A support jig for use with a testing machine applying tensile loads, the support jig includes a frame and a pair of spaced apart supports joined to the frame to provide an alignment axis. Each support is configured to releasably hold a test specimen holder on the alignment axis in a fixed spatial relationship with ends of the test specimen holders mountable to the test machine facing in opposite directions. A method of using the support jig to remotely mount the test specimen to the test specimen holders from the test machine, and then using the support jig to maintain the fixed special relationship while the test specimen holders are mounted to the test machine is also provided.

A nanometer cutting depth high-speed single-point scratch test device includes a workbench, an air-bearing turntable, a test piece fixture, a test piece, a Z-direction feeding device, a nano positioning stage, a force sensor and a scratch tool. A micro convex structure with controllable length and height is machined in a position of the test piece to be scratched.

A TEM electromechanical in-situ testing method of one-dimensional materials is provided. A multi-function sample stage which can compress, buckle and bend samples is designed and manufactured. A carbon film on a TEM grid of Cu is eliminated, and the TEM grid of Cu is cut in half through the center of the circle. The samples are dispersed ultrasonically in alcohol and dropped on the edge of the semicircular grid of Cu with a pipette. A single sample is fixed on the edge of a substrate of the sample stage with conductive silver epoxy by using a micromechanical device under an optical microscope, and conductive silver paint is applied to the surface of the substrate of the sample stage; and an electromechanical in-situ testing is conducted in a TEM. This provides a simple and efficient sample preparation and testing method for a TEM electromechanical in-situ observing experiment.

An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

A MEMS-nanoindenter chip performs nanoindentation on a specimen. The MEMS-nanoindenter chip has an intender probe joined with an indenter tip. The indenter tip indents into the specimen. A reference probe is joined with a reference tip, the reference tip touches the specimen. Sensing capabilities are provided to measure the position of the indenter probe relative to the reference probe. The MEMS-nanoindenter chip enables highly accurate measurements since the frame stiffness is not part of the measurement chain any more. Furthermore, thermal drift during the nanoindentation is considerably reduced.

The present invention discloses a high throughput statistical characterization method of metal micromechanical properties, which comprises: grinding and polishing a metal sample until specular reflection finish satisfies a test requirement; marking position coordinates of a to-be-measured area on the metal sample by a microhardness tester to ensure the comparison of the same to-be-measured area; conducting an isostatic pressing strain test on the to-be-measured area by an isostatic pressing technology; and comparing high throughput characterization of components, microstructures, microdefects and three-dimensional surface morphology of the metal sample before and after isostatic pressing strain to obtain the full-view-field cross-scale high throughput statistical characterization of micromechanical property uniformity of the metal sample.

Apparatus for inspecting the tension of a tape adhered to an annular frame having, in the center thereof, an opening for accommodating a wafer includes: a frame support section that supports the annular frame, a light source that applies light toward the tape, an imaging camera that captures, through the tape, the light applied from the light source, a first polarizing plate disposed between the tape and the light source, and a second polarizing plate disposed between the tape and the imaging camera and positioned so as to shield the light of linearly polarized light transmitted through the first polarizing plate. If distortion is generated in a polarization plane of the light due to application, onto the tape, of the light of the linearly polarized light transmitted through the first polarizing plate, the light is transmitted through the second polarizing plate, and the imaging camera images the transmitted light.

The invention relates to a method for classifying a tissue sample obtained from mammary carcinoma. The method comprises determining a stiffness value for each of a plurality of points on said tissue sample, resulting in a stiffness distribution, and assigning said sample to a breast cancer subtype and nodal status based on said stiffness distribution.

A support jig for use with a testing machine applying loads, the support jig includes a frame and a pair of spaced apart supports joined to the frame to provide an alignment axis. Each support is configured to releasably hold a test specimen holder on the alignment axis in a fixed spatial relationship with ends of the test specimen holders mountable to the test machine facing in opposite directions. A test specimen support is located between the holders holds the test specimen on the alignment axis so that the holders can be attached to the test specimen. The support jig allows the holders to be easily and correctly attached to the test specimen so as to maintain alignment of the holders and the test specimen on the alignment axis. The support jig also maintains the fixed spatial relationship of the holders and test specimen while the holders are mounted to the test machine.

The invention relates to a device (10) for determining the mechanical properties of nanomaterials comprising a substrate (30) onto which a nanomaterial specimen (40) can be anchored, wherein said substrate (30) is mechanically connected to an actuator (20) on one side and to a sensor (50) on the opposite side, and wherein the substrate (30) is configured to generate a fracture line (32′) in a predetermined position which divides the substrate (30) into two parts (31,31′), wherein a first part (31) is connected to the actuator (20) and a second part (31′) is connected to a sensor (50), in order to allow a relative movement between the actuator (20) and the sensor (50).