Patent classifications
G01N2223/3037
METHOD FOR CALIBRATING A RADIOMETRIC DENSITY MEASURING APPARATUS
The invention relates to a method for calibrating a radiometric apparatus for determining and/or monitoring density of a medium (6) located in a container (1). The method includes method steps as follows: determining the mass attenuation coefficient .sub.C of the empty container (1) with application of the half value thickness N/N.sub.0=0.5 of the radioactive radiation upon passage through the empty container (1) according to the formula: N/N.sub.0I/I.sub.0=e.sup..sup.
APPARATUS AND METHOD FOR ANALYZING CHEMICAL STATE OF BATTERY MATERIAL
A chemical state analysis apparatus 10 includes: an excitation source 11 configured to irradiate an irradiation region A of a predetermined surface in a sample S containing a battery material with an excitation rays for generating characteristic X-rays of the battery material; an analyzing crystal 13 of a flat plate arranged so as to face the irradiation region A; a slit 12 arranged between the irradiation region A and the analyzing crystal 13, the slit being arranged in parallel to the irradiation region A and a predetermined crystal plane of the analyzing crystal 13; an X-ray linear sensor 15 in which linear detecting elements 151 each having a length in a direction parallel to the slit 12 are arranged in a direction perpendicular to the slit; a wavelength spectrum generation unit 161 configured to generate a wavelength spectrum based on intensity of the characteristic X-rays detected by the X-ray linear sensor 15; a peak wavelength determination unit 162 configured to determine a peak wavelength which is a wavelength in a peak of the wavelength spectrum; and a chemical state specification unit 163 configured to specify a value for specifying a chemical state of the battery material in the sample S from the peak wavelength determined by the peak wavelength determination unit 162 and a standard curve representing a relation between a value representing the chemical state and the peak wavelength.
Systems and methods for multivariate analysis using multi-subsystem data
Systems and methods for analyzing an unknown sample are disclosed. The system includes at least one subsystem to obtain molecular information about the sample and at least one other subsystem to obtain elemental information about the sample. The system also includes a data collection component to collect and combine the information from the subsystems to create combined analytical information and a multivariate model that relates known attributes to information previously generated with at least two analytical systems that are the same types of systems as the at least two analytical subsystems. A prediction engine applies the multivariate model to the combined analytical information to produce predictions of attributes in the unknown sample.
X-RAY SPECTROMETER AND CHEMICAL STATE ANALYSIS METHOD USING THE SAME
An X-ray spectrometer includes: an excitation source that irradiates a predetermined irradiation region on a surface of a sample with an excitation ray generating a characteristic X-ray; a flat plate analyzing crystal facing the irradiation region; a slit provided between the irradiation region and the analyzing crystal, the slit being parallel to a predetermined crystal plane of the analyzing crystal; a linear sensor including linear detection elements having a length in a direction parallel to the slit are arranged in a direction perpendicular to the slit; and an energy calibration unit that measures two characteristic X-rays in which energy is known by irradiating a surface of a standard sample generating the two characteristic X-rays with the excitation ray from the excitation source, and calibrates the energy of the characteristic X-ray detected by each detection element of the X-ray linear sensor based on the measured energies of the two characteristic X-rays.
X-RAY DIFFRACTION AND X-RAY SPECTROSCOPY METHOD AND RELATED APPARATUS
A method and apparatus for rapid measurement and analysis of structure and composition of poly-crystal materials by X-ray diffraction and X-ray spectroscopy, which uses a two-dimensional energy dispersive area detector having an array of pixels, and a white spectrum X-ray beam source. A related data processing method includes separating X-ray diffraction and spectroscopy signals in the energy dispersive X-ray spectrum detected by each pixel of the two-dimensional energy dispersive detector; correcting the detected X-ray diffraction signals by a correction function; summing the corrected X-ray diffraction signals and X-ray spectroscopy signals, respectively, over all pixels to obtain an enhanced diffraction spectrum and an enhanced spectroscopy spectrum; using the enhanced diffraction and spectroscopy spectrum respectively to determine the structure and composition of the sample. The summing step includes using Bragg's equation to convert the intensity-energy diffraction spectrum for each pixel into an intensity-lattice spacing spectrum before summing them.
