Provided are light-emitting nanoparticles that exhibit light emission stability and light resistance and are less biologically toxic. The light-emitting nanoparticles contain a matrix material and a light-emitting substance included in the matrix material, wherein the matrix material contains a cationic element that is at least one member selected from the group consisting of Ti, Si, Ca, Al and Zr, and an anionic element that is at least one member selected from the group consisting of O and P; and the concentration of the light-emitting substance in the matrix material is set to a level that results in an average distance of 1.2 nm or more between pieces of the light-emitting substance.

A scanner comprises an electromagnetic wave source; and a detector positioned to measure emissions from the electromagnetic wave source, wherein the electromagnetic wave source comprises a first technology, and the electromagnetic wave source is interchangeable with a second electromagnetic wave source comprising a second technology and/or wherein the detector comprises a first technology, and the detector is interchangeable with a second detector comprising a second technology. The scanner can comprise a storage medium having instructions stored thereon to perform a method for training the scanner for an inspection application, the method comprising operating the electromagnetic wave source to generate electromagnetic wave emissions at a plurality of combinations of parameters; moving a conveyor belt to expose product having a plurality of contaminants of different sizes to the emissions generated at more than one combination of parameters; recording attenuated emissions that pass through the product at more than one combination of parameters; and selecting a combination of parameters to use when inspecting for the contaminant.

Method include emitting x-rays from an x-ray source, directing a first portion of the x-rays through an object grating situated adjacent to an object while the object is scanned relative to the object grating along a scan direction, directing a second portion of the x-rays through the object and subsequently through a detector grating without transmitting through the object grating, wherein the object grating and detector grating are adjacently arranged in a field of view of the x-rays sequentially with respect to each other in the scan direction, and receiving the first portion transmitted through the object and object grating with a first portion of a detector and receiving the second portion transmitted through the object and the detector grating with a second portion of the detector adjacent to the first portion of the detector. Systems are also disclosed, along with related techniques for beam hardening correction.

An inspection device includes a ray source that irradiates an object to be inspected with energy rays, a detection unit that detects energy rays that have passed through the object to be inspected, a displacement mechanism that sets a relative position of the object to be inspected and the ray source by displacing at least one of the object to be inspected and the ray source in relation to the other, an internal image generation unit that generates an internal image of the object to be inspected based on a detection amount distribution of the energy rays detected by the detection unit, and a control unit that controls the displacement mechanism based on the detection amount distribution of the energy rays detected by the detection unit.

An inspection apparatus includes a feed-in preparation chamber, an imaging chamber, and a feed-out preparation chamber. Each preparation chamber includes a feed-in unit that receives an inspection object through a first opening, a traverser that translates the received object to a second opening in a direction different from the receiving direction of the object, and a feed-out unit that moves the object in a direction different from a moving direction of the traverser and discharges the object through the second opening. The imaging chamber includes an imaging unit that images the object fed from the feed-in preparation chamber. The traverser includes a mount for the object, and a shield that moves together with the mount and prevents radioactive rays entering one of the first and second openings and propagating in the moving direction of the traverser from reaching the other opening.

A method and a related apparatus for performing a tomographic examination of an object (2) which advances through an examination area (6), wherein the examination area (6) is irradiated with x-rays transversally to a motion trajectory of the object (2) and the residual intensity of the x-rays which have crossed the object (2) is repeatedly detected to obtain, for each detection, an electronic two-dimensional pixel map, the two-dimensional maps thus obtained being processed by a computer to obtain a three-dimensional tomographic reconstruction of the object (2); wherein, during the advancement, the object (2) is made or let rotate, at least partly uncontrolled, in such a way that the object (2) rotates around one or more rotation axes which are transversal both to the motion trajectory and to the propagation directions of the x-rays crossing it; and wherein a computer also determines the spatial position in which the object (2) is located relative to the one or more emitters (4) and/or the one or more detectors (5) at the instant when each two-dimensional map is detected, and factors this in the tomographic reconstruction.

An inspection and sorting system sorts conveyed articles. The system is provided with a conveyance device, an X-ray inspection device, and a sorting device. The conveyance device conveys inspection articles. The X-ray inspection device inspects the conveyed inspection articles. The sorting device has an air sorting mechanism that sorts the conveyed inspection articles in a sorting operation. The sorting device has a sorting information receiving component, a reference signal receiving component, and a sorting mechanism control component. The sorting information receiving component receives sorting information relating to the sorting of the inspection articles based on an inspection result of the X-ray inspection device. The reference signal receiving component receives a fixed-interval reference signal relating to the conveyance by the conveyance device. The sorting mechanism control component controls the air sorting mechanism to execute the sorting operation based on the sorting information at a timing adjusted by the reference signal.

A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

An apparatus and method for quick imaging and inspection of a moving target. The apparatus comprises a passage, a scanning and imaging device (106), a first position sensor (101), a second position sensor (103), and a control unit (105). The control unit (105) powers on an electron induction accelerator in the scanning and imaging device (106) to make the electron induction accelerator enter a standby state when the control unit (105) receives from the first position sensor (101) a detection signal indicating that a moving target (100) enters the passage, and controls a beam emitting time point and a beam emitting mode of the electron induction accelerator to correspondingly inspect different parts of the moving target (100) when the second position sensor (103) detects that different sections pass through a radiation scanning area. The driver and passengers do not need to get off when a traveling vehicle is inspected, the apparatus controls the accelerator to emit ray beams with corresponding energy to perform scanning when the moving target passes through the scanning area, flexible scanning is realized, and inspection time is reduced.

A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.