Disclosed herein is an apparatus for electromagnetic x-ray control. The apparatus comprises a thermionic filament, positioned at a first end of a micro-focus x-ray tube and configured to generate an electron stream. The apparatus also comprises an x-ray generation target, positioned within the micro-focus x-ray tube at a second end of the micro-focus x-ray tube, opposite the first end, to receive the electron stream and to generate x-rays in response to the electron stream impinging on the x-ray generation target. The apparatus further comprises an electromagnetic field element, configured to generate an electromagnetic field that receives the electron stream and operable to vary the electromagnetic field to redirect the electron stream, within the micro-focus x-ray tube, to impinge on the x-ray generation target at variable locations on the x-ray generation target. Each one of the variable locations corresponds to a different one of multiple variations of the electromagnetic field.

The invention relates to a sample handling and storage system. The system is used for storing and handling samples, which may be cryogenic samples, that are arranged for use in charged particle microscopy, such as cryo-electron microscope samples for use in cryo-transmission electron microscopy. The system comprises a storage apparatus for storing a plurality of samples, and a Charged Particle Apparatus (CPA), such as a cryo-TEM, at a location remote from said storage apparatus. The system further comprises a transfer device that is releasably connectable to said storage apparatus, and that is releasably connectable to said CPA as well. As defined herein, said transfer device is arranged for acquiring a sample from said plurality of samples when connected to said storage apparatus, and arranged for transferring said sample from said transfer device to said CPA when connected to said CPA.

An intelligent system and method for preparing cryo-electron microscopy samples is provided. The system includes a control center, an ultra-low temperature liquid tank, a sample holding mechanism configured to limit a position of a to-be-processed sample, a sample processing mechanism configured to cut or polish the sample, a position adjustment mechanism, and a sample transfer mechanism configured to transfer a processed sample. In a working process, the control center controls the ultra-low temperature liquid tank to provide a preset temperature environment based on a target sample type, activates the position adjustment mechanism based on position information of the sample holding mechanism in the first chamber to drive the sample processing mechanism to perform processing according to a preset processing route, and activates, based on information about the processed sample to be transferred into the second chamber, the sample transfer mechanism to transfer the processed sample in a preset environment.

There is provided systems and methods for generating 3D structure estimation of at least one target from a set of 2D Cryo-electron microscope particle images. The method includes: receiving the set of 2D particle images of the target from a Cryo-electron microscope; splitting the set of particle images into at least a first half-set and a second half-set; iteratively performing: determining local resolution estimation and local filtering on at least a first half-map associated with the first half-set and a second half-map associated with the second half-set; aligning 2D particles from each of the half-sets using at least one region of the associated half-map; for each of the half-maps, generating an updated half-map using the aligned 2D particles from the associated half-set; and generating a resultant 3D map using all the half-maps.

The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).

The present disclosure may provide a detector module of an imaging apparatus. The detector module may include a detector assembly configured to detect a signal associated with an object; a cover assembly configured to accommodate the detector assembly; and at least one cooling assembly operably coupled to the cover assembly. The at least one cooling assembly may be configured to cool the detector assembly by providing a cooling medium to the cover assembly.

A qualification process for a sample to be examined by means of cryo-electron microscopy. The, sample (12) is applied to a sample carrier (10) provided for cryo-electron microscopy and subsequently the sample (12) arranged on the sample carrier is examined by means of dynamic light scattering. The particle size distribution within the sample (12) is determined by means of the dynamic light scattering. Further, a sample holder designed to carry out the qualification process.

An X-ray detector monitoring device capable of detecting a time when an X-ray detector is disabled due to a slow leak is provided. The X-ray detector monitoring device is provided with an X-ray detection element 32 for detecting X-ray intensity, an X-ray detector 30 having a vacuum insulation container 33 in which an X-ray introduction window 31 is formed, a cooling means 60 for cooling the X-ray detection element 32, a detection element temperature sensor 81 mounted on the X-ray detection element 32 to output detection element temperature information T.sub.t by detecting a temperature of an X-ray detection element 32, and a control unit 40 and 70 configured to calculate an output value for controlling the cooling means 60 to output the output value to the cooling means 60 so that the detection element temperature information T.sub.t becomes a preset temperature T.sub.S. The control unit 40 and 70 is configured to detect a vacuum state of the vacuum insulation container 33 based on the output value.

An X-ray detector according to a present embodiment includes: an optical sensor array configured to generate an electric signal by receiving X-rays; a substrate including at least an element that performs A/D conversion on the electric signal; a first support plate configured to hold a separator for removing scattered radiation; and a second support plate that is formed of a material being higher in thermal conductivity than the first support plate and is provided in contact with the substrate at least in part.

Disclosed herein is an apparatus for electromagnetic x-ray control. The apparatus comprises a thermionic filament, positioned at a first end of a micro-focus x-ray tube and configured to generate an electron stream. The apparatus also comprises an x-ray generation target, positioned within the micro-focus x-ray tube at a second end of the micro-focus x-ray tube, opposite the first end, to receive the electron stream and to generate x-rays in response to the electron stream impinging on the x-ray generation target. The apparatus further comprises an electromagnetic field element, configured to generate an electromagnetic field that receives the electron stream and operable to vary the electromagnetic field to redirect the electron stream, within the micro-focus x-ray tube, to impinge on the x-ray generation target at variable locations on the x-ray generation target. Each one of the variable locations corresponds to a different one of multiple variations of the electromagnetic field.