There is provided systems and methods for generating 3D structure estimation of at least one target from a set of 2D Cryo-electron microscope particle images. The method includes: receiving the set of 2D particle images of the target from a Cryo-electron microscope; splitting the set of particle images into at least a first half-set and a second half-set; iteratively performing: determining local resolution estimation and local filtering on at least a first half-map associated with the first half-set and a second half-map associated with the second half-set; aligning 2D particles from each of the half-sets using at least one region of the associated half-map; for each of the half-maps, generating an updated half-map using the aligned 2D particles from the associated half-set; and generating a resultant 3D map using all the half-maps.

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.

An electron microscope (EM) preparation and imaging system including an EM device and a sample preparation device for forming a vitreous ice layer containing a liquid sample through vitrification, which are located within a sealable environment. The sample preparation apparatus includes a cryogenically-cooled stage that receives a sample deposit surface, such as a cryo-EM grid, which is cryogenically cooled through direct contact with the stage. A sample dispenser is movable with respect to the stage and is configured to deposit a liquid sample onto the sample deposit surface at a selected rate of deposition. Once the liquid sample is deposited onto the sample deposit surface by the sample dispenser, it is vitrified automatically in place.

A radiation imaging system stabilizes a change in temperature of a radiation imaging apparatus, obtains a radiation image of an object based on radiation applied from a radiation source and reaching through the object, obtains a correction image by performing imaging without irradiation with the radiation from the radiation source, performs, using the correction image, image processing for correcting an offset component appearing in the radiation image on the radiation image, and determines whether stabilization of a change in temperature of the radiation imaging apparatus is effectively functioning. The radiation imaging system switches modes of obtaining the correction image based on determination.

An electron microscope (EM) preparation and imaging system including an EM device and a sample preparation device for forming a vitreous ice layer containing a liquid sample through vitrification, which are located within a sealable environment. The sample preparation apparatus includes a cryogenically-cooled stage that receives a sample deposit surface, such as a cryo-EM grid, which is cryogenically cooled through direct contact with the stage. A sample dispenser is movable with respect to the stage and is configured to deposit a liquid sample onto the sample deposit surface at a selected rate of deposition. Once the liquid sample is deposited onto the sample deposit surface by the sample dispenser, it is vitrified automatically in place.

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.

The invention relates to an apparatus (1) for clamping flat samples (6), in particular pouch battery cells, for x-ray diffractometry, wherein the apparatus has a housing (2) having a sample holder (4), which has holding elements (5) that are able to be tensioned in relation to one another for clamping the sample (6), at least two x-ray windows (11a, 11b, 12) for letting in and out x-rays, and at least one first temperature control device (7) for controlling the temperature of the sample (6). At least one first temperature control device (7) is in each case attached to the holding elements (5), wherein the first temperature control devices (7) are thermally coupled to the housing (2), and the apparatus has at least one second temperature control device (9), which is configured to dissipate heat, which is output by the first temperature control device (7) to the housing (2), out of the housing (3) to the outside and/or to introduce heat from the outside into the housing (2).

An X-ray detector according to a present embodiment includes: an optical sensor array configured to generate an electric signal by receiving X-rays; a substrate including at least an element that performs A/D conversion on the electric signal; a first support plate configured to hold a separator for removing scattered radiation; and a second support plate that is formed of a material being higher in thermal conductivity than the first support plate and is provided in contact with the substrate at least in part.

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

An X-ray imaging system including: an X-ray Talbot imaging apparatus which is provided with an object table, an X-ray source, a plurality of gratings, and an X-ray detector side by side in a direction of an X-ray radiation axis, and irradiates the X-ray detector with an X-ray from the X-ray source through an object and the plurality of gratings to obtain a moire image required for forming a reconstruction image of the object; and an object housing inside which the object is housed and an environmental condition independent of an external environment is set, wherein the object housing is provided detachably with respect to the object table.