A method and a related apparatus for performing a tomographic examination of an object (2) which advances through an examination area (6), wherein the examination area (6) is irradiated with x-rays transversally to a motion trajectory of the object (2) and the residual intensity of the x-rays which have crossed the object (2) is repeatedly detected to obtain, for each detection, an electronic two-dimensional pixel map, the two-dimensional maps thus obtained being processed by a computer to obtain a three-dimensional tomographic reconstruction of the object (2); wherein, during the advancement, the object (2) is made or let rotate, at least partly uncontrolled, in such a way that the object (2) rotates around one or more rotation axes which are transversal both to the motion trajectory and to the propagation directions of the x-rays crossing it; and wherein a computer also determines the spatial position in which the object (2) is located relative to the one or more emitters (4) and/or the one or more detectors (5) at the instant when each two-dimensional map is detected, and factors this in the tomographic reconstruction.

An apparatus for selecting products on the basis of their composition via X-ray fluorescence spectroscopy comprises an X-ray source that emits an X-ray beam towards a product sample, and a particle detector for receiving an X-ray beam diffused by said product sample and generating a signal received that can be analysed to determine a chemical composition of said product sample and select a type of product corresponding to said chemical composition of the product sample.

According to the invention, the aforesaid apparatus comprises a first vacuum chamber located between an output of the apparatus facing the product sample and said X-ray source, and a second vacuum chamber located between said output of the apparatus facing the product sample and said detector,

said apparatus further comprising an optical module with polycapillary lens located downstream of said X-ray source, which is configured for focusing said X-ray beam and is moreover associated in a vacuum-tight way to said first vacuum chamber.

An X-ray inspection device of the present invention includes a sample placement unit 11 for placing a sample as an inspection target therein, a sample placement unit positioning mechanism 30 for moving the sample placement unit 11, a goniometer 20 including first and second rotation members 22, 23 that rotate independently of each other, an X-ray irradiation unit 40 installed on the first rotation member 22, and a two-dimensional X-ray detector 50 installed on the second rotation member 23. The sample placement unit positioning mechanism 30 includes a rotation mechanism 35 for rotating the sample placement unit 11 and a -axis about a -axis that is orthogonal to a s-axis and a d-axis at a measurement point P and extends horizontally.

An X-ray collimator (30) that comprises: a collimator body (31) comprising: a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331); a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).

An inspection system (100) having: a source (101) configured to generate inspection radiation (40); a collimator (103) configured to collimate the inspection radiation into an inspection beam (41) configured to irradiate a section of a vehicle (20); a filter (102) located between the source and the collimator, the filter having at least a cargo configuration and an attenuation configuration; and a controller (104) configured to control the configuration of the filter, such that the filter is in the cargo configuration when the inspection beam irradiates a container (23), and in the attenuation configuration when the inspection beam irradiates a cabin (21).

Provided is an X-ray inspection apparatus that can inspect an object to be inspected with high sensitivity by using a multiple-stage X-ray sensor without widening a slit of a collimator, and can prevent the apparatus from becoming large-sized due to prevention of X-ray leakage. An X-ray inspection apparatus includes an X-ray irradiation portion having an X-ray tube generating an X-ray, an X-ray sensor having detection element arrays in a plurality of stages in a carrying direction, the detection element arrays each formed of a plurality of detection elements linearly arranged in a main scanning direction orthogonal to the carrying direction on a plane parallel to the carrying surface of an object to be inspected, a collimator restricting an X-ray irradiation region for the X-ray sensor, and an imaging condition input section that designates one or more detection element arrays to be used for inspection.

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

An X-ray imaging inspection system for inspecting items comprises an X-ray source 10 extending around an imaging volume 16, and defining a plurality of source points 14 from which X-rays can be directed through the imaging volume. An X-ray detector array 12 also extends around the imaging volume 16 and is arranged to detect X-rays from the source points which have passed through the imaging volume, and to produce output signals dependent on the detected X-rays. A conveyor 20 is arranged to convey the items through the imaging volume 16.

Scanning systems may include a stator, a rotor supporting at least one radiation source and at least one radiation detector rotatable with the rotor, and a motivator operatively connected to the rotor. The stator, the rotor, the at least one radiation source, and the at least one radiation detector may be located within a housing. A conveyor system may extend through the housing and the rotor. A shielding system including a series of independently movable energy shields sized, shaped, and positioned to at least partially occlude a pathway along which the conveyor system extends may extend from an entrance to the housing, through the rotor, to an exit from the housing. A control system may be configured to cause the shielding system to automatically and dynamically move individual energy shields in response to advancement of one or more objects supported on the conveyor system.

An X-ray detector device for a device for the X-ray inspection of products includes a first line detector with a first discrete spatial resolution, a second line detector with the same or lesser second discrete spatial resolution, and an evaluation and control unit. The first line detector is operable to capture X-radiation in a non-spectrally resolved fashion along a first capture line transverse to a product movement direction to generate first image data. The second line detector is operable to capture the X-radiation in a spectrally resolved fashion along a second capture line parallel to the first capture line to generate second image data. The evaluation and control unit is operable to evaluate the first and second image data to detect at least one predefined feature of the product with the first discrete spatial resolution by combining the items of information contained in the first and second image data.