, and a second set of optical elements. The first set of optical elements may include a first spatial light modulator (SLM) and at least one lens. The first set of optical elements may together be configured to collimate the excitation light, apply a predetermined phase modulation pattern to the collimated excitation light, and illuminate the sample in an excitation pattern.

The present disclosure relates to spatially modulating the light source used in microscopy. In some cases, a light source projects a sequence of two-dimensional spatial patterns onto a sample using a spatial light modulator. In some cases, the spatial patterns are based on Hadamard matrices. In some cases, an imaging device captures frames of image data in response to light emitted by the sample and orthogonal components of the image data are analyzed by cross-correlating the image data with the spatial pattern associated with each frame. A microscope may be calibrated by illuminating a sample with the sequence of spatial patterns, capturing image data, and storing calibration that maps each pixel of the spatial light modulator to at least one pixel of the imaging device.

A device includes a plurality of imaging pixels in a spatial pattern with a formation of features disposed over the pixels. A first and a second feature of the formation of features are disposed over a first pixel. A first luminophore is disposed within or over the first feature. A second luminophore is disposed within or over the second feature. A structured illumination source is to direct at least a portion of first photons in an illumination pattern to the first feature at a first time, and to direct at least a portion of second photons in the illumination pattern to the second feature at a second time. The structured illumination source includes an illumination pattern generator having an illumination pattern generator actuator connected to the illumination pattern generator to cause the illumination pattern to translate or rotate relative to the formation of features.

An optical module (1A) includes a polarization beam splitter (10A) having a light splitting surface (11), polarization elements (20, 40), and respectively arranged on an optical path of a first polarization component (L2) transmitted through the light splitting surface (11) and an optical path of a second polarization component (L4) reflected by the light splitting surface (11), a reflective SLM (30) that modulates and reflects the first polarization component (L2) passing through the polarization element (20), and a reflective SLM (50) that modulates and reflects the second polarization component (L4) passing through the polarization element (40). The first modulation light (L3) passing through the polarization element (20) again and then reflected by the light splitting surface (11) and the second modulation light (L5) passing through the polarization element (40) again and then transmitted through the light splitting surface (11) are combined with each other.

Disclosed are methods and apparatus for facilitating defect detection in a multilayer stack. The method includes selection of a set of structure parameters for modeling a particular multilayer stack and a particular defect contained within such particular multilayer stack and a set of operating parameters for an optical inspection system. Based on the set of structure and operating parameters, an electromagnetic simulation is performed of waves scattered from the particular multilayer stack and defect and arriving at a collection pupil of the optical inspection system. Based on the simulated waves at the collection pupil, a design of a phase filter having a plurality of positions for changing a plurality of phases within a plurality of corresponding positions of the collection pupil of the optical inspection tool is determined so as to compensate for an adverse effect of the particular multilayer stack on obtaining a defect signal for the defect within such particular multilayer stack and/or to enhance such defect signal. The design of the phase filter is then provided for fabrication or configuration of a phase filter inserted within the optical inspection system for detection of defects in multilayer stacks with the same structure parameters as the particular multilayer stack. Methods and systems for inspecting a multilayer stack for defects are also disclosed.

Described herein is an excitation emission matrix (EEM) spectrometer and method, comprising a multiplexer that encodes excitation light produced by at least one excitation light source; and a demultiplexer that decodes encoded light emitted from a sample, and produces an output indicative of a characteristic of the sample. Embodiments are described wherein the multiplexer and the demultiplexer may comprise FDM or OFDM, and wherein both the excitation light and the emitted light may be encoded using a DMA or a SLM. In some embodiments the same DMA or SLM may be used to encode the excitation light and the emitted light. In some embodiments excitation light may be encoded using a Walsh function, or the excitation light may be encoded using a Walsh function and the emitted light may be decoded using an inverse Hadamard transformation.

Systems and methods for hyperspectral imaging are described. In one implementation, a hyperspectral imaging system includes a sample holder configured to hold a sample, an illumination system, and a detection system. The illumination system includes a light source configured to emit excitation light having one or more wavelengths and a diffractive element. The illumination system is configured to structure the excitation light into a predetermined two-dimensional pattern at a conjugate plane of a focal plane in the sample, spectrally disperse the structured excitation light in a first lateral direction, and illuminate the sample in an excitation pattern with the one or more wavelengths dispersed in the first lateral direction.

An imaging system for measuring water and blood lipid content in a tissue sample includes a light source configured to emit a plurality of sequential wavelengths of light within a predetermined range of wavelengths, a spatial modulation device configured to direct each of the plurality of sequential wavelengths of light onto a tissue sample plane to generate a first plurality of patterns on the issue sample plane at a first spatial frequency and a second plurality of patterns on the tissue sample plane at a second spatial frequency, an imaging device configured to generate first image data reproducible as images the first plurality of patterns and second image data reproducible as images the second plurality of patterns, and a controller configured to determine a first optical property and a second optical property for each location on the sample plane.