Mobile and free-form x-ray imaging systems and methods
A three-dimensional (3D) x-ray tomographic imaging system includes an x-ray source fixedly attached to a first unmanned vehicle, which can be aerial or otherwise configured for locomotion, and an x-ray detector. A vehicle controller is configured to be operated by an operator, and an optical camera is mounted to the first unmanned vehicle at a fixed position relative to the x-ray source, and an optical pattern is fixed at a position relative to the x-ray detector. The x-ray source and x-ray detector are configured to be positioned on substantially opposite sides of the object, while the x-ray source is rotated radially around the object to one or more imaging positions.
Monitoring properties of X-ray beam during X-ray analysis
A system for X-ray analysis, includes: (a) an X-ray analysis assembly configured to (i) direct an X-ray beam to impinge on a surface of a sample, and (ii) receive fluorescence radiation excited from the sample in response to the impinged X-ray beam, (b) a target assembly including measurement targets: placed in an optical path between the X-ray analysis assembly and the sample, and configured to move between (i) one or more first positions in which one or more of the measurement targets are positioned in the X-ray beam, and (ii) one or more second positions in which the optical path is unobstructed by the target assembly, and (c) a processor, configured to control movement of the target assembly between the first and second positions, for alternately, (i) monitoring properties of the X-ray beam using the measurement targets, and (ii) performing the X-ray analysis at a measurement site of the sample.
System and method for crack detection
A method includes determining a predicted contrast-to-noise ratio sensitivity function (CNR SF) for crack detection of a predetermined target flaw size with the radiographic inspection system in the selected set-up. The method also includes qualifying an inspection image quality indicator (IQI) for the predetermined target flaw size for use in the radiographic inspection system in the selected set-up. The method also includes performing an inspection process. The inspection process includes selecting the qualified inspection IQI for the predetermined target flaw size. The inspection process also includes performing an inspection test on the qualified inspection IQI using the radiographic inspection system in the selected set-up. The inspection process also includes determining one or more inspection output parameters. The inspection process also includes verifying that the one or more inspection output parameters meet or exceed minimum qualified values to qualify the radiographic inspection system in the selected set-up.
Ore component analysis device and method
An ore component analysis device and method are provided, the analysis device comprises: a sample containing device configured to place an ore sample to be detected; an excitation unit configured to output X-rays with continuously adjustable energy; a detector configured to detect the secondary X-rays; a signal processing unit configured to amplify, shape and classify the secondary X-rays to obtain counts and energy of the secondary X-rays; a data processing device comprising a processor configured to execute a storage module, a matching module, a count correction module, a peak seeking module, a calculation module and a content correction module stored in a memory, so as to obtain elements and contents thereof in the ore sample. The present application can be directly applied to production line for qualitative and quantitative analysis of ore components.
Target for calibrating and determining the spatial resolution, SNR and/or CNR associated with an XCT system
A target is provided for calibrating and determining the spatial resolution, SNR and/or CNR associated with an X-ray computed tomography system having a rotation axis about which a beam of X-rays is rotated relative to the target to produce signals that are processable to generate an image on an imaging plane perpendicular to the rotation axis. The target comprises a radiopaque body and is configured to be locatable in the system with a centre of the body on the rotation axis. A thickness direction of the body parallel to the rotation axis such that the body extends radially from its centre in the imaging plane. The body contains a plurality of non-radiopaque columns extending longitudinally in the thickness direction of the body. The columns are arranged in first sub-groups of identically-shaped columns with the columns of each first sub-group sharing a respective predetermined transverse diameter. The first sub-groups are spaced from each other, and the columns of each first sub-group are also spaced from each other. The first sub-groups are members of one or more first sets. The first sub-groups of each first set are arranged such that within that first set the first sub-groups are at respective and different radial distances from the centre, and within that first set the predetermined transverse diameters of the first sub-groups vary with distance from the centre. An image of the target generated by the system can be used to calibrate and determine the spatial resolution, SNR and/or CNR associated with the system on the basis of the predetermined column transverse diameters.