G01N2223/0566

NON-AQUEOUS ELECTROLYTE SECONDARY BATTERY POSITIVE ELECTRODE AND NON-AQUEOUS ELECTROLYTE SECONDARY BATTERY

A positive electrode active material included in this non-aqueous electrolyte secondary battery positive electrode includes a lithium-transition metal composite oxide. The lithium-transition metal composite oxide contains 80-95 mol % of Ni and 0-20 mol % of Mn, and 3-8 mol % of a metal element other than Li is present in a Li layer of the lithium-transition metal composite oxide. The ratio m/n of the half width m of the diffraction peak for the (003) plane to the half width n of the diffraction peak for the (110) plane in an x-ray diffraction pattern obtained by x-ray diffraction of the positive electrode active material satisfies 0.72m/n0.85. The lithium-transition metal composite oxide is formed from secondary particles that are aggregates of primary particles, the internal porosity of the secondary particles being 1%-5%.

Method for improving an EBSD/TKD map
11940396 · 2024-03-26 · ·

A method for improving the quality/integrity of an EBSD/TKD map, wherein each data point is assigned to a corresponding grid point of a sample grid and represents crystal information based on a Kikuchi pattern detected for the grid point; comprising determining a defective data point of the EBSD/TKD map and a plurality of non-defective neighboring data points, comparing the position of Kikuchi bands of a Kikuchi pattern detected for a grid point corresponding to the defective data point with the positions of bands in at least one simulated Kikuchi pattern corresponding to crystal information of the neighboring data points and assigning the defective data point the crystal information of one of the plurality of neighboring data point based on the comparison.

System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects

The system for in-situ real-time measurements of microstructure properties of 3D-printing objects during 3-D printing processes. An intensive parallel X-ray beam (with an adjustable beam size) impinges on a printing object and is diffracted on a crystal lattice of the printing material. The diffracted radiation impinges on a reflector formed with an array of reflector crystals mounted on an arcuated substrate. The diffracted beams reflected from the reflector crystals correspond to the diffraction intensity peaks produced by interaction of the crystal lattice of the printing material with the impinging X-ray beam. The intensities of the diffraction peaks are observed by detectors which produce corresponding output signals, which are processed to provide critical information on the crystal phase composition, which is closely related to the defects and performance of the printing objects. The subject in-situ technology provides an effective and efficient way to monitor, in real-time, the quality of 3D-printing parts during the 3-D printing process, with a significant potential for effective process control based on the reliable microstructure feedback.

Screening system

There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

Methods And Systems For X-Ray Scatterometry Measurements Employing A Machine Learning Based Electromagnetic Response Model

Methods and systems for estimating values of parameters of interest from X-ray scatterometry measurements with reduced computational effort are described herein. Values of parameters of interest are estimated by regression using a trained, machine learning (ML) based electromagnetic (EM) response model. A training data set includes sets of Design Of Experiments (DOE) values of parameters of interest and corresponding DOE values of a plurality of electromagnetic response metrics. In some examples, values of parameters of interest are determined from measured images based on regression using a sequence of trained ML based electromagnetic response models. In some examples, input values employed to train the ML based EM response model are scaled based on model output variation.

Electron diffraction holography
11906450 · 2024-02-20 · ·

Methods for using electron diffraction holography to investigate a sample, according to the present disclosure include the initial steps of emitting a plurality of electrons toward the sample, forming the plurality of electrons into a first electron beam and a second electron beam, and modifying the focal properties of at least one of the two beams such that the two beams have different focal planes. Once the two beams have different focal planes, the methods include focusing the first electron beam such that it has a focal plane at or near the sample, and focusing the second electron beam so that it is incident on the sample, and has a focal plane in the diffraction plane. An interference pattern of the first electron beam and the diffracted second electron beam is then detected in the diffraction plane, and then used to generate a diffraction holograph.

Crosslinked fluoropolymer resin and control method for same
11946924 · 2024-04-02 · ·

A crosslinked fluoropolymer resin is configured to include a measuring step of irradiating a surface of the crosslinked fluoropolymer resin with a laser to measure a Raman spectrum, and an acceptance or rejection decision step of determining an acceptance or a rejection of a quality of a measurement region irradiated with the laser, on the basis of an intensity of a fluorescence spectrum relative to an intensity of a Raman scattering peak, which is ascribed to a CF.sub.2 stretching vibration, in the measured Raman spectrum.

A SCREENING SYSTEM

There is presented a screening system and a corresponding method for screening an item. The screening system includes a detection apparatus (100), a rotatable platform (310) to receive the item, and a mechanical arrangement (320, 330). The detection apparatus has an emitter portion to generate a primary beam of ionising radiation and a detector portion to detect an absorption signal and at least one of a diffraction signal and a scattering signal. The mechanical arrangement is adapted to translate the detection apparatus along a translation axis to scan the item with the primary beam. The screening system may be used for identifying restricted or illicit substances that may be present in some luggage or in mail.

Process for Quantification of Metal Amino Acid Chelates in Solutions and Solids
20190346413 · 2019-11-14 ·

A process for quantifying the amount of unbound metal and bound metal in solution is provided. A process for quantifying the amount of bound metal amino acid chelate and free ligand in a solid (e.g., dry mixture such as an animal feed) is also provided.

TECHNIQUE FOR PROCESSING X-RAY DIFFRACTION DATA
20190325635 · 2019-10-24 · ·

A computer-implemented method of processing X-ray diffraction data, wherein the data is provided by an X-ray detector (1030) configured to detect diffracted X-ray beams (20) of a sample (30). The method including the steps of: (a) acquiring X-ray diffraction data from the X-ray detector (1030) while the sample (30) is rotating with respect to an incident X-ray beam (10), (b) generating a 2D image frame from the acquired X-ray diffraction data, wherein the generated 2D image frame includes 2D image data representing X-ray diffraction data for a specific rotational position of the sample, the X-ray diffraction data including sample relevant X-ray data and background data; (c) for the generated 2D image frame, distinguishing the sample relevant X-ray diffraction data from the background data; (d) mapping the distinguished sample relevant X-ray diffraction data of the generated 2D image frame into a single 3D reciprocal space; and (e) visualizing the 3D reciprocal space along with the mapped X-ray diffraction data on a display screen (104). Further provided is an apparatus and an X-ray device implementing the method.