Various tray inserts, methods and algorithm for certifying candidate trays for use in an X-ray scanner system are discussed. The tray insert includes at least a body having multiple parts positioned for generation of image quality metrics for tray impact evaluation in; a first cover and a second cover disposed at opposite ends to fix and secure the body. The method including running an algorithm to control an X-ray system to collect baseline image data from certified trays, collecting candidate tray image data, extracting image quality metrics for both the baseline image data and the candidate tray image data, and performing statistical analysis using and comparing image quality metrics from the baseline image data and the candidate tray image data to certify the candidate tray based on the statistical and comparison results.

An imaging system that is configured to automatically obtain and provide two and three-dimensional digital images of various types of objects (e.g., tissue specimens, animals, electrical devices, etc.) for use in analysis thereof in a manner free of manual repositioning of the objects between images and free of movement of an electromagnetic radiation source and detector within or relative to a cabinet housing of the system.

An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy includes an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by the product sample and generating a signal received that can be analysed to determine a chemical composition of the product sample and selecting a type of product corresponding to said chemical composition of the product sample. The apparatus includes a first vacuum chamber located between an output of the apparatus facing the product sample and the X-ray source, and a second vacuum chamber located between the output of the apparatus facing the product sample and the detector. The apparatus also includes an optical module with polycapillary lens located downstream of the X-ray source, which is configured for focusing the X-ray beam and is associated in a vacuum-tight way to the first vacuum chamber.

A scanner comprises an electromagnetic wave source; a collimator positioned to alter the electromagnetic waves emitted from the electromagnetic wave source into an electromagnetic beam; and a detector positioned to measure one or more levels of electromagnetic energy of the electromagnetic beam, wherein a collimator element is spatially adjustable in at least one axis via one or more adjusting mechanisms to change the one or more levels of electromagnetic energy measured the detector.

Described herein is a high-energy x-ray imaging system including a stationary gantry, a conveyor assembly configured to convey an object to be imaged through the gantry, a plurality of linear accelerators, a detector array, and a control system. The linear accelerators are arranged in an array within the gantry and are configured to generate high-energy x-ray fan beams to be transmitted through the object. The detector array is positioned opposite the linear accelerators and is configured to collect the high-energy x-ray fan beams transmitted through the object. The control system is configured to energize the linear accelerators according to a predetermined control sequence to generate the high-energy x-ray fan beams, and construct a 3-D image of the object based on data received from the detector array and representative of the high-energy x-ray fan beams transmitted through the object.

System and method for nanoscale X-ray imaging. The imaging system comprises an electron source configured to generate an electron beam along a first direction; an X-ray source comprising a thin film anode configured to receive the electron beam at an electron beam spot on the thin film anode, and to emit an X-ray beam substantially along the first direction from a portion of the thin film anode proximate the electron beam spot, such that the X-ray beam passes through the sample specimen. The imaging apparatus further comprises an X-ray detector configured to receive the X-ray beam that passes through the sample specimen. Some embodiments are directed to an electron source that is an electron column of a scanning electron microscope (SEM) and is configured to focus the electron beam at the electron beam spot.

A multi-channel static CT device is provided, and the multi-channel static CT device includes: a scanning channel including a plurality of scanning sub-channels; a distributed X-ray source including a plurality of ray emission points arranged around the scanning channel; and a detector module including a plurality of detectors arranged around the scanning channel, wherein the plurality of detectors are arranged corresponding to the plurality of ray emission points.

A system and a method of measuring grain orientations of a metal component. The method includes defining a series of measurement locations on the metal component at which to take a series of measurements indicative of grain orientations at corresponding measurement locations. The method further includes defining a nominal grain orientation at each measurement location. The method further includes loading the measurement locations into a computer-controllable fixture suitable for positioning the metal component. The method further includes locating the metal component in the computer-controllable fixture. The method further includes taking the series of measurements at the series of measurement locations. The method further includes analysing the measurement at each measurement location relative to the nominal grain orientation at the corresponding measurement location.

An apparatus for inspecting a semiconductor device according to an embodiment includes an X-ray irradiation unit configured to make monochromatic X-rays obliquely incident on the semiconductor device, which is an object at a predetermined angle of incidence, a detection unit configured to detect observed X-rays observed from the object using a plurality of two-dimensionally disposed photodetection elements, an analysis apparatus configured to generate X-ray diffraction images obtained by photoelectrically converting the observed X-rays, and a control unit configured to change an angle of incidence and a detection angle of the X-rays, in which the analysis apparatus acquires an X-ray diffraction image every time the angle of incidence is changed, extracts a peak X-ray diffraction image, X-ray intensity of which becomes maximum for each of pixels and compares the peak X-ray diffraction image among the pixels to thereby estimate a stress distribution of the object.

Apparatus for analysing a rod-shaped smoking article is disclosed. The apparatus comprises a source (10) of x-ray radiation arranged to irradiate an area of the article (30), one or more area image sensors (12) arranged to detect x-ray radiation from an area of the article and to produce two-dimensional image data therefrom, and a drive mechanism arranged to move the smoking article (30) or the sensor (12) in an axial direction. A processing unit (20) is arranged to process two-dimensional image data produced by the area image sensor (12) at a plurality of different axial positions and to produce an output in dependence thereon. The processing unit may be arranged to output a two-dimensional image to be displayed and/or to output processed dimensional or quality information.