G01N2223/0566

X-ray diffraction analysis method and X-ray diffraction analysis apparatus
10712294 · 2020-07-14 · ·

An X-ray diffraction analysis method includes, placing a sample on a sample stage and acquiring a two-dimensional X-ray diffraction image from the sample using a two-dimensional detection circuit by irradiating the sample with an X-ray in a state where an X-ray irradiation angle is fixed, specifying a collection of diffraction spots having a predetermined range of diffraction angles from the X-ray diffraction image as a diffraction spot group, counting the number of diffraction spots having predetermined intensity or more in the diffraction spot group, grouping the diffraction spot group based on the number of diffraction spots, and identifying a crystal phase contained in the sample based on a diffraction angle of the grouped diffraction spot group.

QUANTITATIVE PHASE ANALYSIS DEVICE, QUANTITATIVE PHASE ANALYSIS METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM STORING QUANTITATIVE PHASE ANALYSIS PROGRAM
20200173938 · 2020-06-04 ·

A quantitative phase analysis device includes: a unit for acquiring a powder diffraction pattern of the sample; a unit for acquiring information on a plurality of crystalline phases; a unit for acquiring a fitting function for each of the plurality of crystalline phases; a unit for executing whole-powder pattern fitting for the powder diffraction pattern by using the acquired fitting functions, to thereby acquire a fitting result; and a unit for calculating a weight ratio of the plurality of crystalline phases based on the fitting result. Each fitting function is selected from the group consisting of a first fitting function using an integrated intensity obtained by whole-powder pattern decomposition, a second fitting function using an integrated intensity obtained by observation or calculation, and a third fitting function using a profile intensity obtained by observation or calculation.

X-RAY DIFFRACTION AND X-RAY SPECTROSCOPY METHOD AND RELATED APPARATUS

A method and apparatus for rapid measurement and analysis of structure and composition of poly-crystal materials by X-ray diffraction and X-ray spectroscopy, which uses a two-dimensional energy dispersive area detector having an array of pixels, and a white spectrum X-ray beam source. A related data processing method includes separating X-ray diffraction and spectroscopy signals in the energy dispersive X-ray spectrum detected by each pixel of the two-dimensional energy dispersive detector; correcting the detected X-ray diffraction signals by a correction function; summing the corrected X-ray diffraction signals and X-ray spectroscopy signals, respectively, over all pixels to obtain an enhanced diffraction spectrum and an enhanced spectroscopy spectrum; using the enhanced diffraction and spectroscopy spectrum respectively to determine the structure and composition of the sample. The summing step includes using Bragg's equation to convert the intensity-energy diffraction spectrum for each pixel into an intensity-lattice spacing spectrum before summing them.

METHOD FOR MEASURING STRESS

A method for measuring the stress of a concave section of a test subject which comprises a metal and has a surface and a concave section, the method including: a detection step for detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays to be incident on the concave section and to be diffracted by the concave section; and a calculation step for calculating the stress of the concave section on the basis of the detection results during the detection step. Therein, the detection step involves causing X-rays to be incident on each of a plurality of sites inside the concave section of the test subject, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the concave section.

Apparatus and method for inducing high-speed variable-tilt wobble motions

An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer.

APPARATUS AND METHOD FOR INDUCING HIGH-SPEED VARIABLE-TILT WOBBLE MOTIONS
20200096459 · 2020-03-26 ·

An apparatus and method for inducing high-speed wobble motions to a sample of interest is provided. After the sample is securely attached to a sample mounting block, the sample is variably tilted by using a hexapod stage and simultaneously rotated at a high speed about a rotation axis that is substantially perpendicular to a planar top surface of the hexapod stage. The position of the sample is continuously adjusted during the wobble motion to align a surface center of the sample with a testing center of an X-ray diffractometer. The simultaneous variable tilting and high-speed rotation of the sample induces wobble motions to the sample for randomizing orientations of a sample material's crystallites relative to the source and detector of an X-ray diffractometer.

X-ray diffraction measurement method and apparatus
10591425 · 2020-03-17 · ·

An X-ray diffraction measurement method includes an arranging step of arranging a shielding plate and a two-dimensional detector on an outgoing optical axis, and a calculating step of calculating a diffraction profile indicating an X-ray intensity with respect to a diffraction angle of the object to be measured, on the basis of a two-dimensional X-ray image detected by the two-dimensional detector. In the arranging step, the shielding plate is arranged in a manner so that the slit is inclined at least in a direction about the outgoing optical axis with respect to an orthogonal direction which is orthogonal to both the incident optical axis and the outgoing optical axis.

Method for the detection and/or diagnosis of eating disorders and malnutrition using X-ray diffraction

Alternatives described herein relate to methods for detecting, identifying, and/or diagnosing eating disorders, nutritional deficiencies, and/or malnutrition, including conditions such as bulimia nervosa and/or anorexia nervosa, by using X-ray diffraction on a sample of a tested subject's hair. In some alternatives, once an eating disorder, nutritional deficiency, or malnutrition is detected, identified, or diagnosed using the X-ray diffraction approaches set forth herein, a subject identified as having an eating disorder, nutritional deficiency, or malnutrition is provided counseling for the disorder and/or a medicament to treat, inhibit, or ameliorate said eating disorder or malnutrition, including Prozac, ami trip tyline, fluoxe tine, imipramine, Nardil, Tofranil, desipramine, Sarafem, Norpramin, and/or phenelzine.

X-ray diffractometer

Some embodiments are directed to an x-ray diffractometer including a first arm and a second arm, the first arm being rotatably connected to the second arm at a first rotation point. A sample holder is mounted onto the first arm at an outer end of the first arm away from the first rotation point. An X-ray source is configured to emit a divergent X-ray beam so as to irradiate a surface of the sample. The second arm is rotatably connected to the X-ray source at a second rotation points. A detector is configured to detect scattered beams coming from the sample, the detector being rotatably arranged around the first rotation point. A guiding device is provided to guide the sample along a main axis of the X-ray beam thereby varying an angle between the first and second arm.

ELECTROCHEMICAL APPARATUS AND ELECTRONIC APPARATUS
20240038995 · 2024-02-01 · ·

An electrochemical apparatus includes a positive electrode, the positive electrode includes a current collector and a positive electrode mixture layer disposed on at least one surface of the current collector. The positive electrode mixture layer includes a positive electrode active substance and a binder. The binder includes a fluorine-containing polymer. In an XRD diffraction pattern of the fluorine-containing polymer, a diffraction peak A appears at 25 to 27 and corresponds to a (111) crystal plane, and a diffraction peak B appears at 37 to 39 and corresponds to a (022) crystal plane, where an area ratio of the diffraction peak A to the diffraction peak B satisfies 1A(111)/B(022)4.